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Applied Scanning Probe Methods I, Bhushan Bharat , Fuchs Harald, Hosaka Sumio


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Цена: 21412р.
Кол-во:
Наличие: Поставка под заказ.  Есть в наличии на складе поставщика.
Склад Англия: 145 шт.  Склад Америка: 54 шт.  
При оформлении заказа до: 25 окт 2019
Ориентировочная дата поставки: конец Ноября

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Автор: Bhushan Bharat , Fuchs Harald, Hosaka Sumio
Название:  Applied Scanning Probe Methods I
Издательство: Springer
Классификация:
Научное оборудование и методы, лабораторное оборудование
Физика конденсированного состояния (жидкости и тв.тела)
Аналитическая химия
Органическая химия
Физическая химия
Инструменты и приборное оборудование
Нанотехнология
Материаловедение

ISBN: 3540005277
ISBN-13(EAN): 9783540005278
ISBN: 3-540-00527-7
ISBN-13(EAN): 978-3-540-00527-8
Обложка/Формат: Hardback
Страницы: 476
Вес: 0.997 кг.
Дата издания: 2004
Серия: NanoScience and Technology
Иллюстрации: Biography
Размер: 235 x 155 x 27
Читательская аудитория: Postgraduate, research & scholarly
Ссылка на Издательство: Link
Рейтинг:
Поставляется из: Германии
Описание: This volume examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM. Scientists and engineers either using or planning to use SPM techniques will benefit from the international perspective assembled in the book.
Дополнительное описание: Формат: 235x155
Илюстрации: 338
Круг читателей: Professionals in industry dealing with surface analytics.Scientists at universities in physical chemistry/physics,materials science, polymer science departments.
Ключевые слова: Nanoscience
Microscopy
Physical Chemistry
Material Science
Язык: eng





Scanning Probe Microscopy for Energy Research

Автор: Bonnell Dawn A
Название: Scanning Probe Microscopy for Energy Research
ISBN: 9814434701 ISBN-13(EAN): 9789814434706
Издательство: World Scientific Publishing
Рейтинг:
Цена: 15907 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the complex electronic, optoelectronic, and ionic mechanisms underpinning operation of these materials and devices are understood on the nanometer level of individual defects. Only by probing these phenomena locally can we hope to link materials structure and functionality, thus opening pathway for predictive modeling and synthesis. While structures of these materials are now accessible on length scales from macroscopic to atomic, their functionality has remained Terra Incognitae. In this volume, we provide a summary of recent advances in scanning probe microscopy studies of local functionality of energy materials and devices ranging from photovoltaics to batteries, fuel cells, and energy harvesting systems. Recently emergent SPM modes and combined SPM-electron microscopy approaches are also discussed. Contributions by internationally renowned leaders in the field describe the frontiers in this important field.

Applied Scanning Probe Methods II / Scanning Probe Microscopy Techniques

Автор: Bhushan Bharat , Fuchs Harald
Название: Applied Scanning Probe Methods II / Scanning Probe Microscopy Techniques
ISBN: 3540262423 ISBN-13(EAN): 9783540262428
Издательство: Springer
Рейтинг:
Цена: 14020 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Volume II introduces scanning probe microscopy, including sensor technology, Volume III covers the whole range of characterization possibilities using SPM and Volume IV offers chapters on uses in various industrial applications. The international perspective offered in these three volumes - which belong together - contributes further to the evolution of SPM techniques.

Applied Scanning Probe Methods V / Scanning Probe Microscopy Techniques

Автор: Bhushan Bharat , Fuchs Harald, Kawata Satoshi
Название: Applied Scanning Probe Methods V / Scanning Probe Microscopy Techniques
ISBN: 3540373152 ISBN-13(EAN): 9783540373155
Издательство: Springer
Рейтинг:
Цена: 14020 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: The volumes V, VI and VII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004 and the second to fourth volumes in early 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

Applied Scanning Probe Methods IV / Industrial Applications

Автор: Bhushan Bharat , Fuchs Harald
Название: Applied Scanning Probe Methods IV / Industrial Applications
ISBN: 3540269126 ISBN-13(EAN): 9783540269120
Издательство: Springer
Рейтинг:
Цена: 15894 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Volume II introduces scanning probe microscopy, including sensor technology, Volume III covers the whole range of characterization possibilities using SPM and Volume IV offers chapters on uses in various industrial applications. The international perspective offered in these three volumes - which belong together - contributes further to the evolution of SPM techniques.

Applied Scanning Probe Methods III / Characterization

Автор: Bhushan Bharat , Fuchs Harald
Название: Applied Scanning Probe Methods III / Characterization
ISBN: 3540269096 ISBN-13(EAN): 9783540269090
Издательство: Springer
Рейтинг:
Цена: 16829 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Volume II introduces scanning probe microscopy, including sensor technology, Volume III covers the whole range of characterization possibilities using SPM and Volume IV offers chapters on uses in various industrial applications. The international perspective offered in these three volumes - which belong together - contributes further to the evolution of SPM techniques.

Applied Scanning Probe Methods VI / Characterization

Автор: Bhushan Bharat , Kawata Satoshi
Название: Applied Scanning Probe Methods VI / Characterization
ISBN: 3540373187 ISBN-13(EAN): 9783540373186
Издательство: Springer
Рейтинг:
Цена: 14020 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: The volumes V, VI and VII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004 and the second to fourth volumes in early 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

Applied Scanning Probe Methods VII / Biomimetics and Industrial Applications

Автор: Bhushan Bharat , Fuchs Harald
Название: Applied Scanning Probe Methods VII / Biomimetics and Industrial Applications
ISBN: 3540373209 ISBN-13(EAN): 9783540373209
Издательство: Springer
Рейтинг:
Цена: 18699 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: The volumes V, VI and VII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004 and the second to fourth volumes in early 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

Applied scanning probe methods X

Автор: Bhushan, Bharat; Fuchs, Harald
Название: Applied scanning probe methods X
ISBN: 3540740848 ISBN-13(EAN): 9783540740841
Издательство: Springer
Рейтинг:
Цена: 14020 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Examines the physical and technical foundation for progress in applied scanning probe techniques. This work constitutes a comprehensive overview of SPM applications. It introduces scanning probe microscopy, including sensor technology and tip characterization.

Applied scanning probe methods IX

Автор: Bhushan, Bharat; Fuchs, Harald
Название: Applied scanning probe methods IX
ISBN: 3540740821 ISBN-13(EAN): 9783540740827
Издательство: Springer
Рейтинг:
Цена: 12150 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Examines the physical and technical foundation for progress in applied scanning probe techniques. This work constitutes a comprehensive overview of SPM applications. It introduces scanning probe microscopy, including sensor technology and tip characterization.

Applied scanning probe methods

Название: Applied scanning probe methods
ISBN: 3540740791 ISBN-13(EAN): 9783540740797
Издательство: Springer
Рейтинг:
Цена: 21412 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Examines the physical and technical foundation for progress in applied scanning probe techniques. This work constitute a comprehensive overview of SPM applications. It introduces scanning probe microscopy, including sensor technology and tip characterization.

Applied scanning probe methods

Название: Applied scanning probe methods
ISBN: 3540850368 ISBN-13(EAN): 9783540850366
Издательство: Springer
Рейтинг:
Цена: 15894 р.
Наличие на складе: Поставка под заказ.

Описание: Examines the physical and technical foundation for progress in applied scanning probe techniques. This work offers an overview of SPM applications. This work offers an introduction to scanning probe microscopy, including sensor technology and tip characterization, and presents its use in various industrial applications.

Applied scanning probe methods

Название: Applied scanning probe methods
ISBN: 3540850384 ISBN-13(EAN): 9783540850380
Издательство: Springer
Рейтинг:
Цена: 15894 р.
Наличие на складе: Поставка под заказ.

Описание: Examines the physical and technical foundation for progress in applied scanning probe techniques. This work offers an overview of SPM applications. It introduces scanning probe microscopy, including sensor technology and tip characterization, and presents its use in various industrial applications.


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