Characterization of High Tc Materials and Devices by Electron Microscopy, Browning
Автор: Michler G.H. Название: Electron Microscopy of Polymers ISBN: 3540363505 ISBN-13(EAN): 9783540363507 Издательство: Springer Рейтинг: Цена: 13107 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: There are many books on electron microscopy, however, the study of polymers by EM needs special techniques, precautions and preparation methods, including ultramicrotomy. General characteristics of the different techniques of EM, including scanning force microscopy (AFM), are given. Application of these techniques to study morphology and also properties, particularly micromechanical properties, is described in detail. Examples from all classes of polymers are presented.
Описание: This book presents a coherent synopsis of a rapidly evolving field. Subjects covered include diffraction contrast and defect analysis by conventional TEM
lattice imaging, phase contrast and resolution limits in high resolution electron microscopy. Specialized electron diffraction techniq
es are also covered, as is the application of parallel electron energy loss spectroscopy and scanning transmission EM for subnanometer analysis.
Materials analyzed include
thin films, interfaces and non-conventional materials. WDS and EDS are treated, with an emphasis on phi(rhoZeta) techniques for the analysis of thin layers and surface films.
Theoretical and practical aspects of ESEM are discussed in relation to applications in crystal growth, biomaterials and polymers.
Recent developments in SPM are also
described. This is a comprehensive survey of the state of the art in electron and SPM, future research directions and prospective applications in materials engineering.
Описание: The UNESCO School and IUPAC Conference in April 2001 was the fourto be held in Stellenbosch, South Africa. World authorities are invited to give tutorials at the School and presentations at the Conference to expose South African students and researchers to new ideas in the area of macromolecular science. Continuing the theme of Macromolecules and Materials Science, the focus was on polymer characterization, new polymer architectures and nanomaterials. A number of papers presented at the Conference are collected in this volume of Macromolecular Symposia.
Описание: The papers in this book are a collection of the works presented at the IUTAM Symposium - Marrakech 2002, which brought together scientists from various
countries. There were over fifty presentations including four plenary sessions and poster sessions. The papers cover contemporary topics in multiscale modeling and characterization of
materials behavior of engineering materials.
These were selected to focus on topics related to deformation and failure in metals, alloys, intermetallics and polymers including:
Experimental techniques, deformation and failure mechanisms, dislocation-based modeling, microscopic-macroscopic averaging schemes, application to forming processes and to phase
transformation, localization and failure phenomena, and computational advances. Key areas that are covered by some of the papers include modeling of material deformation at various
scales. At the atomistic scale, results from MD simulations pertaining to deformation mechanisms in nano-crystalline materials as well as dislocation-defect interactions are
Advances in modeling of deformation in metals using discrete dislocation analyses are also presented, providing an insight into this emerging scientific technique
that can be used to model deformation at the microscale. These papers address current engineering problems, including deformation of thin films, dislocation behaviour and strength
during nanoindentation, strength in metal matrix composites, dislocation-crack interaction, development of textures in polycrystals, and problems involving twining and shape memory
Описание: This volume focuses on the characterization of nano-optical materials and optical near-field interactions. It begins with the techniques for characterizing the magneto-optical Kerr effect and continues with methods to determine structural and optical properties in high-quality quantum wires with high spatial uniformity. Further topics include: near-field luminescence mapping in InGaN/GaN single quantum well structures in order to interpret the recombination mechanism in InGaN-based nano-structures; and theoretical treatment of the optical near field and optical near-field interactions, providing the basis for investigating the signal transport and associated dissipation in nano-optical devices. Taken as a whole, this overview will be a valuable resource for engineers and scientists working in the field of nano-electro-optics.
Описание: Materials characterization is an important area of fundamental and technological interest. Over the years, a variety of experimental techniques have been
developed for characterizing the physical and chemical properties of materials. "Advances in Materials Characterization" offers an overview of this continually emerging discipline by
providing an in-depth exploration of the latest techniques.
It brings together a highly authoritative collection of articles written by experts from across the world who have been
active in pioneering the techniques. Each chapter provides an introduction and an overview of the technique, and then proceeds to demonstrate its application to selected
Описание: This book is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. In this integrated treatment of the science of microstructural characterization, the three main aspects of microstructural morphology, phase identification and crystallography, and microanalysis of the chemical composition are all covered in detail. The principal methods of characterization including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated in full.
Описание: This book is designed to provide a systematic overview of the rapidly expanding field of synchrotron radiation materials science. It aims at introducing readers to the use of neutrons and synchrotron radiation for superior materials characterization. Special emphasis is on diffraction, tomography and scattering methods in engineering material science and component characterization. Comparisons of radiation sources and best choice of measurement and evaluation methods for specific tasks are must-have reading for researchers and engineers in industry and academia as well as graduate students and newcomers to this field.
Описание: This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included.
Описание: This volume includes papers from the Second International Conference on Characterization and Control of Interfaces for High Quality Advanced Materials, and Joining Technology for New Metallic Glasses and Inorganic Materials (ICCCI2006) in Kurashiki, Japan, 2006. Interfaces are critically important to a broad spectrum of materials and technologies. This Proceedings of ICCCI 2006 features 71 peerreviewed papers on interface characterization and control technology for materials synthesis, powder processing, composite processing, joining, and to control airborne particulates.
Описание: Explains concepts of transmission electron microscopy and x-ray diffractometry that are important for the characterization of materials. This book describes the fundamentals of how waves and wave functions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements.
ООО "Логосфера " Тел:+7(495) 980-12-10 www.logobook.ru