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High-Resolution Electron Microscopy, Spence, John C. H.



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Автор: Spence, John C. H.
Название:  High-Resolution Electron Microscopy
Издательство: Oxford Academ
Классификация:
Научное оборудование и методы, лабораторное оборудование

ISBN: 0199552754
ISBN-13(EAN): 9780199552757
ISBN: 0-19-955275-4
ISBN-13(EAN): 978-0-19-955275-7
Обложка/Формат: Paperback
Страницы: 424
Вес: 0.641 кг.
Дата издания: 09.10.2008
Серия: Monographs on the Physics and Chemistry of Materials No. 60
Язык: ENG
Издание: Third Edition
Иллюстрации: 72 line drawings and 80 halftones
Размер: 23.11 x 15.75 x 2.29 cm
Читательская аудитория: University professors and practitioners in material science, chemistry, structural biology, and physics departments, as well as staff scientists in government and industrial research laboratories.
Ссылка на Издательство: Link
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Поставляется из: Англии
Описание: This book describes how to see atoms using electron microscopes. This new edition includes updated sections on applications and new uses of atomic-resolution transmission electron microscopy. Several new chapters and sources of software for image interpretation and electron-optical design have also been added.
Дополнительное описание: Materials science; Engineering: general; Microscopy; Applied optics; Applied physics; Condensed matter physics (liquid state & solid state physics); Biology, life sciences; Nanotechnology; Crystallography; Chemistry; Physics




Electron Microscopy of Polymers

Автор: Michler G.H.
Название: Electron Microscopy of Polymers
ISBN: 3540363505 ISBN-13(EAN): 9783540363507
Издательство: Springer
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Цена: 13107 р.
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Описание: There are many books on electron microscopy, however, the study of polymers by EM needs special techniques, precautions and preparation methods, including ultramicrotomy. General characteristics of the different techniques of EM, including scanning force microscopy (AFM), are given. Application of these techniques to study morphology and also properties, particularly micromechanical properties, is described in detail. Examples from all classes of polymers are presented.

High Energy Electron Diffraction and Microscopy

Автор: Peng, L.M.; Dudarev, S.L.; Whelan, M.J.
Название: High Energy Electron Diffraction and Microscopy
ISBN: 0198500742 ISBN-13(EAN): 9780198500742
Издательство: Oxford Academ
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Цена: 13791 р.
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Описание: Offers a treatment of the theoretical background relevant to an understanding of materials, obtained by using high-energy electron diffraction and microscopy. Dynamical diffraction in transmission and reflection geometries is treated using a general matrix theory, where computer programs and worked examples are provided to illustrate the concepts.

Progress in Transmission Electron Microscopy 1 / Concepts and Techniques

Автор: Zhang Xiao-Feng, Zhang Ze
Название: Progress in Transmission Electron Microscopy 1 / Concepts and Techniques
ISBN: 3540676805 ISBN-13(EAN): 9783540676805
Издательство: Springer
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Цена: 20477 р.
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Описание: Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.

Physical Principles of Electron Microscopy

Автор: Egerton
Название: Physical Principles of Electron Microscopy
ISBN: 0387258000 ISBN-13(EAN): 9780387258003
Издательство: Springer
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Цена: 12233 р.
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Описание: Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.

Scanning Electron Microscopy and X-ray Microanalysis

Автор: Goldstein
Название: Scanning Electron Microscopy and X-ray Microanalysis
ISBN: 0306472929 ISBN-13(EAN): 9780306472923
Издательство: Springer
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Цена: 9349 р.
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Описание: Intended for students, as well as practitioners, this text offers an introduction to the field of Scanning Electron Microscopy (SEM) and X-ray microanalysis. It discusses topics such as user-controlled functions of scanning electron microscopes, the characteristics of electron beam, the use of x-rays for qualitative analysis, and more.

Progress in Transmission Electron Microscopy 2 / Applications in Materials Science

Автор: Zhang Xiao-Feng, Zhang Ze
Название: Progress in Transmission Electron Microscopy 2 / Applications in Materials Science
ISBN: 3540676813 ISBN-13(EAN): 9783540676812
Издательство: Springer
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Цена: 15427 р.
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Описание: Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.

Electron Microprobe Analysis and Scanning Electron Microscopy in Geology

Автор: S. J. B. Reed
Название: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
ISBN: 052184875X ISBN-13(EAN): 9780521848756
Издательство: Cambridge Academ
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Цена: 6453 р.
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Описание: Now fully updated to cover recent developments, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray ‘maps’ showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms an up-to-date text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

Principles of Analytical Electron Microscopy

Автор: Goldstein
Название: Principles of Analytical Electron Microscopy
ISBN: 0306423871 ISBN-13(EAN): 9780306423871
Издательство: Springer
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Цена: 14853 р.
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Описание: All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention.

Scanning Electron Microscopy

Автор: Reimer
Название: Scanning Electron Microscopy
ISBN: 3540639764 ISBN-13(EAN): 9783540639763
Издательство: Springer
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Цена: 17476 р.
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Описание: A description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes are discussed to evaluate specific contrasts and to obtain quantitative information.

Principles and Practice of Variable Pressure: Environmental Scanning Electron Microscopy (VP-ESEM)

Автор: Stokes
Название: Principles and Practice of Variable Pressure: Environmental Scanning Electron Microscopy (VP-ESEM)
ISBN: 0470065400 ISBN-13(EAN): 9780470065402
Издательство: Wiley
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Цена: 6531 р.
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Описание: The book will address various aspects of the topic in six chapters. Chapter 1 will contain background information and a comprehensive list of applications, in order to provide the reader with a rich survey of the available literature for further reading. Chapter 2 will briefly review the basic scientific principles of signal formation and detection in a gaseous environment. However, the aim is to provide a practical overview, rather than detailed discussion, and so the reader will necessarily be referred to appropriate sources in the literature should they wish to gain a deeper understanding of the inherent physics and chemistry. Chapter 3 will cover the principles of specimen stability as a function of water vapour pressure and/or temperature. The topics in Chapters 2 and 3 will set the scene for the main thrust of this volume, which is the application of VPSEM to performing practical work. Chapter 4 caters for those perhaps more interested in physical sciences and advanced materials applications and related industries. Chapter 5 is likely to be more relevant to those in the life sciences and manufacturing industries such as foods and personal care products. Inevitably, there will be an element of inter-disciplinarity in both of these chapters. Chapter 6 concludes the book with a survey ofin situ experiments such as: tensile testing, ice crystallization, freezing of solutions, oxidation and reduction, phase transformations and wetting of surfaces.

Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

Автор: Patrick Echlin
Название: Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
ISBN: 0387857303 ISBN-13(EAN): 9780387857305
Издательство: Springer
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Цена: 9817 р.
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Описание: Specimens range from inorganic, organic, biological, and geological samples to materials such as metals, polymers, and semiconductors which can exist as solids, liquids, and gases. This title describes what is needed up to the point the sample is put into the instrument. It is suitable for those who use these instruments.

Transmission Electron Microscopy

Автор: David B. Williams; C. Barry Carter
Название: Transmission Electron Microscopy
ISBN: 038776500X ISBN-13(EAN): 9780387765006
Издательство: Springer
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Цена: 9345 р.
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Описание: Illustrated in color, this work offers the necessary instructions for successful hands-on application of this versatile materials characterization technique. It also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment.


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