Sample preparation handbook for transmission electron microscopy,
Автор: Spence, John C. H. Название: High-Resolution Electron Microscopy ISBN: 0199552754 ISBN-13(EAN): 9780199552757 Издательство: Oxford Academ Рейтинг: Цена: 5516 р. Наличие на складе: Поставка под заказ.
Описание: This book describes how to see atoms using electron microscopes. This new edition includes updated sections on applications and new uses of atomic-resolution transmission electron microscopy. Several new chapters and sources of software for image interpretation and electron-optical design have also been added.
Описание: In the past ten years there has been a tremendous surge in applications of cryo-electron microscopy in the study of macromolecular assemblies, in especially those in single-particle form. Although the path toward atomic resolution is much more tedious than in electron crystallography of two-dimensional crystals, realization of such resolution for entirely asymmetrical molecules is now in close reach. In Three-Dimensional Electron Microscopy of Macromolecular Assemblies: Visualization of Biological Molecules in Their Native State, Joachim Frank describes the mathematical principles and working methods of single-particle reconstruction--a method designed to retrieve structural information from electron micrographs showing many "copies" of molecules trapped in ice in random orientations. The technique is uniquely suited to obtain three-dimensional images of molecular machines in different functional states, as it does not require crystals. This revised edition includes a basic introduction to transmission electron microscopy and the design of the instruments, and it covers specimen preparation in greater depth. Frank addresses the remarkable convergence of processing methods that has taken place, making it possible to sharpen the focus of some sections. New sections have been added that cover segmentation as well as various techniques of docking and fitting. Finally, appendix material is now included; this tabulates applications and methods of single-particle reconstruction and describes the most important mathematical tools and theorems of Fourier processing.
Описание: The book will address various aspects of the topic in six chapters. Chapter 1 will contain background information and a comprehensive list of applications, in order to provide the reader with a rich survey of the available literature for further reading. Chapter 2 will briefly review the basic scientific principles of signal formation and detection in a gaseous environment. However, the aim is to provide a practical overview, rather than detailed discussion, and so the reader will necessarily be referred to appropriate sources in the literature should they wish to gain a deeper understanding of the inherent physics and chemistry. Chapter 3 will cover the principles of specimen stability as a function of water vapour pressure and/or temperature. The topics in Chapters 2 and 3 will set the scene for the main thrust of this volume, which is the application of VPSEM to performing practical work. Chapter 4 caters for those perhaps more interested in physical sciences and advanced materials applications and related industries. Chapter 5 is likely to be more relevant to those in the life sciences and manufacturing industries such as foods and personal care products. Inevitably, there will be an element of inter-disciplinarity in both of these chapters. Chapter 6 concludes the book with a survey ofin situ experiments such as: tensile testing, ice crystallization, freezing of solutions, oxidation and reduction, phase transformations and wetting of surfaces.
Описание: Specimens range from inorganic, organic, biological, and geological samples to materials such as metals, polymers, and semiconductors which can exist as solids, liquids, and gases. This title describes what is needed up to the point the sample is put into the instrument. It is suitable for those who use these instruments.
Описание: Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.
Автор: David B. Williams; C. Barry Carter Название: Transmission Electron Microscopy ISBN: 038776500X ISBN-13(EAN): 9780387765006 Издательство: Springer Рейтинг: Цена: 9345 р. Наличие на складе: Невозможна поставка.
Описание: Illustrated in color, this work offers the necessary instructions for successful hands-on application of this versatile materials characterization technique. It also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment.
Описание: This book covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. Emphasis is on the experimental and computational methods used to quantify and analyze CTEM observations. A supplementary website containing interactive modules and free Fortran source code accompanies the text. The book starts with the basics of crystallography and quantum mechanics providing a sound mathematical footing for the rest of the text. The next section deals with the microscope itself, describing the various components in terms of the underlying theory. The second half of the book focuses on the dynamical theory of electron scattering in solids including its applications to perfect and defective crystals, electron diffraction and phase contrast techniques. Based on a lecture course given by the author in the Department of Materials Science and Engineering at Carnegie Mellon University, the book is ideal for graduate students as well as researchers new to the field.
Автор: David B. Williams; C. Barry Carter Название: Transmission Electron Microscopy ISBN: 0387765026 ISBN-13(EAN): 9780387765020 Издательство: Springer Рейтинг: Цена: 6540 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This groundbreaking text has been established as the market leader throughout the world. Profusely illustrated, "Transmission Electron Microscopy: A
Textbook for Materials Science" provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. For this first new edition in
12 years, many sections have been completely rewritten with all others revised and updated.
The new edition also includes an extensive collection of questions for the
student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment. Four-color illustrations throughout also enhance the
new edition. Praise for the first edition: 'The best textbook for this audience available' - "American Scientist".
'Ideally suited to the needs of a graduate level course. It is hard
to imagine this book not fulfilling most of the requirements of a text for such a course' - "Microscope". 'This book is written in such a comprehensive manner that it is understandable to
all people who are trained in physical science and it will be useful both for the expert as well as the student' - "Micron".
'The book answers nearly any question - be it
instrumental, practical, or theoretical - either directl
or with an appropriate reference...This book provides a basic, clear-cut presentation of how transmission electron microscopes should be used and of how this depends specifically on
one's specific undergoing project' - "MRS Bulletin, May 1998". 'The only complete text now available which includes all the remarkable advances made in the field of TEM in the past
30-40 years...The authors can be proud of an enormous task, very well done' - from the Foreword by Professor Gareth Thomas, University of California, Berkeley.
Описание: Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.
Автор: Reimer, Ludwig Kohl, Helmut Название: Transmission electron microscopy ISBN: 0387400931 ISBN-13(EAN): 9780387400938 Издательство: Springer Рейтинг: Цена: 14492 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Features the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. This work describes the principles of particle and wave optics of electrons. It discusses the electron-specimen interactions for evaluating the theory of scattering and phase contrast.
Автор: Pennycook Название: Scanning Transmission Electron Microscopy ISBN: 1441971998 ISBN-13(EAN): 9781441971999 Издательство: Springer Рейтинг: Цена: 14492 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.
Автор: Carter Название: Transmission Electron Microscopy ISBN: 3319266497 ISBN-13(EAN): 9783319266497 Издательство: Springer Рейтинг: Цена: 9349 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials ScienceTopics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.
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