Progress in Transmission Electron Microscopy 1 / Concepts and Techniques, Zhang Xiao-Feng, Zhang Ze
Автор: Michler G.H. Название: Electron Microscopy of Polymers ISBN: 3540363505 ISBN-13(EAN): 9783540363507 Издательство: Springer Рейтинг: Цена: 13107 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: There are many books on electron microscopy, however, the study of polymers by EM needs special techniques, precautions and preparation methods, including ultramicrotomy. General characteristics of the different techniques of EM, including scanning force microscopy (AFM), are given. Application of these techniques to study morphology and also properties, particularly micromechanical properties, is described in detail. Examples from all classes of polymers are presented.
Автор: Egerton Название: Physical Principles of Electron Microscopy ISBN: 0387258000 ISBN-13(EAN): 9780387258003 Издательство: Springer Рейтинг: Цена: 12233 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.
Автор: Reimer, Ludwig Kohl, Helmut Название: Transmission electron microscopy ISBN: 0387400931 ISBN-13(EAN): 9780387400938 Издательство: Springer Рейтинг: Цена: 14024 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Features the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. This work describes the principles of particle and wave optics of electrons. It discusses the electron-specimen interactions for evaluating the theory of scattering and phase contrast.
Автор: Pennycook Название: Scanning Transmission Electron Microscopy ISBN: 1441971998 ISBN-13(EAN): 9781441971999 Издательство: Springer Рейтинг: Цена: 14492 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.
Описание: Scanning tunneling microscopy (STM) provides 3-dimensional, real-space images of surfaces at high resolution. In the 15 years since its invention, the technique has become widely used as a characterization tool in materials science, semiconductor physics, biology, electrochemistry, and surface science. This new work provides an up-to-date presentation of the theory and practice of STM.
Описание: Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.
Автор: David B. Williams; C. Barry Carter Название: Transmission Electron Microscopy ISBN: 038776500X ISBN-13(EAN): 9780387765006 Издательство: Springer Рейтинг: Цена: 9345 р. Наличие на складе: Невозможна поставка.
Описание: Illustrated in color, this work offers the necessary instructions for successful hands-on application of this versatile materials characterization technique. It also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment.
Описание: This book covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. Emphasis is on the experimental and computational methods used to quantify and analyze CTEM observations. A supplementary website containing interactive modules and free Fortran source code accompanies the text. The book starts with the basics of crystallography and quantum mechanics providing a sound mathematical footing for the rest of the text. The next section deals with the microscope itself, describing the various components in terms of the underlying theory. The second half of the book focuses on the dynamical theory of electron scattering in solids including its applications to perfect and defective crystals, electron diffraction and phase contrast techniques. Based on a lecture course given by the author in the Department of Materials Science and Engineering at Carnegie Mellon University, the book is ideal for graduate students as well as researchers new to the field.
Описание: This textbook develops the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms, wave interference, and the formation and analysis of diffraction patterns. It explains the uniqueness of each technique, especially imaging and spectroscopy in the TEM. Simple citations of rules are avoided as much as possible, and both practical and theoretical issues are explained in detail. The book can be used as both an introductory and advanced-level graduate text since sections/chapters are sorted according to difficulty and grouped for use in quarter and semester courses on TEM and XRD. Numerous problems are provided at the end of each chapter to reinforce key concepts, and solutions are available to instructors. Appendices provide procedures for introductory laboratory exercises, and up-to-date tabulations of physical data useful for TEM and XRD.
Автор: Williams Название: Transmission Electron Microscopy ISBN: 030645324X ISBN-13(EAN): 9780306453243 Издательство: Springer Рейтинг: Цена: 7013 р. Наличие на складе: Поставка под заказ.
Описание: This groundbreaking text provides the necessary instructions for hands-on application of this versatile materials characterization technique and is supported by over 600 illustrations and diagrams.
Описание: Explains concepts of transmission electron microscopy and x-ray diffractometry that are important for the characterization of materials. This book describes the fundamentals of how waves and wave functions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements.
Автор: David B. Williams; C. Barry Carter Название: Transmission Electron Microscopy ISBN: 0387765026 ISBN-13(EAN): 9780387765020 Издательство: Springer Рейтинг: Цена: 6540 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This groundbreaking text has been established as the market leader throughout the world. Profusely illustrated, "Transmission Electron Microscopy: A
Textbook for Materials Science" provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. For this first new edition in
12 years, many sections have been completely rewritten with all others revised and updated.
The new edition also includes an extensive collection of questions for the
student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment. Four-color illustrations throughout also enhance the
new edition. Praise for the first edition: 'The best textbook for this audience available' - "American Scientist".
'Ideally suited to the needs of a graduate level course. It is hard
to imagine this book not fulfilling most of the requirements of a text for such a course' - "Microscope". 'This book is written in such a comprehensive manner that it is understandable to
all people who are trained in physical science and it will be useful both for the expert as well as the student' - "Micron".
'The book answers nearly any question - be it
instrumental, practical, or theoretical - either directl
or with an appropriate reference...This book provides a basic, clear-cut presentation of how transmission electron microscopes should be used and of how this depends specifically on
one's specific undergoing project' - "MRS Bulletin, May 1998". 'The only complete text now available which includes all the remarkable advances made in the field of TEM in the past
30-40 years...The authors can be proud of an enormous task, very well done' - from the Foreword by Professor Gareth Thomas, University of California, Berkeley.
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