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Data Mining and Diagnosing IC Fails, Huisman Leendert M.

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Цена: 15674р.
Наличие: Поставка под заказ.  Есть в наличии на складе поставщика.
Склад Англия: 579 шт.  Склад Америка: 65 шт.  
При оформлении заказа до: 5 мар 2021
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Автор: Huisman Leendert M.
Название:  Data Mining and Diagnosing IC Fails
Издательство: Springer
Проектирование электроники

ISBN: 0387249931
ISBN-13(EAN): 9780387249933
ISBN: 0-387-24993-1
ISBN-13(EAN): 978-0-387-24993-3
Обложка/Формат: Hardback
Страницы: 250
Вес: 0.573 кг.
Дата издания: 2005
Серия: Frontiers in Electronic Testing
Язык: English
Иллюстрации: 46 black & white illustrations, biography
Размер: 24.33 x 16.26 x 1.96
Читательская аудитория: Professional & vocational
Ссылка на Издательство: Link
Поставляется из: Германии
Описание: There are many techniques for analyzing IC fails, but they are scattered over the professional IC test and diagnosis literature, and in various statistics and data mining handbooks. Moreover, many data mining techniques that are standard in other data analysis environments, and that are appropriate for analyzing IC fails, have not yet been employed for that purpose. Data Mining and Diagnosing IC Fails addresses the problem of obtaining maximum information from (functional) integrated circuit fail data about the defects that caused the fails. It starts at the highest level from mere sort codes, and drills down via various data mining techniques to detailed logic diagnosis. The various approaches discussed in this book have a thorough theoretical underpinning, but are geared towards applications on real life fail data and state of the art ICs. This book brings together a large number of analysis techniques that are suitable for IC fail data, but that are not available elsewhere in a single place. Several of the techniques, in fact, have been presented only recently in technical conferences. The purpose of the book is to bring together in one place a large number of analysis, data mining and diagnosis techniques that have proven to be useful in analyzing IC fails. The descriptions of the techniques and analysis routines is sufficiently detailed that professional manufacturing engineers can implement them in their own work environment.
Дополнительное описание: Формат: 235x155
Илюстрации: 46
Круг читателей: IC manufacturing and diagnostic engineers, and diagnostic engineers and advanced students in electrical test and diagnosis
Ключевые слова: Data
Язык: eng

Failsafe Control Systems

Автор: K. Warwick; M.T. Tham
Название: Failsafe Control Systems
ISBN: 9401066779 ISBN-13(EAN): 9789401066778
Издательство: Springer
Цена: 10742 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: 6 Conclusions 195 References 196 14 Safety integrity management using expert systems Dr P. 7 Discussion 205 References 205 15 Power system alarm analysis and fault diagnosis using expert systems P. 2 Expert systems for power system alarm analysis already developed 208 15. 4 Discussion of alarm data flow 210 15. 5 Expert system requirements 210 15.

Data Mining and Diagnosing IC Fails

Автор: Leendert M. Huisman
Название: Data Mining and Diagnosing IC Fails
ISBN: 1441937676 ISBN-13(EAN): 9781441937674
Издательство: Springer
Цена: 15674 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: The second part contains all the mathematical details that are necessary to prove the validity of the analysis techniques, the existence of solutions to the problems that those techniques engender, and the correctness of several properties that were assumed in the first part.

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