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Introduction to Conventional Transmission Electron Microscopy, Marc De Graef


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Цена: 9366р.
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Наличие: Поставка под заказ.  Есть в наличии на складе поставщика.
Склад Англия: 288 шт.  Склад Америка: 132 шт.  
При оформлении заказа до: 7 фев 2020
Ориентировочная дата поставки: середина Марта

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Автор: Marc De Graef
Название:  Introduction to Conventional Transmission Electron Microscopy
Издательство: Cambridge Academ
Классификация:
Научное оборудование и методы, лабораторное оборудование
Физика конденсированного состояния (жидкости и тв.тела)
Физическая химия
Материаловедение

ISBN: 0521629950
ISBN-13(EAN): 9780521629959
ISBN: 0-521-62995-0
ISBN-13(EAN): 978-0-521-62995-9
Обложка/Формат: Paperback
Страницы: 740
Вес: 1.19 кг.
Дата издания: 27.03.2003
Серия: Cambridge solid state science series
Издание: Illustrated ed
Иллюстрации: 214 line figures 108 tones 25 tables 110 exercises
Размер: 246 x 175 x 31
Читательская аудитория: Tertiary education (us: college)
Ссылка на Издательство: Link
Рейтинг:
Поставляется из: Англии
Описание: This book covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. Emphasis is on the experimental and computational methods used to quantify and analyze CTEM observations. A supplementary website containing interactive modules and free Fortran source code accompanies the text. The book starts with the basics of crystallography and quantum mechanics providing a sound mathematical footing for the rest of the text. The next section deals with the microscope itself, describing the various components in terms of the underlying theory. The second half of the book focuses on the dynamical theory of electron scattering in solids including its applications to perfect and defective crystals, electron diffraction and phase contrast techniques. Based on a lecture course given by the author in the Department of Materials Science and Engineering at Carnegie Mellon University, the book is ideal for graduate students as well as researchers new to the field.
Дополнительное описание: Subject: Engineering / Materials Science and Engineering
Readership: materials science, condensed matter physics, physical chemistry, spectroscopy
Level: graduate students, academic researchers, undergraduate students
Format: 247 x 174 mm 740pp 214 line diagrams 108 half-tones 25 tables 110 exercises
Chapter Titles: 1. Basic crystallography; 2. Basic quantum mechanics; 3. The transmission electron microscope; 4. Getting started; 5. Dynamical electron scattering in perfect crystals; 6. Two-beam theory in defect-free crystals; 7. Systematic row and zone axis orientations; 8. Defects in crystals; 9. Electron diffraction patterns; 10. Phase contrast microscopy; Appendices.





Electron Microscopy of Polymers

Автор: Michler G.H.
Название: Electron Microscopy of Polymers
ISBN: 3540363505 ISBN-13(EAN): 9783540363507
Издательство: Springer
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Цена: 13107 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: There are many books on electron microscopy, however, the study of polymers by EM needs special techniques, precautions and preparation methods, including ultramicrotomy. General characteristics of the different techniques of EM, including scanning force microscopy (AFM), are given. Application of these techniques to study morphology and also properties, particularly micromechanical properties, is described in detail. Examples from all classes of polymers are presented.

Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

Автор: Patrick Echlin
Название: Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
ISBN: 0387857303 ISBN-13(EAN): 9780387857305
Издательство: Springer
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Цена: 9817 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Specimens range from inorganic, organic, biological, and geological samples to materials such as metals, polymers, and semiconductors which can exist as solids, liquids, and gases. This title describes what is needed up to the point the sample is put into the instrument. It is suitable for those who use these instruments.

Principles and Practice of Variable Pressure: Environmental Scanning Electron Microscopy (VP-ESEM)

Автор: Stokes
Название: Principles and Practice of Variable Pressure: Environmental Scanning Electron Microscopy (VP-ESEM)
ISBN: 0470065400 ISBN-13(EAN): 9780470065402
Издательство: Wiley
Рейтинг:
Цена: 6531 р.
Наличие на складе: Поставка под заказ.

Описание: The book will address various aspects of the topic in six chapters. Chapter 1 will contain background information and a comprehensive list of applications, in order to provide the reader with a rich survey of the available literature for further reading. Chapter 2 will briefly review the basic scientific principles of signal formation and detection in a gaseous environment. However, the aim is to provide a practical overview, rather than detailed discussion, and so the reader will necessarily be referred to appropriate sources in the literature should they wish to gain a deeper understanding of the inherent physics and chemistry. Chapter 3 will cover the principles of specimen stability as a function of water vapour pressure and/or temperature. The topics in Chapters 2 and 3 will set the scene for the main thrust of this volume, which is the application of VPSEM to performing practical work. Chapter 4 caters for those perhaps more interested in physical sciences and advanced materials applications and related industries. Chapter 5 is likely to be more relevant to those in the life sciences and manufacturing industries such as foods and personal care products. Inevitably, there will be an element of inter-disciplinarity in both of these chapters. Chapter 6 concludes the book with a survey ofin situ experiments such as: tensile testing, ice crystallization, freezing of solutions, oxidation and reduction, phase transformations and wetting of surfaces.

Sample preparation handbook for transmission electron microscopy

Название: Sample preparation handbook for transmission electron microscopy
ISBN: 0387981810 ISBN-13(EAN): 9780387981819
Издательство: Springer
Рейтинг:
Цена: 13107 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: This guide is divided into two sections. The first covers theoretical and practical aspects, including the best preparative technique. The second part offers technical hints, including twenty-two detailed protocols for preparing thin slices for TEM analysis.

Scanning Electron Microscopy and X-ray Microanalysis

Автор: Goldstein
Название: Scanning Electron Microscopy and X-ray Microanalysis
ISBN: 0306472929 ISBN-13(EAN): 9780306472923
Издательство: Springer
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Цена: 9349 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Intended for students, as well as practitioners, this text offers an introduction to the field of Scanning Electron Microscopy (SEM) and X-ray microanalysis. It discusses topics such as user-controlled functions of scanning electron microscopes, the characteristics of electron beam, the use of x-rays for qualitative analysis, and more.

Physical Principles of Electron Microscopy

Автор: Egerton
Название: Physical Principles of Electron Microscopy
ISBN: 0387258000 ISBN-13(EAN): 9780387258003
Издательство: Springer
Рейтинг:
Цена: 12233 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.

Progress in Transmission Electron Microscopy 2 / Applications in Materials Science

Автор: Zhang Xiao-Feng, Zhang Ze
Название: Progress in Transmission Electron Microscopy 2 / Applications in Materials Science
ISBN: 3540676813 ISBN-13(EAN): 9783540676812
Издательство: Springer
Рейтинг:
Цена: 15427 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.

Transmission Electron Microscopy and Diffractometry of Materials

Автор: Fultz
Название: Transmission Electron Microscopy and Diffractometry of Materials
ISBN: 3540437649 ISBN-13(EAN): 9783540437642
Издательство: Springer
Цена: 7756 р.
Наличие на складе: Поставка под заказ.

Описание: This textbook develops the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms, wave interference, and the formation and analysis of diffraction patterns. It explains the uniqueness of each technique, especially imaging and spectroscopy in the TEM. Simple citations of rules are avoided as much as possible, and both practical and theoretical issues are explained in detail. The book can be used as both an introductory and advanced-level graduate text since sections/chapters are sorted according to difficulty and grouped for use in quarter and semester courses on TEM and XRD. Numerous problems are provided at the end of each chapter to reinforce key concepts, and solutions are available to instructors. Appendices provide procedures for introductory laboratory exercises, and up-to-date tabulations of physical data useful for TEM and XRD.

Transmission Electron Microscopy

Автор: Williams
Название: Transmission Electron Microscopy
ISBN: 030645324X ISBN-13(EAN): 9780306453243
Издательство: Springer
Рейтинг:
Цена: 7013 р.
Наличие на складе: Поставка под заказ.

Описание: This groundbreaking text provides the necessary instructions for hands-on application of this versatile materials characterization technique and is supported by over 600 illustrations and diagrams.

Advanced Transmission Electron Microscopy

Автор: Zuo
Название: Advanced Transmission Electron Microscopy
ISBN: 1493966057 ISBN-13(EAN): 9781493966059
Издательство: Springer
Рейтинг:
Цена: 10192 р.
Наличие на складе: Поставка под заказ.

Описание: This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduate level text in support of course materials in Materials Science, Physics or Chemistry departments.

Introduction to Scanning Tunneling Microscopy

Автор: Chen, C. Julian
Название: Introduction to Scanning Tunneling Microscopy
ISBN: 0199211507 ISBN-13(EAN): 9780199211500
Издательство: Oxford Academ
Рейтинг:
Цена: 11709 р.
Наличие на складе: Нет в наличии.

Описание: The scanning tunneling and the atomic force microscope, both capable of imaging individual atoms, were crowned with the Physics Nobel Prize in 1986, and are the cornerstones of nanotechnology today. The 1st edition has nurtured numerous beginners and experts since 1993. The 2nd edition is a thoroughly updated version of this 'bible' in the field.

Microscopy: A Very Short Introduction

Автор: Allen, Terence
Название: Microscopy: A Very Short Introduction
ISBN: 0198701268 ISBN-13(EAN): 9780198701262
Издательство: Oxford Academ
Рейтинг:
Цена: от 555 р.
Наличие на складе: Есть

Описание: In this Very Short Introduction Terence Allen introduces the reader to the full spectrum of microscopy techniques and advances. Explaining the history of microscopic techniques, development, principles, and recent technological advances, this is an ideal introduction for anyone studying the life sciences, physical sciences, and engineering.


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