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Introduction to Modern Photogrammetry, Edward M. Mikhail

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Цена: 23167р.
Наличие: Поставка под заказ.  Есть в наличии на складе поставщика.
Склад Англия: 60 шт.  Склад Америка: 79 шт.  
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Автор: Edward M. Mikhail
Название:  Introduction to Modern Photogrammetry
Издательство: Wiley
Издательство: John Wiley & Sons
ISBN: 0471309249
ISBN-13(EAN): 9780471309246
Обложка/Формат: Paperback
Страницы: 496
Вес: 0.889 кг.
Дата издания: 09.04.2001
Язык: English
Издание: I.s.ed
Иллюстрации: Illustrations
Размер: 251 x 182 x 28
Читательская аудитория: Postgraduate, research & scholarly
Ссылка на Издательство: Link
Поставляется из: США
Описание: Learn modern photogrammetric methods from three leaders in the field. Edward M. Mikhail, James S. Bethal, and J. Chris McGlones Introduction to Modern Photogrammetry provides a strong grounding in the mathematical basis of photogrammetry, covers modern sensors and digital technology, and introduces readers to related areas, such as remote sensing and gigital image processing, which are increasingly important to current photogrammetric practice and research. Worked examples are provided throughout the text and problems are provided at the end of each chapter to give the reader an opportunity for practice.
Дополнительное описание: Кол-во стр.: 496
Формат: 256 x 184
Дата издания: 2001
Илюстрации: Illustrations
Вес: 992
Круг читателей: undergraduate; postgraduate; research, professional

Photogrammetric Image Analysis

Автор: Stilla
Название: Photogrammetric Image Analysis
ISBN: 3642243924 ISBN-13(EAN): 9783642243929
Издательство: Springer
Цена: 6269 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: This book constitutes the refereed proceedings of the ISPRS Conference on Photogrammetric Image Analysis, held in Munich, Germany, in October 2011. The 25 revised full papers presented were carefully reviewed and selected from 54 submissions. The papers are organized in topical sections on orientation, matching, object detection, 3D reconstruction and DEM, classification, people and tracking, as well as image processing.

Precision Landmark Location for Machine Vision and Photogrammetry / Finding and Achieving the Maximum Possible Accuracy

Автор: Gutierrez JosГ© A., Armstrong Brian S.R.
Название: Precision Landmark Location for Machine Vision and Photogrammetry / Finding and Achieving the Maximum Possible Accuracy
ISBN: 1846289122 ISBN-13(EAN): 9781846289125
Издательство: Springer
Цена: 11494 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: The applications of image-based measurement are many and various: image-guided surgery, mobile-robot navigation, component alignment, part inspection and photogrammetry, among others. In all these applications, landmarks are detected and located in images, and measurements made from those locations.Precision Landmark Location for Machine Vision and Photogrammetry addresses the ubiquitous problem of measurement error associated with determining the location of landmarks in images. With a detailed model of the image formation process and landmark location estimation, the CramГ©r–Rao Lower Bound (CRLB) theory of statistics is applied to determine the least possible measurement uncertainty in a given situation.This monograph provides the reader with:• the most complete treatment to date of precision landmark location and the engineering aspects of image capture and processing;• detailed theoretical treatment of the CRLB;• a software tool for analyzing the potential performance-specific camera/lens/algorithm configurations;• two novel algorithms which achieve precision very close to the CRLB;• an experimental method for determining the accuracy of landmark location;• downloadable MATLABВ® package to assist the reader with applying theoretically-derived results to practical engineering configurations.All of this adds up to a treatment that is at once theoretically sound and eminently practical.Precision Landmark Location for Machine Vision and Photogrammetry will be of great interest to computer scientists and engineers working with and/or studying image processing and measurement. It includes cutting-edge theoretical developments and practical tools so it will appeal to research investigators and system designers.

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