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Автор: Egerton
Название: Physical Principles of Electron Microscopy
ISBN: 0387258000 ISBN-13(EAN): 9780387258003
Издательство: Springer
Цена: 6159 р.
Наличие на складе: Есть у поставщика.Поставка под заказ.
Описание: Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.
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Автор: David B. Williams; C. Barry Carter
Название: Transmission Electron Microscopy
ISBN: 038776500X ISBN-13(EAN): 9780387765006
Издательство: Springer
Цена: 9355 р.
Наличие на складе: Нет в наличии.
Описание: Illustrated in color, this work offers the necessary instructions for successful hands-on application of this versatile materials characterization technique. It also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment.
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Автор: Goldstein
Название: Scanning Electron Microscopy and X-ray Microanalysis
ISBN: 0306472929 ISBN-13(EAN): 9780306472923
Издательство: Springer
Цена: 5694 р.
Наличие на складе: Есть у поставщика.Поставка под заказ.
Описание: Intended for students, as well as practitioners, this text offers an introduction to the field of Scanning Electron Microscopy (SEM) and X-ray microanalysis. It discusses topics such as user-controlled functions of scanning electron microscopes, the characteristics of electron beam, the use of x-rays for qualitative analysis, and more.
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Автор: Williams
Название: Transmission Electron Microscopy
ISBN: 030645324X ISBN-13(EAN): 9780306453243
Издательство: Springer
Цена: 5775 р.
Наличие на складе: Нет в наличии.
Описание: This groundbreaking text provides the necessary instructions for hands-on application of this versatile materials characterization technique and is supported by over 600 illustrations and diagrams.
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Автор: Kalinin
Название: Scanning Probe Microscopy
ISBN: 0387286675 ISBN-13(EAN): 9780387286679
Издательство: Springer
Цена: 26873 р.
Наличие на складе: Есть у поставщика.Поставка под заказ.
Описание: Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.
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Автор: Koenraad P.M., Kemerink M.
Название: Scanning Tunneling Microscopy/Spectroscopy and Related Techniques / 12th International Conference, STM`03
ISBN: 0735401683 ISBN-13(EAN): 9780735401686
Издательство: Springer
Цена: 9236 р.
Наличие на складе: Нет в наличии.
Описание: At this conference the latest developments in the design, construction, and application of scanning probe microscopy like Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), Magnetic Force Microscopy (MFM), Scanning Near-Field Optical Microscopy (SNOM) in the fields of nanotechnology, physics, chemistry, and biology were discussed. Special emphasis was placed on the manipulation and analysis of single atoms, molecules, nanostructures, and biological entities like DNA, viruses, or cells and the analysis of materials and surfaces on the atomic or molecular level.
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Автор: Hopster H., Oepen H.P.
Название: Magnetic Microscopy of Nanostructures
ISBN: 3540401865 ISBN-13(EAN): 9783540401865
Издательство: Springer
Цена: 10006 р.
Наличие на складе: Есть у поставщика.Поставка под заказ.
Описание: This volume contains a comprehensive collection of overview articles on novel microscopy methods for imaging magnetic structures on the nanoscale. Written by leading scientists in the field, the book covers synchrotron based methods, spin-polarized electron methods, and scanning probe techniques. It constitutes a valuable source of reference for graduate students and newcomers to the field.
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Автор: Alexe M., Gruverman A.
Название: Nanoscale Characterisation of Ferroelectric Materials / Scanning Probe Microscopy Approach
ISBN: 3540206620 ISBN-13(EAN): 9783540206620
Издательство: Springer
Цена: 10006 р.
Наличие на складе: Есть у поставщика.Поставка под заказ.
Описание: This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferroelectrics at the nanoscale level, such as nanoscale switching, scaling effects, and transport behavior. This state-of-the-art review of theory and experiments on nanoscale polarization phenomena will be a useful reference for advanced readers as well for newcomers and graduate students interested in the SPM techniques. The non-specialists will obtain valuable information about different approaches to electrical characterization by SPM, while researchers in the ferroelectric field will be provided with details of SPM-based measurements of ferroelectrics.
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Автор: Morita S., Wiesendanger R., Meyer E.
Название: Noncontact Atomic Force Microscopy
ISBN: 3540431179 ISBN-13(EAN): 9783540431176
Издательство: Springer
Цена: 15011 р.
Наличие на складе: Есть у поставщика.Поставка под заказ.
Описание: Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.
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Автор: Wang Zhong-lin, Hui Chun
Название: Electron Microscopy of Nanotubes
ISBN: 1402073615 ISBN-13(EAN): 9781402073618
Издательство: Springer
Цена: 20713 р.
Наличие на складе: Есть у поставщика.Поставка под заказ.
Описание: Research in carbon nanotubes has reached a horizon that is impacting a variety of fields, such as nanoelectronics, flat panel display, composite materials, sensors, nanodevices and novel instrumentation. The unique structures of the nanotubes result in numerous superior physical and chemical properties, such as the strongest mechanical strength and the highest thermal conductivity, room temperature ballistic quantum conductance, electromechanical coupling, and super surface functionality. Among the various analytical techniques, high-resolution transmission electron microscopy (HRTEM) has played a key role in the discovery and characterization of carbon nanotubes. It may be claimed that carbon nanotubes might not have been discovered without using HRTEM. There is a great need of a book that addresses specifically the theory, techniques and application of electron microscopy and associated techniques for nanotube research. The objective of this book is to fill this gap. The potential of HRTEM is now well received in wide ranging communities such as materials science, physics, chemistry and electrical engineering. TEM is a powerful technique that is indispensable for characterizing nanomaterials, and Electron Microscopy of Nanotubes focuses on the applications of TEM in structural, electronic, and property characterization of carbon nanotubes and demonstrates how a comprehensive application of HRTEM and associated new techniques for nanotube research can be applied to a wide range of materials. The book contains 12 chapters and the authors for the chapters are the world prominent scientists specializing in the field. The contents of the book can be separated into three parts. The first part composed of chapters 1-6 is about the diffraction, imaging and spectroscopy of carbon-based nanotubes. The second part (chapters 7-9) describes the physical property nanomeasurements of carbon nanotubes based on in-situ TEM. The last part is about non-carbon based tubular structures and related structures.
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Автор: Hawkes
Название: Science of Microscopy
ISBN: 0387252967 ISBN-13(EAN): 9780387252964
Издательство: Springer
Цена: 49203 р.
Наличие на складе: Нет в наличии.
Описание: A text on microscopy, it presents reviews of various instruments and new versions of the older ones, as well as their associated operational techniques. It draws attention to their principal areas of application. It is intended for scientists in university laboratories as well as engineers and scientists in industrial R&D departments.
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Автор: Sawyer L.C., Grubb David, Meyers Gregory F.
Название: Polymer Microscopy
ISBN: 0387726276 ISBN-13(EAN): 9780387726274
Издательство: Springer
Цена: 12952 р.
Наличие на складе: Есть у поставщика.Поставка под заказ.
Описание: Polymer Microscopy, 3rd Edition, is a comprehensive and practical guide to the study of the microstructure of polymers , and is the result of the authors' many years of academic and industrial experience. To address the needs of students and professionals from a variety of backgrounds, introductory chapters deal with the basic concepts of both polymer morphology and processing and microscopy and imaging theory. The core of the book is more applied, with many examples of specimen preparation and image interpretation leading to materials characterization. Microscopy is applied to the characterization of a wide range of polymer systems, including fibers, films, engineering resins and plastics, composites, nanocomposites, polymer blends, emulsions and liquid crystaline polymers. Light microscopy, atomic force microscopy, scanning and transmission electron microscopy techniques are all considered , as are emerging techniques such as compositional mapping in which microscopy is combined with spectroscopy. This extensively updated and revised Third Edition closes with a problem solving guide, which gives a systematic framework for deciding on suitable approaches to the characterization of polymer microstructure.
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