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Raman scattering in materials science, Weber, Merlin

Raman scattering in materials science

Автор: Weber, Merlin
Название:  Raman scattering in materials science   (Комбинационное рассеяние в материаловедении)
Издательство: Springer
Классификация:
Физика конденсированного состояния (жидкости и тв.тела)
Оптика
Прикладная физика и специальные разделы
Машиностроение: общее
Материаловедение

ISBN: 364208656X
ISBN-13(EAN): 9783642086564
ISBN: 3-642-08656-X
ISBN-13(EAN): 978-3-642-08656-4
Обложка/Формат: Paperback
Страницы: 512
Вес: 0.783 кг.
Дата издания: 05.12.2010
Серия: Springer series in materials science
Язык: ENG
Издание: Softcover reprint of
Иллюстрации: Black & white illustrations
Размер: 15.60 x 23.39 x 2.62 cm
Читательская аудитория: Professional & vocational
Ссылка на Издательство: Link
Рейтинг:
Поставляется из: Германии
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Raman Scattering in Materials Science

Автор: Weber
Название: Raman Scattering in Materials Science
ISBN: 3540672230 ISBN-13(EAN): 9783540672234
Издательство: Springer
Цена: 8851 р.
Наличие на складе: Есть у поставщика.Поставка под заказ.

Описание: Raman scattering is now being applied with increasing success to a wide range of practical problems at the cutting edge of materials science. The purpose of this book is to make Raman spectroscopy understandable to the non-specialist and thus to bring it into the mainstream of routine materials characterization. The book is pedagogical in approach and focuses on technologically important condensed-matter systems in which the specific use of Raman spectroscopy yields new and useful information.

Included are chapters on instrumentation, bulk semiconductors and alloys, heterostructures, high-Tc superconductors, catalysts, carbon-based materials, wide-gap and super-hard materials, and polymers.

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Surface-Enhanced Raman Scattering / Physics and Applications

Автор: Kneipp Katrin, Moskovits Martin, Kneipp Harald
Название: Surface-Enhanced Raman Scattering / Physics and Applications
ISBN: 3540335668 ISBN-13(EAN): 9783540335665
Издательство: Springer
Цена: 14626 р.
Наличие на складе: Есть у поставщика.Поставка под заказ.

Описание: Almost 30 years after the first reports on surface-enhanced Raman signals, the phenomenon of surface-enhanced Raman scattering (SERS) is now well established. Yet, explaining the enhancement of a spectroscopic signal by fouteen orders of magnitude continues to attract the attention of physicists and chemists alike. And, at the same time and rapidly growing, SERS is becoming a very useful spectroscopic tool with exciting applications in many fields. SERS gained particular interest after single-molecule Raman spectroscopy had been demonstrated. This bookl summarizes and discusses present theoretical approaches that explain the phenomenon of SERS and reports on new and exciting experiments and applications of the fascinating spectroscopic effect.

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Scattering Methods and the Properties of Polymer Materials

Автор: Stribeck
Название: Scattering Methods and the Properties of Polymer Materials
ISBN: 3540253238 ISBN-13(EAN): 9783540253235
Издательство: Springer
Цена: 11546 р.
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Описание: Nanostructure is in the focus of science, and advanced scattering methods are significantly contributing to the solution of related questions. This volume includes 19 contributions to the field of polymers and scattering, collected on the occasion of Wilhelm Ruland’s 80th anniversary in October 2005. The contributions from leading scientists cover a wide range of topics concerning-Advanced polymer materials -Studies of nanostructure: From bone to nanotubes -Modern data evaluation methods for isotropic and anisotropic scattering data.The book is an excellent source of information with respect to recent developments and future applications related to this important field that extends from the engineering of advanced materials to the development of novel evaluation methods.

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Light Scattering in Solids IX / Novel Materials and Techniques

Автор: Cardona Manuel, Merlin Roberto
Название: Light Scattering in Solids IX / Novel Materials and Techniques
ISBN: 3540344357 ISBN-13(EAN): 9783540344353
Издательство: Springer
Цена: 15831 р.
Наличие на складе: Есть у поставщика.Поставка под заказ.

Описание: This is the ninth volume of a well-established series in which expert practitioners discuss topical aspects of light scattering in solids. It reviews recent developments concerning mainly semiconductor nanostructures and inelastic x-ray scattering, including both coherent time-domain and spontaneous scattering studies. In the past few years, light scattering has become one of the most important research and characterization methods for studying carbon nanotubes and semiconducting quantum dots, and a crucial tool for exploring the coupled exciton--photon system in semiconductor cavities. Among the novel techniques discussed in this volume are pump--probe ultrafast measurements and those which use synchrotron radiation as light source. The book addresses improvements in the intensity, beam quality and time synchronization of modern synchrotron sources, which made it possible to measure the phonon dispersion in very small samples and to determine electronic energy bands as well as enabling real-time observations of high-frequency sound propagation.

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Anomalous X-Ray Scattering for Materials Characterization / Atomic-Scale Structure Determination

Автор: Waseda Yoshio
Название: Anomalous X-Ray Scattering for Materials Characterization / Atomic-Scale Structure Determination
ISBN: 3540434437 ISBN-13(EAN): 9783540434436
Издательство: Springer
Цена: 17633 р.
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Описание: The evolution of our understanding of most properties of new functional materials is related to our knowledge of their atomic-scale structure. To further this, several X-ray and neutron techniques are employed. The anomalous X-ray scattering (AXS) method, exploiting the so-called anomalous dispersion effect near the absorption edge of the constituent element, is one of the most powerful methods for determining the accurate partial structure functions of individual pairs of constituents or the environmental functions around specific elements in multicomponent systems. AXS is useful for both crystalline and non-crystalline systems, for studies of surface and bulk materials. This book is the first on this new method of structural characterization. It describes the basics and application principles, and also treats the specifics of application to liquid alloys, supercooled liquids, solutions, metallic glasses, oxide glasses, superconducting ionic glasses etc.

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Light Scattering in Solids VIII

Автор: Cardona
Название: Light Scattering in Solids VIII
ISBN: 3540660852 ISBN-13(EAN): 9783540660859
Издательство: Springer
Цена: 8466 р.
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Описание: This volume is the eighth of an established monograph, and is devoted to inelastic light scattering by solids, both as a physical effect and as a spectroscopic technique. It appears jointly with Volume VII and can be considered to be its continuation.

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Particle Characterization: Light Scattering Methods

Автор: Renliang Xu
Название: Particle Characterization: Light Scattering Methods
ISBN: 1402003579 ISBN-13(EAN): 9781402003578
Издательство: Springer
Цена: 7465 р.
Наличие на складе: Есть у поставщика.Поставка под заказ.

Описание: Particle characterization is an important component in product research and development, manufacture, and quality control of particulate materials and an important tool in the frontier of sciences, such as in biotechnology and nanotechnology. This book systematically describes one major branch of modern particle characterization technology - the light scattering methods. This is the first monograph in particle science and technology covering the principles, instrumentation, data interpretation, applications, and latest experimental development in laser diffraction, optical particle counting, photon correlation spectroscopy, and electrophoretic light scattering. In addition, a summary of all major particle sizing and other characterization methods, basic statistics and sample preparation techniques used in particle characterization, as well as almost 500 latest references are provided. The book is a must for industrial users of light scattering techniques characterizing a variety of particulate systems and for undergraduate or graduate students who want to learn how to use light scattering to study particular materials, in chemical engineering, material sciences, physical chemistry and other related fields.

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Light scattering in solids ix

Автор: M. Cardona, R. Merlin
Название: Light scattering in solids ix
ISBN: 3642070795 ISBN-13(EAN): 9783642070792
Издательство: Springer
Цена: 13471 р.
Наличие на складе: Есть у поставщика.Поставка под заказ.

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Wave scattering by small bodies of arbitrary shapes

Название: Wave scattering by small bodies of arbitrary shapes
ISBN: 9812561862 ISBN-13(EAN): 9789812561862
Издательство: World Scientific Publishing
Цена: 10226 р.
Наличие на складе: Поставка под заказ.

Описание: This book presents analytical formulas which allow one to calculate the S-matrix for the acoustic and electromagnetic wave scattering by small bodies or arbitrary shapes with arbitrary accuracy. Equations for the self-consistent field in media consisting of many small bodies are derived. Applications of these results to ultrasound mammography and electrical engineering are considered.

The above formulas are not available in the works of other authors. Their derivation is based on a mathematical theory for solving integral equations of electrostatics, magnetostatics, and other static fields. These equations are at a simple characteristic value.

Convergent iterative processes are constructured for stable solution of these equations. The theory completes the classical work of Rayleigh on scattering by small bodies by providing analytical formulas for polarizability tensors for bodies of arbitrary shapes.

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Neutron Scattering with a Triple-Axis Spectrometer

Автор: Gen Shirane
Название: Neutron Scattering with a Triple-Axis Spectrometer
ISBN: 0521025893 ISBN-13(EAN): 9780521025898
Издательство: Cambridge Academ
Цена: 3154 р.
Наличие на складе: Есть у поставщика.Поставка под заказ.

Описание: Neutron scattering is an extremely powerful tool in the study of elemental excitations in condensed matter. This book provides a practical guide to basic techniques using a triple-axis spectrometer. Introductory chapters summarize useful scattering formulas and describe the components of a spectrometer, followed by a comprehensive discussion of the resolution function and focusing effects. Later sections include simple examples of phonon and magnon measurements, and an analysis of spurious effects in both inelastic and elastic measurements, and how to avoid them. Finally, polarization analysis techniques and their applications are covered. This guide will allow graduate students and experienced researchers new to neutron scattering to make the most efficient use of their experimental time.

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Theory and Approach of Information Retrievals from Electromagnetic Scattering and Remote Sensing

Автор: Jin Ya-Qiu
Название: Theory and Approach of Information Retrievals from Electromagnetic Scattering and Remote Sensing
ISBN: 1402040296 ISBN-13(EAN): 9781402040290
Издательство: Springer
Цена: 11546 р.
Наличие на складе: Есть у поставщика.Поставка под заказ.

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X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures

Автор: Schmidbauer Martin
Название: X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
ISBN: 3540201793 ISBN-13(EAN): 9783540201793
Издательство: Springer
Цена: 10776 р.
Наличие на складе: Есть у поставщика.Поставка под заказ.

Описание: This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.

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