Описание: This book covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. Emphasis is on the experimental and computational methods used to quantify and analyze CTEM observations. A supplementary website containing interactive modules and free Fortran source code accompanies the text. The book starts with the basics of crystallography and quantum mechanics providing a sound mathematical footing for the rest of the text. The next section deals with the microscope itself, describing the various components in terms of the underlying theory. The second half of the book focuses on the dynamical theory of electron scattering in solids including its applications to perfect and defective crystals, electron diffraction and phase contrast techniques. Based on a lecture course given by the author in the Department of Materials Science and Engineering at Carnegie Mellon University, the book is ideal for graduate students as well as researchers new to the field.
Описание: Mechanics of Time-Dependent Materials and Processes in Conventional and Multifunctional Materials represents one of eight volumes of technical papers presented at the Society for Experimental Mechanics Annual Conference on Experimental and Applied Mechanics, held at Uncasville, Connecticut, June 13-16, 2011. The full set of proceedings also includes volumes on Dynamic Behavior of Materials, Mechanics of Biological Systems and Materials; MEMS and Nanotechnology; Optical Measurements, Modeling and, Metrology; Experimental and Applied Mechanics, Thermomechanics and Infra-Red Imaging, and Engineering Applications of Residual Stress.
Описание: This book analyzes conventional fixed-bed reactors such as trickle-bed, bubble (packed) column, and multitubular reactors with regard to process efficiency, design and safety. It is shown that these reactors do not possess any substantial potential for improving industrial processes. Modern concepts in mass transfer, kinetics and process design are applied to process development. In light of the given analysis, new approaches to the development of technologies based on innovative principles are elucidated. For the first time, first-hand knowledge about Two-Zone Model, Oscillation Theory, map of the energy dissipation is presented in full.
Описание: Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.
Описание: Constitutes of the technical papers that were presented at the Society for Experimental Mechanics SEM 12th International Congress and Exposition on Experimental and Applied Mechanics, held at Costa Mesa, California, June 11-14, 2012.
Описание: Mechanics of Time-Dependent Materials and Processes in Conventional and Multifunctional Materials represents one of eight volumes of technical papers presented at the Society for Experimental Mechanics Annual Conference on Experimental and Applied Mechanics, held at Uncasville, Connecticut, June 13-16, 2011.
Описание: Aberration-Corrected Imaging In Transmission Electron Microscopy Provides An Introduction To Aberration-Corrected Atomic-Resolution Electron Microscopy Imaging In Materials And Physical Sciences. It Covers Both The Broad Beam Transmission Mode (Tem; Transmission Electron Microscopy) And The Scanning Transmission Mode (Stem; Scanning Transmission Electron Microscopy). The Book Is Structured In Three Parts. The First Part Introduces The Basics Of Conventional Atomic-Resolution Electron Microscopy Imaging In Tem And Stem Modes. This Part Also Describes Limits Of Conventional Electron Microscopes And Possible Artefacts Which Are Caused By The Intrinsic Lens Aberrations That Are Unavoidable In Such Instruments. The Second Part Introduces Fundamental Electron Optical Concepts And Thus Provides A Brief Introduction To Electron Optics. Based On The First And Second Parts Of The Book, The Third Part Focuses On Aberration Correction; It Describes The Various Aberrations In Electron Microscopy And Introduces The Concepts Of Spherical Aberration Correctors And Advanced Aberration Correctors, Including Correctors For Chromatic Aberration. This Part Also Provides Guidelines On How To Optimize The Imaging Conditions For Atomic-Resolution Stem And Tem Imaging.This Second Edition Has Been Completely Revised And Updated In Order To Incorporate The Very Recent Technological And Scientific Achievements That Have Been Realized Since The First Edition Appeared In 2010.
Автор: David B. Williams; C. Barry Carter Название: Transmission Electron Microscopy ISBN: 038776500X ISBN-13(EAN): 9780387765006 Издательство: Springer Рейтинг: Цена: 9345 р. Наличие на складе: Невозможна поставка.
Описание: Illustrated in color, this work offers the necessary instructions for successful hands-on application of this versatile materials characterization technique. It also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment.
Автор: Carter Название: Transmission Electron Microscopy ISBN: 3319266497 ISBN-13(EAN): 9783319266497 Издательство: Springer Рейтинг: Цена: 9349 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials ScienceTopics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.
Описание: This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduate level text in support of course materials in Materials Science, Physics or Chemistry departments.
Описание: This textbook develops the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms, wave interference, and the formation and analysis of diffraction patterns. It explains the uniqueness of each technique, especially imaging and spectroscopy in the TEM. Simple citations of rules are avoided as much as possible, and both practical and theoretical issues are explained in detail. The book can be used as both an introductory and advanced-level graduate text since sections/chapters are sorted according to difficulty and grouped for use in quarter and semester courses on TEM and XRD. Numerous problems are provided at the end of each chapter to reinforce key concepts, and solutions are available to instructors. Appendices provide procedures for introductory laboratory exercises, and up-to-date tabulations of physical data useful for TEM and XRD.
Автор: Williams Название: Transmission Electron Microscopy ISBN: 030645324X ISBN-13(EAN): 9780306453243 Издательство: Springer Рейтинг: Цена: 7013 р. Наличие на складе: Поставка под заказ.
Описание: This groundbreaking text provides the necessary instructions for hands-on application of this versatile materials characterization technique and is supported by over 600 illustrations and diagrams.
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