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Acoustic microscopy, Briggs, Andrew; Kolosov, Oleg

Acoustic microscopy

Автор: Briggs, Andrew; Kolosov, Oleg
Название:  Acoustic microscopy   (Акустическая микроскопия)
Издательство: Oxford Academ
Классическая механика

ISBN: 0199232733
ISBN-13(EAN): 9780199232734
ISBN: 0-19-923273-3
ISBN-13(EAN): 978-0-19-923273-4
Обложка/Формат: Hardcover
Страницы: 352
Вес: 0.782 кг.
Дата издания: 16.04.2009
Серия: Monographs on the Physics and Chemistry of Materials No. 67
Язык: ENG
Издание: 2 rev ed
Иллюстрации: 111 line drawings, 116 halftones, 12 colour images
Размер: 24.26 x 16.38 x 2.31 cm
Читательская аудитория: Professional & vocational
Ссылка на Издательство: Link
Поставляется из: Англии
Описание: For many years Acoustic Microscopy has been the definitive book on the subject. A key development since it was first published has been the development of ultrasonic force microscopy. The 2nd edition has a major new chapter on this technique and its applications.
Дополнительное описание: 1: Son et Lumiere; 2: Focusing and Scanning; 3: Resolution; 4: Lens Design and Selection; 5: Electronic Circuits for Quantitative Microscopy; 6: A Little Elementary Acoustics; 7: Contrast Theory; 8: Experimental Elastic Microanalysis; 9: Biological Tissue

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Transmission Electron Microscopy

Автор: David B. Williams; C. Barry Carter
Название: Transmission Electron Microscopy
ISBN: 038776500X ISBN-13(EAN): 9780387765006
Издательство: Springer
Цена: 7697 р.
Наличие на складе: Нет в наличии.
Описание: Illustrated in color, this work offers the necessary instructions for successful hands-on application of this versatile materials characterization technique. It also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment.

Biosystems - investigated by Scanning Probe Microscopy

Автор: Fuchs
Название: Biosystems - investigated by Scanning Probe Microscopy
ISBN: 3642024041 ISBN-13(EAN): 9783642024047
Издательство: Springer
Цена: 18403 р.
Наличие на складе: Нет в наличии.

Atomic Force Microscopy

Автор: Eaton
Название: Atomic Force Microscopy
ISBN: 0199570450 ISBN-13(EAN): 9780199570454
Издательство: Oxford Academ
Цена: 5697 р.
Наличие на складе: Поставка под заказ.

Scanning Probe Microscopy of Functional Materials

Автор: Kalinin
Название: Scanning Probe Microscopy of Functional Materials
ISBN: 144196567X ISBN-13(EAN): 9781441965677
Издательство: Springer
Цена: 14627 р.
Наличие на складе: Нет в наличии.
Описание: The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport and magnetic, optical, and electromechanical properties. By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this book provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.

Impact of Electron and Scanning Probe Microscopy on Materials Research

Автор: Rickerby
Название: Impact of Electron and Scanning Probe Microscopy on Materials Research
ISBN: 0792359399 ISBN-13(EAN): 9780792359395
Издательство: Springer
Цена: 17633 р.
Наличие на складе: Нет в наличии.
Описание: This book presents a coherent synopsis of a rapidly evolving field. Subjects covered include diffraction contrast and defect analysis by conventional TEM lattice imaging, phase contrast and resolution limits in high resolution electron microscopy. Specialized electron diffraction techniq es are also covered, as is the application of parallel electron energy loss spectroscopy and scanning transmission EM for subnanometer analysis.

Materials analyzed include thin films, interfaces and non-conventional materials. WDS and EDS are treated, with an emphasis on phi(rhoZeta) techniques for the analysis of thin layers and surface films. Theoretical and practical aspects of ESEM are discussed in relation to applications in crystal growth, biomaterials and polymers.

Recent developments in SPM are also described. This is a comprehensive survey of the state of the art in electron and SPM, future research directions and prospective applications in materials engineering.


Characterization of High Tc Materials and Devices by Electron Microscopy

Автор: Browning
Название: Characterization of High Tc Materials and Devices by Electron Microscopy
ISBN: 052155490X ISBN-13(EAN): 9780521554909
Издательство: Cambridge Academ
Цена: 7888 р.
Наличие на складе: Поставка под заказ.
Описание: A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors.

Scanning Transmission Electron Microscopy

Автор: Pennycook
Название: Scanning Transmission Electron Microscopy
ISBN: 1441971998 ISBN-13(EAN): 9781441971999
Издательство: Springer
Цена: 9237 р.
Наличие на складе: Нет в наличии.
Описание: Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

Raman Microscopy,

Автор: George Turrell
Название: Raman Microscopy,
ISBN: 0121896900 ISBN-13(EAN): 9780121896904
Издательство: Elsevier Science
Цена: 15015 р.
Наличие на складе: Поставка под заказ.

Characterization of Microstructures by Analytical Electron Microscopy (AEM)

Автор: Rong
Название: Characterization of Microstructures by Analytical Electron Microscopy (AEM)
ISBN: 3642201180 ISBN-13(EAN): 9783642201189
Издательство: Springer
Цена: 9237 р.
Наличие на складе: Нет в наличии.
Описание: Characterization of Microstructures by Analytical Electron Microscopy (AEM) describes the basic concepts and operative techniques of AEM. It focuses on the study of phase transformations and dislocation in deformation by AEM. Further, the book also presents the physical concepts and mathematic analysis for diffraction and crystallography using numerous examples, such as the quantitative prediction of the orientation relationships in phase transformations. The book is intended for researchers and graduate students in materials science and engineering, and condensed matter physics. Yonghua Rong is a professor at School of Materials Science and Engineering, Shanghai Jiao Tong University, China.

Polymer Microscopy

Автор: Sawyer L.C., Grubb David, Meyers Gregory F.
Название: Polymer Microscopy
ISBN: 0387726276 ISBN-13(EAN): 9780387726274
Издательство: Springer
Цена: 8852 р.
Наличие на складе: Нет в наличии.
Описание: Polymer Microscopy, 3rd Edition, is a comprehensive and practical guide to the study of the microstructure of polymers , and is the result of the authors' many years of academic and industrial experience. To address the needs of students and professionals from a variety of backgrounds, introductory chapters deal with the basic concepts of both polymer morphology and processing and microscopy and imaging theory. The core of the book is more applied, with many examples of specimen preparation and image interpretation leading to materials characterization. Microscopy is applied to the characterization of a wide range of polymer systems, including fibers, films, engineering resins and plastics, composites, nanocomposites, polymer blends, emulsions and liquid crystaline polymers. Light microscopy, atomic force microscopy, scanning and transmission electron microscopy techniques are all considered , as are emerging techniques such as compositional mapping in which microscopy is combined with spectroscopy. This extensively updated and revised Third Edition closes with a problem solving guide, which gives a systematic framework for deciding on suitable approaches to the characterization of polymer microstructure.

Science of Microscopy

Автор: Hawkes
Название: Science of Microscopy
ISBN: 0387252967 ISBN-13(EAN): 9780387252964
Издательство: Springer
Цена: 49203 р.
Наличие на складе: Нет в наличии.
Описание: A text on microscopy, it presents reviews of various instruments and new versions of the older ones, as well as their associated operational techniques. It draws attention to their principal areas of application. It is intended for scientists in university laboratories as well as engineers and scientists in industrial R&D departments.

Scanning microscopy for nanotechnology

Автор: Zhong Lin Wang, Weilie Zhou
Название: Scanning microscopy for nanotechnology
ISBN: 0387333258 ISBN-13(EAN): 9780387333250
Издательство: Springer
Цена: 10238 р.
Наличие на складе: Нет в наличии.
Описание: Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnology, in both technique and application chapters by leading practitioners. The book covers topics including nanomaterials imaging, X-ray microanalysis, high-resolution SEM, low kV SEM, cryo-SEM, as well as new techniques such as electron back scatter diffraction (EBSD) and scanning transmission electron microscopy (STEM). Fabrication techniques integrated with SEM, such as e-beam nanolithography, nanomanipulation, and focused ion beam nanofabrication, are major new dimensions for SEM application. Application areas include the study of nanoparticles, nanowires and nanotubes, three-dimensional nanostructures, quantum dots, magnetic nanomaterials, photonic structures, and bio-inspired nanomaterials. This book will appeal not only to a broad spectrum of nanomaterials researchers, but also to SEM development specialists.

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