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Transmission Electron Microscopy, Williams


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Автор: Williams
Название:  Transmission Electron Microscopy
Издательство: Springer
Классификация:
Научное оборудование и методы, лабораторное оборудование
Биологические науки: общие вопросы
Материаловедение

ISBN: 030645324X
ISBN-13(EAN): 9780306453243
ISBN: 0-306-45324-X
ISBN-13(EAN): 978-0-306-45324-3
Обложка/Формат: Paperback
Страницы: 710
Вес: 0.435 кг.
Дата издания: 01.10.1996
Серия: A Textbook for Materials Science
Язык: ENG
Иллюстрации: Illustrations
Размер: 28.19 x 20.88 x 3.96 cm
Читательская аудитория: Professional & vocational
Подзаголовок: A textbook for materials science
Ссылка на Издательство: Link
Рейтинг:
Поставляется из: Германии
Описание: This groundbreaking text provides the necessary instructions for hands-on application of this versatile materials characterization technique and is supported by over 600 illustrations and diagrams.
Дополнительное описание: Main Subject: Chemistry and Materials Science
Edition: 1st ed. 1196; 6th corr. printing
Bibliography: 703 p. 4-vol. set, not available separately.
Subtitle: A Textbook for Materials Science
Subject1: C32070 Characterization and Evaluation





      Новое издание
Transmission Electron Microscopy

Автор: David B. Williams; C. Barry Carter
Название: Transmission Electron Microscopy
ISBN: 0387765026 ISBN-13(EAN): 9780387765020
Издательство: Springer
Цена: 6540 р.
Наличие на складе: Есть у поставщикаПоставка под заказ.
Описание: This groundbreaking text has been established as the market leader throughout the world. Profusely illustrated, "Transmission Electron Microscopy: A Textbook for Materials Science" provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. For this first new edition in 12 years, many sections have been completely rewritten with all others revised and updated.

The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment. Four-color illustrations throughout also enhance the new edition. Praise for the first edition: 'The best textbook for this audience available' - "American Scientist".

'Ideally suited to the needs of a graduate level course. It is hard to imagine this book not fulfilling most of the requirements of a text for such a course' - "Microscope". 'This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student' - "Micron".

'The book answers nearly any question - be it instrumental, practical, or theoretical - either directl or with an appropriate reference...This book provides a basic, clear-cut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project' - "MRS Bulletin, May 1998". 'The only complete text now available which includes all the remarkable advances made in the field of TEM in the past 30-40 years...The authors can be proud of an enormous task, very well done' - from the Foreword by Professor Gareth Thomas, University of California, Berkeley.


Electron Microscopy of Polymers

Автор: Michler G.H.
Название: Electron Microscopy of Polymers
ISBN: 3540363505 ISBN-13(EAN): 9783540363507
Издательство: Springer
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Цена: 13107 р.
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Описание: There are many books on electron microscopy, however, the study of polymers by EM needs special techniques, precautions and preparation methods, including ultramicrotomy. General characteristics of the different techniques of EM, including scanning force microscopy (AFM), are given. Application of these techniques to study morphology and also properties, particularly micromechanical properties, is described in detail. Examples from all classes of polymers are presented.

Physical Principles of Electron Microscopy

Автор: Egerton
Название: Physical Principles of Electron Microscopy
ISBN: 0387258000 ISBN-13(EAN): 9780387258003
Издательство: Springer
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Цена: 12233 р.
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Описание: Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.

Scanning Electron Microscopy and X-ray Microanalysis

Автор: Goldstein
Название: Scanning Electron Microscopy and X-ray Microanalysis
ISBN: 0306472929 ISBN-13(EAN): 9780306472923
Издательство: Springer
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Цена: 9349 р.
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Описание: Intended for students, as well as practitioners, this text offers an introduction to the field of Scanning Electron Microscopy (SEM) and X-ray microanalysis. It discusses topics such as user-controlled functions of scanning electron microscopes, the characteristics of electron beam, the use of x-rays for qualitative analysis, and more.

Transmission Electron Microscopy Methods for Understanding the Brain

Автор: Van Bockstaele
Название: Transmission Electron Microscopy Methods for Understanding the Brain
ISBN: 1493936387 ISBN-13(EAN): 9781493936380
Издательство: Springer
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Цена: 13089 р.
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Описание: This volume is directed at individuals interested in the field of neuroscience who are novices or experts in the use of transmission electron microscopy. The goal of is to provide a comprehensive series of chapters on how this tool can be used to study the brain with a strong emphasis on successful hands?on application of the electron microscopy technique. Written in the popular Neuromethods series style, chapters include the kind of detail and key advice from the specialists needed to get successful results in your own laboratory.Concise and easy-to-use, Transmission Electron Microscopy Methods for Understanding the Brain aims to ensure successful results in the further study of this vital field.

Advanced Transmission Electron Microscopy

Автор: Zuo
Название: Advanced Transmission Electron Microscopy
ISBN: 1493966057 ISBN-13(EAN): 9781493966059
Издательство: Springer
Рейтинг:
Цена: 10192 р.
Наличие на складе: Поставка под заказ.

Описание: This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduate level text in support of course materials in Materials Science, Physics or Chemistry departments.

Transmission Electron Microscopy

Автор: Carter
Название: Transmission Electron Microscopy
ISBN: 3319266497 ISBN-13(EAN): 9783319266497
Издательство: Springer
Рейтинг:
Цена: 9349 р.
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Описание: This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials ScienceTopics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.

Introduction to Conventional Transmission Electron Microscopy

Автор: Marc De Graef
Название: Introduction to Conventional Transmission Electron Microscopy
ISBN: 0521629950 ISBN-13(EAN): 9780521629959
Издательство: Cambridge Academ
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Цена: 9366 р.
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Описание: This book covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. Emphasis is on the experimental and computational methods used to quantify and analyze CTEM observations. A supplementary website containing interactive modules and free Fortran source code accompanies the text. The book starts with the basics of crystallography and quantum mechanics providing a sound mathematical footing for the rest of the text. The next section deals with the microscope itself, describing the various components in terms of the underlying theory. The second half of the book focuses on the dynamical theory of electron scattering in solids including its applications to perfect and defective crystals, electron diffraction and phase contrast techniques. Based on a lecture course given by the author in the Department of Materials Science and Engineering at Carnegie Mellon University, the book is ideal for graduate students as well as researchers new to the field.

Scanning Transmission Electron Microscopy

Автор: Pennycook
Название: Scanning Transmission Electron Microscopy
ISBN: 1441971998 ISBN-13(EAN): 9781441971999
Издательство: Springer
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Цена: 14492 р.
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Описание: Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

Scanning Electron Microscopy for the Life Sciences

Автор: Schatten
Название: Scanning Electron Microscopy for the Life Sciences
ISBN: 0521195993 ISBN-13(EAN): 9780521195997
Издательство: Cambridge Academ
Рейтинг:
Цена: 10929 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Recent developments in scanning electron microscopy (SEM) have resulted in a wealth of new applications for cell and molecular biology, as well as related biological disciplines. It is now possible to analyze macromolecular complexes within their three-dimensional cellular microenvironment in near native states at high resolution and to identify specific molecules and their structural and molecular interactions. New approaches include cryo-SEM applications and environmental SEM (ESEM), staining techniques and processing applications combining embedding and resin-extraction for imaging with high resolution SEM, and advances in immuno-labeling. New developments include helium ion microscopy, automated block-face imaging combined with serial sectioning inside an SEM chamber, and Focused Ion Beam Milling (FIB) combined with block-face SEM. With chapters written by experts, this guide gives an overview of SEM and sample processing for SEM and highlights several advances in cell and molecular biology that greatly benefited from using conventional, cryo, immuno and high-resolution SEM.

Sample preparation handbook for transmission electron microscopy

Название: Sample preparation handbook for transmission electron microscopy
ISBN: 0387981810 ISBN-13(EAN): 9780387981819
Издательство: Springer
Рейтинг:
Цена: 13107 р.
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Описание: This guide is divided into two sections. The first covers theoretical and practical aspects, including the best preparative technique. The second part offers technical hints, including twenty-two detailed protocols for preparing thin slices for TEM analysis.

High-resolution Electron Microscopy

Автор: Spence John C H
Название: High-resolution Electron Microscopy
ISBN: 0199668639 ISBN-13(EAN): 9780199668632
Издательство: Oxford Academ
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Цена: 10408 р.
Наличие на складе: Нет в наличии.

Описание: This book gives the basic theoretical background needed to understand how electron microscopes allow us to see atoms, together with highly practical advice for electron microscope operators. It covers the usefulness of seeing atoms in the semiconductor industry, in materials science, in condensed matter physics, and in biology.

Progress in Transmission Electron Microscopy 2 / Applications in Materials Science

Автор: Zhang Xiao-Feng, Zhang Ze
Название: Progress in Transmission Electron Microscopy 2 / Applications in Materials Science
ISBN: 3540676813 ISBN-13(EAN): 9783540676812
Издательство: Springer
Рейтинг:
Цена: 15427 р.
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Описание: Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.


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