Huisman Leendert M. Data Mining and Diagnosing IC Fails 9780387249933

Варианты приобретения

Цена: 15674р.
Кол-во:
Наличие: Поставка под заказ. Есть в наличии на складе поставщика.
Склад Англия: 579 шт. Склад Америка: 65 шт.
При оформлении заказа до: 5 мар 2021
Ориентировочная дата поставки: начало Апреля

Добавить в корзину

в Мои желания

Автор: Huisman Leendert M.
Название: Data Mining and Diagnosing IC Fails
Издательство: Springer
Классификация:
Проектирование электроники
ISBN: 0387249931
ISBN-13(EAN): 9780387249933
ISBN: 0-387-24993-1
ISBN-13(EAN): 978-0-387-24993-3
Обложка/Формат: Hardback
Страницы: 250
Вес: 0.573 кг.
Дата издания: 2005
Серия: Frontiers in Electronic Testing
Язык: English
Иллюстрации: 46 black & white illustrations, biography
Размер: 24.33 x 16.26 x 1.96
Читательская аудитория: Professional & vocational
Ссылка на Издательство: Link
Рейтинг:
Поставляется из: Германии
Описание: There are many techniques for analyzing IC fails, but they are scattered over the professional IC test and diagnosis literature, and in various statistics and data mining handbooks. Moreover, many data mining techniques that are standard in other data analysis environments, and that are appropriate for analyzing IC fails, have not yet been employed for that purpose. Data Mining and Diagnosing IC Fails addresses the problem of obtaining maximum information from (functional) integrated circuit fail data about the defects that caused the fails. It starts at the highest level from mere sort codes, and drills down via various data mining techniques to detailed logic diagnosis. The various approaches discussed in this book have a thorough theoretical underpinning, but are geared towards applications on real life fail data and state of the art ICs. This book brings together a large number of analysis techniques that are suitable for IC fail data, but that are not available elsewhere in a single place. Several of the techniques, in fact, have been presented only recently in technical conferences. The purpose of the book is to bring together in one place a large number of analysis, data mining and diagnosis techniques that have proven to be useful in analyzing IC fails. The descriptions of the techniques and analysis routines is sufficiently detailed that professional manufacturing engineers can implement them in their own work environment.
Дополнительное описание: Формат: 235x155
Илюстрации: 46
Круг читателей: IC manufacturing and diagnostic engineers, and diagnostic engineers and advanced students in electrical test and diagnosis
Ключевые слова: Data
Diagnosing
Fails
Huisman
IC
Mining
Язык: eng

Data Mining and Diagnosing IC Fails, Huisman Leendert M.