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Near-field microscopy and near-field optics, 

Near-field microscopy and near-field optics


Название:  Near-field microscopy and near-field optics   (Микроскопия и оптика ближней зоны)
Издательство: World Scientific Publishing
Классификация:
Научное оборудование и методы, лабораторное оборудование
Оптика

ISBN: 186094258X
ISBN-13(EAN): 9781860942587
ISBN: 1-86094-258-X
ISBN-13(EAN): 978-1-86094-258-7
Обложка/Формат: Hardcover
Страницы: 340 pages, Illustrat
Вес: 0.616 кг.
Дата издания: 21/04/2003
Язык: ENG
Размер: 23.27 x 16.46 x 2.31 cm
Читательская аудитория: Professional & VocationalPostgraduate, Research &
Поставляется из: Англии
Описание: Near-field optics studies the behaviour of light fields in the vicinity of matter, where light is structured in propagating and evanescent fields. Near-field optical microscopy is the straightforward application of near-field optics. This textbook provides an overview for undergraduates and anyone who has an interest in peculiar optical phenomena, and serves as a technical manual for engineers and researchers.

It consists of 12 chapters dealing with the history of near-field optics, non-radiating optics, optical noise, inverse problems, theory, instrumentation and applications; there is an appendix including the basic elements of Fourier optics and Maxwell equations.


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Scanning Transmission Electron Microscopy of Nanomaterials

Автор: Tanaka Nobuo
Название: Scanning Transmission Electron Microscopy of Nanomaterials
ISBN: 184816789X ISBN-13(EAN): 9781848167896
Издательство: World Scientific Publishing
Цена: 21483 р.
Наличие на складе: Поставка под заказ.
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Principles of nuclear magnetic resonance microscopy

Автор: Callaghan, Paul
Название: Principles of nuclear magnetic resonance microscopy
ISBN: 0198539975 ISBN-13(EAN): 9780198539971
Издательство: Oxford Academ
Цена: 6508 р.
Наличие на складе: Нет в наличии.
Описание: An introduction to a technique which is potentially important in fundamental biology and chemical physics, as well as having applications to such fields as petrochemicals, polymers, biotechnology, food processing and natural products.
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Atom-Probe Field Ion Microscopy

Автор: Tien T. Tsong
Название: Atom-Probe Field Ion Microscopy
ISBN: 0521019931 ISBN-13(EAN): 9780521019934
Издательство: Cambridge Academ
Цена: 3945 р.
Наличие на складе: Поставка под заказ.
Описание: Atom-probe field ion microscopy is currently the only technique capable of imaging solid surfaces with atomic resolution, and at the same time of chemically analysing surface atoms selected by the observer from the field ion image. Field ion microscopy has been successfully used to study most metals and many alloys, and recently good field ion images of some semiconductors and even ceramic materials such as high temperature superconductors have been obtained. Although other microscopies are capable of achieving the same resolution, there are some experiments unique to field ion microscopy - for example the study of the behaviour of single atoms and clusters on a solid surface. The elegant development of the field ion microscope with the atom probe has provided a powerful and useful technique for highly sensitive chemical analysis. This book presents the basic principles of atom-probe field ion microscopy and illustrates the various capabilities of the technique in the study of solid surfaces and interfaces at atomic resolution. A useful comparison is given with two related techniques, electron microscopy and scanning tunnelling microscopy. The book will be of interest to scientists working on surfaces and interfaces of materials at the atomic level and will provide a useful reference for those using this technique.
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Quantum Theory of Near-Field Electrodynamics (Nano-Optics and Nanophotonics)

Автор: Ole Keller
Название: Quantum Theory of Near-Field Electrodynamics (Nano-Optics and Nanophotonics)
ISBN: 3642174094 ISBN-13(EAN): 9783642174094
Издательство: Springer
Цена: 13199 р.
Наличие на складе: Нет в наличии.
Описание: Quantum Theory of Near-field Electrodynamics gives a self-contained account of the fundamental theory of field-matter interaction on a subwavelength scale. The quantum physical behavior of matter (atoms and mesoscopic media) in both classical and quantum fields is treated. The role of local-field effects and nonlocal electrodynamics, and the tight links to the theory of spatial photon localization are emphasized. The book may serve as a reference work in the field, and is of general interest for physicists working in quantum optics, mesoscopic electrodynamics and physical optics. The macroscopic and microscopic classical theories form a good starting point for the quantum approach, and these theories are presented in a manner appropriate for graduate students entering near-field optics.
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Progress in Nano-Electro-Optics I / Basics and Theory of Near-Field Optics

Автор: Ohtsu Motoichi
Название: Progress in Nano-Electro-Optics I / Basics and Theory of Near-Field Optics
ISBN: 3540435042 ISBN-13(EAN): 9783540435044
Издательство: Springer
Цена: 8180 р.
Наличие на складе: Нет в наличии.
Описание: This volume focuses on fundamental aspects of nano-electro-optics. Starting with fiber probes and related devices for generating and detecting the optical near-field with high efficiency and resolution, the next chapter addresses the modulation of an electron beam by optical near-fields. Further topics include: fluorescence spectroscopy, in which sample molecules are excited by the evanescent surface plasmon field close to metallic surfaces; spatially resolved near-field photoluminescence spectroscopy of semiconductor quantum dots, which will become an essential issue in future electro-optical devices and systems; and, finally, the quantum theory of the optical near-field. This latter theory accounts for all the essential features of the interaction between optical near-fields and nanomaterials, atoms and molecules. Together these overviews will be a valuable resource for engineers and scientists working in the field of nano-electro-optics.
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Optical Near-Field Recording / Science and Technology

Автор: Tominaga J., Nakano T.
Название: Optical Near-Field Recording / Science and Technology
ISBN: 354022128X ISBN-13(EAN): 9783540221289
Издательство: Springer
Цена: 7036 р.
Наличие на складе: Нет в наличии.
Описание: This textbook is written for all those wishing to understand the concepts behind modern optical recording. It also paves the way towards the future science and technology beyond the optical diffraction limit. The important keyword here is "near-field optics," a regime whose promising characteristics will open the door to a new information optics. This unique book will be useful for all graduate students, scientists and engineers seeking to advance our understanding of optical near-field recording.
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Progress in Nano-Electro Optics IV / Characterization of Nano-Optical Materials and Optical Near-Field Interactions

Автор: Ohtsu Motoichi
Название: Progress in Nano-Electro Optics IV / Characterization of Nano-Optical Materials and Optical Near-Field Interactions
ISBN: 3540232362 ISBN-13(EAN): 9783540232360
Издательство: Springer
Цена: 9675 р.
Наличие на складе: Нет в наличии.
Описание: This volume focuses on the characterization of nano-optical materials and optical near-field interactions. It begins with the techniques for characterizing the magneto-optical Kerr effect and continues with methods to determine structural and optical properties in high-quality quantum wires with high spatial uniformity. Further topics include: near-field luminescence mapping in InGaN/GaN single quantum well structures in order to interpret the recombination mechanism in InGaN-based nano-structures; and theoretical treatment of the optical near field and optical near-field interactions, providing the basis for investigating the signal transport and associated dissipation in nano-optical devices. Taken as a whole, this overview will be a valuable resource for engineers and scientists working in the field of nano-electro-optics.
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4d electron microscopy

Автор: Zewail, Ahmed H. Thomas, John M.
Название: 4d electron microscopy
ISBN: 1848163908 ISBN-13(EAN): 9781848163904
Издательство: World Scientific Publishing
Цена: 6672 р.
Наличие на складе: Есть (2 шт.)
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Microscopy of Semiconducting Materials / Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK

Автор: Cullis A.G., Hutchison J.L.
Название: Microscopy of Semiconducting Materials / Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK
ISBN: 354031914X ISBN-13(EAN): 9783540319146
Издательство: Springer
Цена: 17596 р.
Наличие на складе: Нет в наличии.
Описание: Organised in conjunction with the Royal Microscopical Society, Oxford, the Institute of Physics, London and the Materials Research Society, USA. This series focuses on the advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy.
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Roadmap of Scanning Probe Microscopy

Автор: Morita S.
Название: Roadmap of Scanning Probe Microscopy
ISBN: 3540343148 ISBN-13(EAN): 9783540343141
Издательство: Springer
Цена: 13199 р.
Наличие на складе: Нет в наличии.
Описание: Scanning tunneling microscopy - with its applications that span not only atomic resolution but also scanning tunneling spectroscopy, atom/molecule manipulation and nanostructuring, and inelastic electron tunneling spectroscopy - has achieved remarkable progress and become the key technology for surface science. Besides, atomic force microscopy is also rapidly developing and achieving remarkable progress and accomplishments such as true atomic resolution, atom/molecule identification, manipulation and nanostructuring. This book that predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately to be taken and to accelerate research and development on nanotechnology and nanoscience, as well as all SPM-related fields in future.
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Fundamentals of Light Microscopy and Electronic Imaging

Автор: Douglas B. Murphy
Название: Fundamentals of Light Microscopy and Electronic Imaging
ISBN: 047125391X ISBN-13(EAN): 9780471253914
Издательство: Wiley
Цена: 7915 р.
Наличие на складе: Невозможна поставка.
Описание: This practical book presents the fundamentals of light and electron microscopy, including the basics of microscope design, image formation, and camera function. Moreover, researchers will learn how to acquire electronic images and perform image processing. The author provides instructions on the latest techniques involving video microscopy, digital microscopy, laser scanning microscopy, digital CCD microscopy, as well as a chapter covering issues related to image processing for scientific publication.
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Scanning Probe Microscopy and Spectroscopy: Theory, Techniques, and Applications, 2nd Edition

Автор: Dawn Bonnell
Название: Scanning Probe Microscopy and Spectroscopy: Theory, Techniques, and Applications, 2nd Edition
ISBN: 047124824X ISBN-13(EAN): 9780471248248
Издательство: Wiley
Цена: 13662 р.
Наличие на складе: Поставка под заказ.
Описание: Scanning tunneling microscopy (STM) provides 3-dimensional, real-space images of surfaces at high resolution. In the 15 years since its invention, the technique has become widely used as a characterization tool in materials science, semiconductor physics, biology, electrochemistry, and surface science. This new work provides an up-to-date presentation of the theory and practice of STM.
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