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X-Ray Diffraction, A Practical Approach, Suryanarayana, C., Norton, M. Grant



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Автор: Suryanarayana, C., Norton, M. Grant
Название:  X-Ray Diffraction, A Practical Approach   (Дифракция рентгеновских лучей, практическое руководство)
Издательство: Springer
Классификация:
Кристаллография
Материаловедение

ISBN: 030645744X
ISBN-13(EAN): 9780306457449
ISBN: 0-306-45744-X
ISBN-13(EAN): 978-0-306-45744-9
Обложка/Формат: Hardback
Страницы: 292
Вес: 1.3 кг.
Дата издания: 30.06.1998
Язык: ENG
Издание: 1998 ed.
Иллюстрации: Xiii, 273 p.
Размер: 24.43 x 16.21 x 2.24 cm
Читательская аудитория: Postgraduate, research & scholarly
Подзаголовок: A practical approach
Ссылка на Издательство: Link
Рейтинг:
Поставляется из: Германии
Описание: Combining both theoretical and practical aspects of x-ray diffraction, this book emphasizes a `hands on` approach through experiments and examples based on actual laboratory data. It presents the basics of x-ray diffraction and explains its use in obtaining structural and chemical information.



Fundamentals of powder diffraction and structural characterization of materials

Автор: Pecharsky, Vitalij K. Zavalij, Peter (materials Ce
Название: Fundamentals of powder diffraction and structural characterization of materials
ISBN: 0387095780 ISBN-13(EAN): 9780387095783
Издательство: Springer
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Цена: 8414 р.
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Описание: Offers an introduction to the theories and applications of the powder diffraction method for structure determination. This book emphasises on powder diffraction data collected using conventional x-ray sources, which remain primary tools for thousands of researchers and students in their daily experimental work.

The Basics of Crystallography and Diffraction

Автор: Hammond, Christopher
Название: The Basics of Crystallography and Diffraction
ISBN: 0199546452 ISBN-13(EAN): 9780199546459
Издательство: Oxford Academ
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Цена: 3117 р.
Наличие на складе: Поставка под заказ.

Описание: Crystallography and diffraction are widely used throughout science for studying structure. However, many students find these subjects difficult. The aim of this book is to show, through relevant examples and without relying on complex mathematics, that the basic ideas behind crystallography and diffraction are simple and easily comprehensible.

Diffraction Analysis of the Microstructure of Materials

Автор: Mittemeijer E.J., Scardi P.
Название: Diffraction Analysis of the Microstructure of Materials
ISBN: 3540405194 ISBN-13(EAN): 9783540405191
Издательство: Springer
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Цена: 21845 р.
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Описание: Diffraction Analysis of the Microstructure of Materials provides an overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.

Electron Diffraction Techniques : Vol 2

Название: Electron Diffraction Techniques : Vol 2
ISBN: 0198557337 ISBN-13(EAN): 9780198557333
Издательство: Oxford Academ
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Цена: 21337 р.
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Описание: Designed for all those embarking on research which involves electron diffraction methods in physics, chemistry and geology, this volume contains information on EM imaging and diffraction contrast, disorder and defect scattering, electronic diffraction effects and identification of unknowns.

Defect and Microstructure Analysis by Diffraction

Название: Defect and Microstructure Analysis by Diffraction
ISBN: 0198501897 ISBN-13(EAN): 9780198501893
Издательство: Oxford Academ
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Цена: 27842 р.
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Описание: Examines the state of the art for determining the "real" structure of matter. This book provides an analysis of the fundamental theory and techniques for microstructure analysis from diffraction patterns. It presents the principal characterization technique permitting us to measure the defect solid state: X-ray diffraction.

The Basics of Crystallography and Diffraction

Автор: Hammond, C.
Название: The Basics of Crystallography and Diffraction
ISBN: 0198505523 ISBN-13(EAN): 9780198505525
Издательство: Oxford Academ
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Цена: 4163 р.
Наличие на складе: Поставка под заказ.

Описание: Provides a comprehensive introduction to the topics of crystallography and diffraction for undergraduate and beginning graduate students and lecturers in physics, chemistry, materials and earth sciences. This book shows how crystal structures may be built up from simple ideas of atomic packing and co-ordination.

Structure Determination from Powder Diffraction Data

Название: Structure Determination from Powder Diffraction Data
ISBN: 0198500912 ISBN-13(EAN): 9780198500919
Издательство: Oxford Academ
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Цена: 18735 р.
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Описание: Our understanding of the properties of materials, from drugs and proteins to catalysts and ceramics, is almost always based on structural information. This book describes the developments in powder diffraction which make it possible for scientists to obtain such information. It is aimed at both novices and experienced practitioners.

Powder Diffraction / The Rietveld Method and the Two Stage Method to Determine and Refine Crystal Structures from Powder Diffraction Data

Автор: Will Georg
Название: Powder Diffraction / The Rietveld Method and the Two Stage Method to Determine and Refine Crystal Structures from Powder Diffraction Data
ISBN: 3540279857 ISBN-13(EAN): 9783540279853
Издательство: Springer
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Цена: 13107 р.
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Описание: Crystal structure analysis from powder diffraction data has attracted considerable and ever growing interest in the last decades. X-ray powder diffraction is best known for phase analysis (Hanawalt files) dating back to the 30s. In the late 60s the inherent potential of powder diffraction for crystallographic problems was realized and scientists developed methods for using powder diffraction data at first only for the refinement of crystal structures. With the development of ever growing computer power profile fitting and pattern decomposition allowed to extract individual intensities from overlapping diffraction peaks opening the way to many other applications, especially to ab initio structure determination. Powder diffraction today is used in X-ray and neutron diffraction, where it is a powerful method in neutron diffraction for the determination of magnetic structures. In the last decade the interest has dramatically improved. There is hardly any field of crystallography where the Rietveld, or full pattern method has not been tried with quantitative phase analysis the most important recent application.

P.P.Ewald and His Dynamical Theory of X-ray Diffraction: A Memorial Volume for Paul P.Ewald, 23 January 1888 - 22 August 1985

Название: P.P.Ewald and His Dynamical Theory of X-ray Diffraction: A Memorial Volume for Paul P.Ewald, 23 January 1888 - 22 August 1985
ISBN: 019855379X ISBN-13(EAN): 9780198553793
Издательство: Oxford Academ
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Цена: 5933 р.
Наличие на складе: Невозможна поставка.

Описание: A tribute to Paul Ewald, whose work "On the Foundations of Crystal Optics" has many modern applications. Contributions to this volume are both scientific and biographical, and five key papers by Ewald from 1913, 1968, 1969, 1979 and 1986 are included.

X-Ray Diffraction Crystallography

Автор: Waseda
Название: X-Ray Diffraction Crystallography
ISBN: 3642166342 ISBN-13(EAN): 9783642166341
Издательство: Springer
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Цена: 14959 р.
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Описание: X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.

Particle Scattering, X-Ray Diffraction, and Microstructure of Solids and Liquids

Автор: Ristig Manfred L., Gernoth Klaus A.
Название: Particle Scattering, X-Ray Diffraction, and Microstructure of Solids and Liquids
ISBN: 354044386X ISBN-13(EAN): 9783540443865
Издательство: Springer
Рейтинг:
Цена: 10485 р.
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Описание: Interesting and new specific results of current theoretical and experimental work in various fields at the frontier of particle scattering and X-ray diffraction are reviewed in this volume. Special emphasis is placed on the study of the microstructure of solids, crystals and liquids, both classically and quantum mechanically. This gives the reader essential insights into the dynamics and properties of these states of matter. The authors address students interested in the physics of quantum solids, crystallography and material science as well as physical chemistry and computational physics.

Three-Dimensional X-Ray Diffraction Microscopy / Mapping Polycrystals and their Dynamics

Автор: Poulsen Henning F.
Название: Three-Dimensional X-Ray Diffraction Microscopy / Mapping Polycrystals and their Dynamics
ISBN: 3540223304 ISBN-13(EAN): 9783540223306
Издательство: Springer
Рейтинг:
Цена: 17476 р.
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Описание: Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The position, morphology, phase, strain and crystallographic orientation of hundreds of grains or sub-grain embedded within mm-cm thick specimens can be determined simultaneously. Furthermore, the dynamics of the individual structural elements can be monitored during typical processes such as deformation or annealing. The book gives a comprehensive account of the methodology followed by a summary of selected applications. The method is presented from a mathematical/crystallographic point-of-view but with sufficient hands-on details to enable the reader to plan his or her own experiments. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.


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