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Acoustic microscopy, Briggs, Andrew; Kolosov, Oleg
Acoustic microscopy

Автор: Briggs, Andrew; Kolosov, Oleg
Название:  Acoustic microscopy   (Акустическая микроскопия)
Издательство: Oxford Academ
Классификация:
Научное оборудование и методы, лабораторное оборудование
Физика
Классическая механика
Химия
Материаловедение

ISBN: 0199232733
ISBN-13(EAN): 9780199232734
ISBN: 0-19-923273-3
ISBN-13(EAN): 978-0-19-923273-4
Обложка/Формат: Hardback
Страницы: 352
Вес: 0.784 кг.
Дата издания: 16.04.2009
Серия: Monographs on the Physics and Chemistry of Materials No. 67
Язык: ENG
Издание: 2 rev ed
Иллюстрации: 111 line drawings, 116 halftones, 12 colour images
Размер: 24.26 x 16.38 x 2.31 cm
Читательская аудитория: Professional & vocational
Ссылка на Издательство: Link
Рейтинг:
Поставляется из: Англии
Описание: For many years Acoustic Microscopy has been the definitive book on the subject. A key development since it was first published has been the development of ultrasonic force microscopy. The 2nd edition has a major new chapter on this technique and its applications.
Дополнительное описание: 1: Son et Lumiere; 2: Focusing and Scanning; 3: Resolution; 4: Lens Design and Selection; 5: Electronic Circuits for Quantitative Microscopy; 6: A Little Elementary Acoustics; 7: Contrast Theory; 8: Experimental Elastic Microanalysis; 9: Biological Tissue

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Transmission Electron Microscopy

Автор: David B. Williams; C. Barry Carter
Название: Transmission Electron Microscopy
ISBN: 038776500X ISBN-13(EAN): 9780387765006
Издательство: Springer
Рейтинг:
Цена: 7696 р.
Наличие на складе: Нет в наличии.

Описание: Illustrated in color, this work offers the necessary instructions for successful hands-on application of this versatile materials characterization technique. It also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment.

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Microscopy of Semiconducting Materials / Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK

Автор: Cullis A.G., Hutchison J.L.
Название: Microscopy of Semiconducting Materials / Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK
ISBN: 354031914X ISBN-13(EAN): 9783540319146
Издательство: Springer
Рейтинг:
Цена: 21588 р.
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Описание: Organised in conjunction with the Royal Microscopical Society, Oxford, the Institute of Physics, London and the Materials Research Society, USA. This series focuses on the advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy.

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Progress in Transmission Electron Microscopy 1 / Concepts and Techniques

Автор: Zhang Xiao-Feng, Zhang Ze
Название: Progress in Transmission Electron Microscopy 1 / Concepts and Techniques
ISBN: 3540676805 ISBN-13(EAN): 9783540676805
Издательство: Springer
Рейтинг:
Цена: 16863 р.
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Описание: Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.

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Scanning Electron Microscopy and X-ray Microanalysis

Автор: Goldstein
Название: Scanning Electron Microscopy and X-ray Microanalysis
ISBN: 0306472929 ISBN-13(EAN): 9780306472923
Издательство: Springer
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Цена: 7195 р.
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Описание: Intended for students, as well as practitioners, this text offers an introduction to the field of Scanning Electron Microscopy (SEM) and X-ray microanalysis. It discusses topics such as user-controlled functions of scanning electron microscopes, the characteristics of electron beam, the use of x-rays for qualitative analysis, and more.

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Physical Principles of Electron Microscopy

Автор: Egerton
Название: Physical Principles of Electron Microscopy
ISBN: 0387258000 ISBN-13(EAN): 9780387258003
Издательство: Springer
Рейтинг:
Цена: 10074 р.
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Описание: Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.

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Transmission Electron Microscopy and Diffractometry of Materials

Автор: Fultz
Название: Transmission Electron Microscopy and Diffractometry of Materials
ISBN: 3540437649 ISBN-13(EAN): 9783540437642
Издательство: Springer
Цена: 6387 р.
Наличие на складе: Нет в наличии.

Описание: This textbook develops the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms, wave interference, and the formation and analysis of diffraction patterns. It explains the uniqueness of each technique, especially imaging and spectroscopy in the TEM. Simple citations of rules are avoided as much as possible, and both practical and theoretical issues are explained in detail. The book can be used as both an introductory and advanced-level graduate text since sections/chapters are sorted according to difficulty and grouped for use in quarter and semester courses on TEM and XRD. Numerous problems are provided at the end of each chapter to reinforce key concepts, and solutions are available to instructors. Appendices provide procedures for introductory laboratory exercises, and up-to-date tabulations of physical data useful for TEM and XRD.

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Transmission Electron Microscopy

Автор: Williams
Название: Transmission Electron Microscopy
ISBN: 030645324X ISBN-13(EAN): 9780306453243
Издательство: Springer
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Цена: 5775 р.
Наличие на складе: Нет в наличии.

Описание: This groundbreaking text provides the necessary instructions for hands-on application of this versatile materials characterization technique and is supported by over 600 illustrations and diagrams.

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Progress in Transmission Electron Microscopy 2 / Applications in Materials Science

Автор: Zhang Xiao-Feng, Zhang Ze
Название: Progress in Transmission Electron Microscopy 2 / Applications in Materials Science
ISBN: 3540676813 ISBN-13(EAN): 9783540676812
Издательство: Springer
Рейтинг:
Цена: 12704 р.
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Описание: Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.

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Quality Assessment of Textiles / Damage Detection by Microscopy

Автор: Mahall Karl
Название: Quality Assessment of Textiles / Damage Detection by Microscopy
ISBN: 3540440720 ISBN-13(EAN): 9783540440727
Издательство: Springer
Цена: 11546 р.
Наличие на складе: Нет в наличии.

Описание: The damage that can occur in certain fibrous raw materials or in textiles during their production and storage of textiles is expertly described in this book by Karl Mahall. In particular, he explains methods for finding concealed textile defects by using microscopic analysis.Besides minor improvements and corrections, the new edition contains a new chapter "Poultry Feathers as Filling Material for Bedding and Textiles - Analysis of Faults." The reason for its inclusion is that natural feathers and down are not only used as a filling material for bedding but also for garments, such as anoraks, coats and sleeping bags.This book is especially useful as a manual for both chemical and textile engineers and quality engineers. It is also a useful reference for others in the textile industry in general.

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Scanning Probe Microscopy

Автор: Kalinin
Название: Scanning Probe Microscopy
ISBN: 0387286675 ISBN-13(EAN): 9780387286679
Издательство: Springer
Цена: 25186 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography. 

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Scanning Tunneling Microscopy/Spectroscopy and Related Techniques / 12th International Conference, STM`03

Автор: Koenraad P.M., Kemerink M.
Название: Scanning Tunneling Microscopy/Spectroscopy and Related Techniques / 12th International Conference, STM`03
ISBN: 0735401683 ISBN-13(EAN): 9780735401686
Издательство: Springer
Цена: 9236 р.
Наличие на складе: Нет в наличии.

Описание: At this conference the latest developments in the design, construction, and application of scanning probe microscopy like Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), Magnetic Force Microscopy (MFM), Scanning Near-Field Optical Microscopy (SNOM) in the fields of nanotechnology, physics, chemistry, and biology were discussed. Special emphasis was placed on the manipulation and analysis of single atoms, molecules, nanostructures, and biological entities like DNA, viruses, or cells and the analysis of materials and surfaces on the atomic or molecular level.

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Scanning Probe Microscopy / Atomic Scale Engineering by Forces and Currents

Автор: Foster Adam, Hofer Werner
Название: Scanning Probe Microscopy / Atomic Scale Engineering by Forces and Currents
ISBN: 0387400907 ISBN-13(EAN): 9780387400907
Издательство: Springer
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Цена: 12233 р.
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