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In-situ electron microscopy at high resolution, 



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Цена: 14936р.
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При оформлении заказа до: 6 мар 2020
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Название:  In-situ electron microscopy at high resolution
Издательство: World Scientific Publishing
Классификация:
Научное оборудование и методы, лабораторное оборудование

ISBN: 9812797335
ISBN-13(EAN): 9789812797339
ISBN: 981-279733-5
ISBN-13(EAN): 978-981-279733-9
Обложка/Формат: Hardback
Страницы: 320
Вес: 0.604 кг.
Дата издания: 01.09.2008
Язык: ENG
Иллюстрации: Black & white tables, figures
Размер: 22.86 x 15.75 x 2.03 cm
Читательская аудитория: Postgraduate, research & scholarly
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Поставляется из: Англии
Описание: Reviews various techniques and achievements of in-situ high-resolution electron microscopy. This book also demonstrates the applications in several fields of materials science.
Дополнительное описание:




Electron Microscopy of Polymers

Автор: Michler G.H.
Название: Electron Microscopy of Polymers
ISBN: 3540363505 ISBN-13(EAN): 9783540363507
Издательство: Springer
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Цена: 13107 р.
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Описание: There are many books on electron microscopy, however, the study of polymers by EM needs special techniques, precautions and preparation methods, including ultramicrotomy. General characteristics of the different techniques of EM, including scanning force microscopy (AFM), are given. Application of these techniques to study morphology and also properties, particularly micromechanical properties, is described in detail. Examples from all classes of polymers are presented.

Progress in Transmission Electron Microscopy 1 / Concepts and Techniques

Автор: Zhang Xiao-Feng, Zhang Ze
Название: Progress in Transmission Electron Microscopy 1 / Concepts and Techniques
ISBN: 3540676805 ISBN-13(EAN): 9783540676805
Издательство: Springer
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Цена: 20477 р.
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Описание: Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.

Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

Автор: Patrick Echlin
Название: Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
ISBN: 0387857303 ISBN-13(EAN): 9780387857305
Издательство: Springer
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Цена: 9817 р.
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Описание: Specimens range from inorganic, organic, biological, and geological samples to materials such as metals, polymers, and semiconductors which can exist as solids, liquids, and gases. This title describes what is needed up to the point the sample is put into the instrument. It is suitable for those who use these instruments.

Transmission Electron Microscopy

Автор: David B. Williams; C. Barry Carter
Название: Transmission Electron Microscopy
ISBN: 038776500X ISBN-13(EAN): 9780387765006
Издательство: Springer
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Цена: 9345 р.
Наличие на складе: Невозможна поставка.

Описание: Illustrated in color, this work offers the necessary instructions for successful hands-on application of this versatile materials characterization technique. It also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment.

Physical Principles of Electron Microscopy

Автор: Egerton
Название: Physical Principles of Electron Microscopy
ISBN: 0387258000 ISBN-13(EAN): 9780387258003
Издательство: Springer
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Цена: 12233 р.
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Описание: Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.

Progress in Transmission Electron Microscopy 2 / Applications in Materials Science

Автор: Zhang Xiao-Feng, Zhang Ze
Название: Progress in Transmission Electron Microscopy 2 / Applications in Materials Science
ISBN: 3540676813 ISBN-13(EAN): 9783540676812
Издательство: Springer
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Цена: 15427 р.
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Описание: Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.

Introduction to Conventional Transmission Electron Microscopy

Автор: Marc De Graef
Название: Introduction to Conventional Transmission Electron Microscopy
ISBN: 0521629950 ISBN-13(EAN): 9780521629959
Издательство: Cambridge Academ
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Цена: 9366 р.
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Описание: This book covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. Emphasis is on the experimental and computational methods used to quantify and analyze CTEM observations. A supplementary website containing interactive modules and free Fortran source code accompanies the text. The book starts with the basics of crystallography and quantum mechanics providing a sound mathematical footing for the rest of the text. The next section deals with the microscope itself, describing the various components in terms of the underlying theory. The second half of the book focuses on the dynamical theory of electron scattering in solids including its applications to perfect and defective crystals, electron diffraction and phase contrast techniques. Based on a lecture course given by the author in the Department of Materials Science and Engineering at Carnegie Mellon University, the book is ideal for graduate students as well as researchers new to the field.

Electron Microprobe Analysis and Scanning Electron Microscopy in Geology

Автор: S. J. B. Reed
Название: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
ISBN: 052184875X ISBN-13(EAN): 9780521848756
Издательство: Cambridge Academ
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Цена: 6453 р.
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Описание: Now fully updated to cover recent developments, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray ‘maps’ showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms an up-to-date text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

Principles of Analytical Electron Microscopy

Автор: Goldstein
Название: Principles of Analytical Electron Microscopy
ISBN: 0306423871 ISBN-13(EAN): 9780306423871
Издательство: Springer
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Цена: 14853 р.
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Описание: All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention.

Scanning Electron Microscopy

Автор: Reimer
Название: Scanning Electron Microscopy
ISBN: 3540639764 ISBN-13(EAN): 9783540639763
Издательство: Springer
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Цена: 17476 р.
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Описание: A description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes are discussed to evaluate specific contrasts and to obtain quantitative information.

Scanning Electron Microscopy and X-ray Microanalysis

Автор: Goldstein
Название: Scanning Electron Microscopy and X-ray Microanalysis
ISBN: 0306472929 ISBN-13(EAN): 9780306472923
Издательство: Springer
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Цена: 9349 р.
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Описание: Intended for students, as well as practitioners, this text offers an introduction to the field of Scanning Electron Microscopy (SEM) and X-ray microanalysis. It discusses topics such as user-controlled functions of scanning electron microscopes, the characteristics of electron beam, the use of x-rays for qualitative analysis, and more.

Transmission electron microscopy

Автор: Reimer, Ludwig Kohl, Helmut
Название: Transmission electron microscopy
ISBN: 0387400931 ISBN-13(EAN): 9780387400938
Издательство: Springer
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Цена: 14492 р.
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Описание: Features the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. This work describes the principles of particle and wave optics of electrons. It discusses the electron-specimen interactions for evaluating the theory of scattering and phase contrast.


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