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Progress in Transmission Electron Microscopy 1 / Concepts and Techniques, Zhang Xiao-Feng, Zhang Ze


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Цена: 20477р.
Кол-во:
Наличие: Поставка под заказ.  Есть в наличии на складе поставщика.
Склад Англия: 711 шт.  Склад Америка: 82 шт.  
При оформлении заказа до: 31 янв 2020
Ориентировочная дата поставки: середина Марта

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Автор: Zhang Xiao-Feng, Zhang Ze
Название:  Progress in Transmission Electron Microscopy 1 / Concepts and Techniques
Издательство: Springer
Классификация:
Научное оборудование и методы, лабораторное оборудование
Экспериментальные методы
Нанотехнология
Промышленная химия
Материаловедение

ISBN: 3540676805
ISBN-13(EAN): 9783540676805
ISBN: 3-540-67680-5
ISBN-13(EAN): 978-3-540-67680-5
Обложка/Формат: Hardback
Страницы: 381
Вес: 0.724 кг.
Дата издания: 18.10.2001
Серия: Springer Series in Surface Sciences
Иллюстрации: 169 black & white illustrations, 13 black & white
Размер: 234 x 156 x 22
Читательская аудитория: Postgraduate, research & scholarly
Подзаголовок: Concepts and techniques
Ссылка на Издательство: Link
Рейтинг:
Поставляется из: Германии
Описание: Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.
Дополнительное описание: Формат: 235x155
Илюстрации: 169
Круг читателей: Physicists, graduate students
Ключевые слова:
Язык: eng
Оглавление: 1. The Modern Microscope Today.- 2. The Quest for Ultra-High Resolution.- 3. Z-Contrast Imaging in the Scanning Transmission Electron Microscope.- 4. Inelastic Scattering in Electron Microscopy Effects, Spectrometry and Imaging.- 5. Quantitative Analysis of High-Resolution Atomic Image.- 6. Electron Crystallography-Structure Determination by Combining HREM, Crystallographic Image Processing and Electron Diffraction.- 9. Point Group and Space Group Identification by Convergent Beam Electron Diffraction.- 10. Advanced Techniques in TEM Specimen Preparation.





Electron Microscopy of Polymers

Автор: Michler G.H.
Название: Electron Microscopy of Polymers
ISBN: 3540363505 ISBN-13(EAN): 9783540363507
Издательство: Springer
Рейтинг:
Цена: 13107 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: There are many books on electron microscopy, however, the study of polymers by EM needs special techniques, precautions and preparation methods, including ultramicrotomy. General characteristics of the different techniques of EM, including scanning force microscopy (AFM), are given. Application of these techniques to study morphology and also properties, particularly micromechanical properties, is described in detail. Examples from all classes of polymers are presented.

Techniques in Confocal Microscopy,

Автор: P. Michael Conn
Название: Techniques in Confocal Microscopy,
ISBN: 0123846587 ISBN-13(EAN): 9780123846587
Издательство: Elsevier Science
Рейтинг:
Цена: 5549 р. 6166.00 -10%
Наличие на складе: Нет в наличии.

Описание:

As part of the Reliable Lab Solutions series, Techniques in Confocal Microscopy brings together chapters from volumes 302, 307 and 356 of Methods in Enzymology. It documents many diverse uses for confocal microscopy in disciplines that broadly span biology.

It documents many diverse uses for confocal microscopy in disciplines that broadly span biology. The methods presented include shortcuts and conveniences not included in the initial publications Techniques are described in a context that allows comparisons to other related methodologies. Methodologies are laid out in a manner that stresses their general applicability and reports their potential limitations.

Scanning Electron Microscopy and X-ray Microanalysis

Автор: Goldstein
Название: Scanning Electron Microscopy and X-ray Microanalysis
ISBN: 0306472929 ISBN-13(EAN): 9780306472923
Издательство: Springer
Рейтинг:
Цена: 9349 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Intended for students, as well as practitioners, this text offers an introduction to the field of Scanning Electron Microscopy (SEM) and X-ray microanalysis. It discusses topics such as user-controlled functions of scanning electron microscopes, the characteristics of electron beam, the use of x-rays for qualitative analysis, and more.

Physical Principles of Electron Microscopy

Автор: Egerton
Название: Physical Principles of Electron Microscopy
ISBN: 0387258000 ISBN-13(EAN): 9780387258003
Издательство: Springer
Рейтинг:
Цена: 12233 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.

Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

Автор: Patrick Echlin
Название: Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
ISBN: 0387857303 ISBN-13(EAN): 9780387857305
Издательство: Springer
Рейтинг:
Цена: 9817 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Specimens range from inorganic, organic, biological, and geological samples to materials such as metals, polymers, and semiconductors which can exist as solids, liquids, and gases. This title describes what is needed up to the point the sample is put into the instrument. It is suitable for those who use these instruments.

Applied Scanning Probe Methods II / Scanning Probe Microscopy Techniques

Автор: Bhushan Bharat , Fuchs Harald
Название: Applied Scanning Probe Methods II / Scanning Probe Microscopy Techniques
ISBN: 3540262423 ISBN-13(EAN): 9783540262428
Издательство: Springer
Рейтинг:
Цена: 14020 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Volume II introduces scanning probe microscopy, including sensor technology, Volume III covers the whole range of characterization possibilities using SPM and Volume IV offers chapters on uses in various industrial applications. The international perspective offered in these three volumes - which belong together - contributes further to the evolution of SPM techniques.

Scanning Transmission Electron Microscopy

Автор: Pennycook
Название: Scanning Transmission Electron Microscopy
ISBN: 1441971998 ISBN-13(EAN): 9781441971999
Издательство: Springer
Рейтинг:
Цена: 14492 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

Transmission electron microscopy

Автор: Reimer, Ludwig Kohl, Helmut
Название: Transmission electron microscopy
ISBN: 0387400931 ISBN-13(EAN): 9780387400938
Издательство: Springer
Рейтинг:
Цена: 14492 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Features the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. This work describes the principles of particle and wave optics of electrons. It discusses the electron-specimen interactions for evaluating the theory of scattering and phase contrast.

Scanning Probe Microscopy and Spectroscopy: Theory, Techniques, and Applications, 2nd Edition

Автор: Dawn Bonnell
Название: Scanning Probe Microscopy and Spectroscopy: Theory, Techniques, and Applications, 2nd Edition
ISBN: 047124824X ISBN-13(EAN): 9780471248248
Издательство: Wiley
Рейтинг:
Цена: 22990 р.
Наличие на складе: Нет в наличии.

Описание: Scanning tunneling microscopy (STM) provides 3-dimensional, real-space images of surfaces at high resolution. In the 15 years since its invention, the technique has become widely used as a characterization tool in materials science, semiconductor physics, biology, electrochemistry, and surface science. This new work provides an up-to-date presentation of the theory and practice of STM.

Transmission Electron Microscopy and Diffractometry of Materials

Автор: Fultz
Название: Transmission Electron Microscopy and Diffractometry of Materials
ISBN: 3540437649 ISBN-13(EAN): 9783540437642
Издательство: Springer
Цена: 7756 р.
Наличие на складе: Поставка под заказ.

Описание: This textbook develops the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms, wave interference, and the formation and analysis of diffraction patterns. It explains the uniqueness of each technique, especially imaging and spectroscopy in the TEM. Simple citations of rules are avoided as much as possible, and both practical and theoretical issues are explained in detail. The book can be used as both an introductory and advanced-level graduate text since sections/chapters are sorted according to difficulty and grouped for use in quarter and semester courses on TEM and XRD. Numerous problems are provided at the end of each chapter to reinforce key concepts, and solutions are available to instructors. Appendices provide procedures for introductory laboratory exercises, and up-to-date tabulations of physical data useful for TEM and XRD.

Transmission Electron Microscopy

Автор: Williams
Название: Transmission Electron Microscopy
ISBN: 030645324X ISBN-13(EAN): 9780306453243
Издательство: Springer
Рейтинг:
Цена: 7013 р.
Наличие на складе: Поставка под заказ.

Описание: This groundbreaking text provides the necessary instructions for hands-on application of this versatile materials characterization technique and is supported by over 600 illustrations and diagrams.

Transmission Electron Microscopy and Diffractometry of Materials

Автор: Fultz
Название: Transmission Electron Microscopy and Diffractometry of Materials
ISBN: 3540738851 ISBN-13(EAN): 9783540738855
Издательство: Springer
Цена: 8410 р.
Наличие на складе: Поставка под заказ.

Описание: Explains concepts of transmission electron microscopy and x-ray diffractometry that are important for the characterization of materials. This book describes the fundamentals of how waves and wave functions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements.


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