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Acoustic microscopy, Briggs, Andrew; Kolosov, Oleg


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Автор: Briggs, Andrew; Kolosov, Oleg
Название:  Acoustic microscopy
Перевод названия: Акустическая микроскопия
ISBN: 9780199232734
Издательство: Oxford Academ
Классификация:



ISBN-10: 0199232733
Обложка/Формат: Hardback
Страницы: 352
Вес: 0.78 кг.
Дата издания: 16.04.2009
Серия: Monographs on the Physics and Chemistry of Materials No. 67
Язык: English
Издание: 2 rev ed
Иллюстрации: 111 line drawings, 116 halftones, 12 colour images
Размер: 24.26 x 16.38 x 2.31 cm
Читательская аудитория: Professional & vocational
Ссылка на Издательство: Link
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Поставляется из: Англии
Описание: For many years Acoustic Microscopy has been the definitive book on the subject. A key development since it was first published has been the development of ultrasonic force microscopy. The 2nd edition has a major new chapter on this technique and its applications.


Scanning microscopy for nanotechnology

Автор: Zhong Lin Wang, Weilie Zhou
Название: Scanning microscopy for nanotechnology
ISBN: 0387333258 ISBN-13(EAN): 9780387333250
Издательство: Springer
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Цена: 26122.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnology, in both technique and application chapters by leading practitioners. The book covers topics including nanomaterials imaging, X-ray microanalysis, high-resolution SEM, low kV SEM, cryo-SEM, as well as new techniques such as electron back scatter diffraction (EBSD) and scanning transmission electron microscopy (STEM). Fabrication techniques integrated with SEM, such as e-beam nanolithography, nanomanipulation, and focused ion beam nanofabrication, are major new dimensions for SEM application. Application areas include the study of nanoparticles, nanowires and nanotubes, three-dimensional nanostructures, quantum dots, magnetic nanomaterials, photonic structures, and bio-inspired nanomaterials. This book will appeal not only to a broad spectrum of nanomaterials researchers, but also to SEM development specialists.

Physical Principles of Electron Microscopy

Автор: Egerton
Название: Physical Principles of Electron Microscopy
ISBN: 0387258000 ISBN-13(EAN): 9780387258003
Издательство: Springer
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Цена: 18284.00 р.
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Описание: Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.


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