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Characterization of High Tc Materials and Devices by Electron Microscopy, Browning



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Цена: 10720р.
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Склад Англия: 221 шт.  Склад Америка: 138 шт.  
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Автор: Browning
Название:  Characterization of High Tc Materials and Devices by Electron Microscopy
Издательство: Cambridge Academ
Классификация:
Физика конденсированного состояния (жидкости и тв.тела)
Электричество, магнетизм и электромагнетизм
Материаловедение

ISBN: 052155490X
ISBN-13(EAN): 9780521554909
ISBN: 0-521-55490-X
ISBN-13(EAN): 978-0-521-55490-9
Обложка/Формат: Hardback
Страницы: 406
Вес: 1.125 кг.
Дата издания: 06.07.2000
Серия: Condensed matter physics, nanoscience and mesoscopic physics
Язык: ENG
Иллюстрации: 115 line figures 152 tones 3 tables
Размер: 247 x 174 x 31
Читательская аудитория: Professional & vocational
Ссылка на Издательство: Link
Рейтинг:
Поставляется из: Англии
Описание: A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors.



Electron Microscopy of Polymers

Автор: Michler G.H.
Название: Electron Microscopy of Polymers
ISBN: 3540363505 ISBN-13(EAN): 9783540363507
Издательство: Springer
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Цена: 13107 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: There are many books on electron microscopy, however, the study of polymers by EM needs special techniques, precautions and preparation methods, including ultramicrotomy. General characteristics of the different techniques of EM, including scanning force microscopy (AFM), are given. Application of these techniques to study morphology and also properties, particularly micromechanical properties, is described in detail. Examples from all classes of polymers are presented.

Impact of Electron and Scanning Probe Microscopy on Materials Research

Автор: Rickerby
Название: Impact of Electron and Scanning Probe Microscopy on Materials Research
ISBN: 0792359399 ISBN-13(EAN): 9780792359395
Издательство: Springer
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Цена: 23759 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: This book presents a coherent synopsis of a rapidly evolving field. Subjects covered include diffraction contrast and defect analysis by conventional TEM lattice imaging, phase contrast and resolution limits in high resolution electron microscopy. Specialized electron diffraction techniq es are also covered, as is the application of parallel electron energy loss spectroscopy and scanning transmission EM for subnanometer analysis.

Materials analyzed include thin films, interfaces and non-conventional materials. WDS and EDS are treated, with an emphasis on phi(rhoZeta) techniques for the analysis of thin layers and surface films. Theoretical and practical aspects of ESEM are discussed in relation to applications in crystal growth, biomaterials and polymers.

Recent developments in SPM are also described. This is a comprehensive survey of the state of the art in electron and SPM, future research directions and prospective applications in materials engineering.

Handbook of Sol-Gel Science and Technology / Processing, Characterization and Applications, V. I - Sol-Gel Processing/Hiromitsu Kozuka, Editor, V. II - Characterization of Sol-Gel Materials and Products/Rui M. Almeida, Editor, V. III - Applications of Sol

Автор: Sakka Sumio
Название: Handbook of Sol-Gel Science and Technology / Processing, Characterization and Applications, V. I - Sol-Gel Processing/Hiromitsu Kozuka, Editor, V. II - Characterization of Sol-Gel Materials and Products/Rui M. Almeida, Editor, V. III - Applications of Sol
ISBN: 1402079702 ISBN-13(EAN): 9781402079702
Издательство: Springer
Цена: 127534 р.
Наличие на складе: Поставка под заказ.

Описание: Title is also available as part of a set: Handbook of Sol-Gel Science and Technology (978-0-387-33554-4)

Polymer Characterization and Materials Science

Автор: Ronald D. Sanderson
Название: Polymer Characterization and Materials Science
ISBN: 3527304681 ISBN-13(EAN): 9783527304684
Издательство: Wiley
Цена: 6793 р.
Наличие на складе: Поставка под заказ.

Описание: The UNESCO School and IUPAC Conference in April 2001 was the fourto be held in Stellenbosch, South Africa. World authorities are invited to give tutorials at the School and presentations at the Conference to expose South African students and researchers to new ideas in the area of macromolecular science. Continuing the theme of Macromolecules and Materials Science, the focus was on polymer characterization, new polymer architectures and nanomaterials. A number of papers presented at the Conference are collected in this volume of Macromolecular Symposia.

IUTAM Symposium on Multiscale Modeling and Characterization of Elastic-Inelastic Behavior of Engineering Materials

Автор: Ahzi
Название: IUTAM Symposium on Multiscale Modeling and Characterization of Elastic-Inelastic Behavior of Engineering Materials
ISBN: 1402018614 ISBN-13(EAN): 9781402018619
Издательство: Springer
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Цена: 18699 р.
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Описание: The papers in this book are a collection of the works presented at the IUTAM Symposium - Marrakech 2002, which brought together scientists from various countries. There were over fifty presentations including four plenary sessions and poster sessions. The papers cover contemporary topics in multiscale modeling and characterization of materials behavior of engineering materials.

These were selected to focus on topics related to deformation and failure in metals, alloys, intermetallics and polymers including: Experimental techniques, deformation and failure mechanisms, dislocation-based modeling, microscopic-macroscopic averaging schemes, application to forming processes and to phase transformation, localization and failure phenomena, and computational advances. Key areas that are covered by some of the papers include modeling of material deformation at various scales. At the atomistic scale, results from MD simulations pertaining to deformation mechanisms in nano-crystalline materials as well as dislocation-defect interactions are presented.

Advances in modeling of deformation in metals using discrete dislocation analyses are also presented, providing an insight into this emerging scientific technique that can be used to model deformation at the microscale. These papers address current engineering problems, including deformation of thin films, dislocation behaviour and strength during nanoindentation, strength in metal matrix composites, dislocation-crack interaction, development of textures in polycrystals, and problems involving twining and shape memory behavior.

Progress in Nano-Electro Optics IV / Characterization of Nano-Optical Materials and Optical Near-Field Interactions

Автор: Ohtsu Motoichi
Название: Progress in Nano-Electro Optics IV / Characterization of Nano-Optical Materials and Optical Near-Field Interactions
ISBN: 3540232362 ISBN-13(EAN): 9783540232360
Издательство: Springer
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Цена: 15427 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: This volume focuses on the characterization of nano-optical materials and optical near-field interactions. It begins with the techniques for characterizing the magneto-optical Kerr effect and continues with methods to determine structural and optical properties in high-quality quantum wires with high spatial uniformity. Further topics include: near-field luminescence mapping in InGaN/GaN single quantum well structures in order to interpret the recombination mechanism in InGaN-based nano-structures; and theoretical treatment of the optical near field and optical near-field interactions, providing the basis for investigating the signal transport and associated dissipation in nano-optical devices. Taken as a whole, this overview will be a valuable resource for engineers and scientists working in the field of nano-electro-optics.

Advances in Materials Characterization

Название: Advances in Materials Characterization
ISBN: 1420047299 ISBN-13(EAN): 9781420047295
Издательство: Taylor&Francis
Рейтинг:
Цена: 16198 р.
Наличие на складе: Поставка под заказ.

Описание: Materials characterization is an important area of fundamental and technological interest. Over the years, a variety of experimental techniques have been developed for characterizing the physical and chemical properties of materials. "Advances in Materials Characterization" offers an overview of this continually emerging discipline by providing an in-depth exploration of the latest techniques.

It brings together a highly authoritative collection of articles written by experts from across the world who have been active in pioneering the techniques. Each chapter provides an introduction and an overview of the technique, and then proceeds to demonstrate its application to selected problems.

Microstructural Characterization of Materials, 2nd Edition

Автор: Brandon
Название: Microstructural Characterization of Materials, 2nd Edition
ISBN: 0470027843 ISBN-13(EAN): 9780470027844
Издательство: Wiley
Цена: 10450 р.
Наличие на складе: Поставка под заказ.

Описание: This book is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. In this integrated treatment of the science of microstructural characterization, the three main aspects of microstructural morphology, phase identification and crystallography, and microanalysis of the chemical composition are all covered in detail. The principal methods of characterization including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated in full.

Neutrons and Synchrotron Radiation in Engineering Materials Science: From Fundamentals to Material and Component Characterization

Автор: Reimers
Название: Neutrons and Synchrotron Radiation in Engineering Materials Science: From Fundamentals to Material and Component Characterization
ISBN: 3527315330 ISBN-13(EAN): 9783527315338
Издательство: Wiley
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Цена: 12540 р.
Наличие на складе: Поставка под заказ.

Описание: This book is designed to provide a systematic overview of the rapidly expanding field of synchrotron radiation materials science. It aims at introducing readers to the use of neutrons and synchrotron radiation for superior materials characterization. Special emphasis is on diffraction, tomography and scattering methods in engineering material science and component characterization. Comparisons of radiation sources and best choice of measurement and evaluation methods for specific tasks are must-have reading for researchers and engineers in industry and academia as well as graduate students and newcomers to this field.

Characterization of High Tc Materials and Devices by Electron Microscopy

Автор: Edited by Nigel D. Browning
Название: Characterization of High Tc Materials and Devices by Electron Microscopy
ISBN: 0521031702 ISBN-13(EAN): 9780521031707
Издательство: Cambridge Academ
Рейтинг:
Цена: 3330 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included.

Characterization and Control of Interfaces for High Quality Advanced Materials II: Ceramic Transactions, Volume 198

Автор: Ewsuk
Название: Characterization and Control of Interfaces for High Quality Advanced Materials II: Ceramic Transactions, Volume 198
ISBN: 0470184140 ISBN-13(EAN): 9780470184141
Издательство: Wiley
Рейтинг:
Цена: 14839 р.
Наличие на складе: Поставка под заказ.

Описание: This volume includes papers from the Second International Conference on Characterization and Control of Interfaces for High Quality Advanced Materials, and Joining Technology for New Metallic Glasses and Inorganic Materials (ICCCI2006) in Kurashiki, Japan, 2006. Interfaces are critically important to a broad spectrum of materials and technologies. This Proceedings of ICCCI 2006 features 71 peerreviewed papers on interface characterization and control technology for materials synthesis, powder processing, composite processing, joining, and to control airborne particulates.

Transmission Electron Microscopy and Diffractometry of Materials

Автор: Fultz
Название: Transmission Electron Microscopy and Diffractometry of Materials
ISBN: 3540738851 ISBN-13(EAN): 9783540738855
Издательство: Springer
Цена: 8410 р.
Наличие на складе: Поставка под заказ.

Описание: Explains concepts of transmission electron microscopy and x-ray diffractometry that are important for the characterization of materials. This book describes the fundamentals of how waves and wave functions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements.


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