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Sample preparation handbook for transmission electron microscopy, 



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Цена: 13107р.
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Название:  Sample preparation handbook for transmission electron microscopy
Издательство: Springer
Классификация:
Научное оборудование и методы, лабораторное оборудование

ISBN: 0387981810
ISBN-13(EAN): 9780387981819
ISBN: 0-387-98181-0
ISBN-13(EAN): 978-0-387-98181-9
Обложка/Формат: Hardback
Страницы: 272
Вес: 0.566 кг.
Дата издания: 01.05.2010
Язык: ENG
Иллюстрации: 195 black & white illustrations, 20 black & white tables
Размер: 23.62 x 16.00 x 2.03 cm
Читательская аудитория: Professional & vocational
Ссылка на Издательство: Link
Рейтинг:
Поставляется из: Германии
Описание: This guide is divided into two sections. The first covers theoretical and practical aspects, including the best preparative technique. The second part offers technical hints, including twenty-two detailed protocols for preparing thin slices for TEM analysis.



Electron Microscopy of Polymers

Автор: Michler G.H.
Название: Electron Microscopy of Polymers
ISBN: 3540363505 ISBN-13(EAN): 9783540363507
Издательство: Springer
Рейтинг:
Цена: 13107 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: There are many books on electron microscopy, however, the study of polymers by EM needs special techniques, precautions and preparation methods, including ultramicrotomy. General characteristics of the different techniques of EM, including scanning force microscopy (AFM), are given. Application of these techniques to study morphology and also properties, particularly micromechanical properties, is described in detail. Examples from all classes of polymers are presented.

Scanning Electron Microscopy and X-ray Microanalysis

Автор: Goldstein
Название: Scanning Electron Microscopy and X-ray Microanalysis
ISBN: 0306472929 ISBN-13(EAN): 9780306472923
Издательство: Springer
Рейтинг:
Цена: 9349 р.
Наличие на складе: Поставка под заказ.

Описание: Intended for students, as well as practitioners, this text offers an introduction to the field of Scanning Electron Microscopy (SEM) and X-ray microanalysis. It discusses topics such as user-controlled functions of scanning electron microscopes, the characteristics of electron beam, the use of x-rays for qualitative analysis, and more.

High Energy Electron Diffraction and Microscopy

Автор: Peng, L.M.; Dudarev, S.L.; Whelan, M.J.
Название: High Energy Electron Diffraction and Microscopy
ISBN: 0198500742 ISBN-13(EAN): 9780198500742
Издательство: Oxford Academ
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Цена: 13791 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Offers a treatment of the theoretical background relevant to an understanding of materials, obtained by using high-energy electron diffraction and microscopy. Dynamical diffraction in transmission and reflection geometries is treated using a general matrix theory, where computer programs and worked examples are provided to illustrate the concepts.

High-Resolution Electron Microscopy

Автор: Spence, John C. H.
Название: High-Resolution Electron Microscopy
ISBN: 0199552754 ISBN-13(EAN): 9780199552757
Издательство: Oxford Academ
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Цена: 5516 р.
Наличие на складе: Поставка под заказ.

Описание: This book describes how to see atoms using electron microscopes. This new edition includes updated sections on applications and new uses of atomic-resolution transmission electron microscopy. Several new chapters and sources of software for image interpretation and electron-optical design have also been added.

Three-dimensional electron microscopy of macromolecular assemblies

Автор: Frank, Joachim
Название: Three-dimensional electron microscopy of macromolecular assemblies
ISBN: 0195182189 ISBN-13(EAN): 9780195182187
Издательство: Oxford Academ
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Цена: 11709 р.
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Описание: In the past ten years there has been a tremendous surge in applications of cryo-electron microscopy in the study of macromolecular assemblies, in especially those in single-particle form. Although the path toward atomic resolution is much more tedious than in electron crystallography of two-dimensional crystals, realization of such resolution for entirely asymmetrical molecules is now in close reach. In Three-Dimensional Electron Microscopy of Macromolecular Assemblies: Visualization of Biological Molecules in Their Native State, Joachim Frank describes the mathematical principles and working methods of single-particle reconstruction--a method designed to retrieve structural information from electron micrographs showing many "copies" of molecules trapped in ice in random orientations. The technique is uniquely suited to obtain three-dimensional images of molecular machines in different functional states, as it does not require crystals. This revised edition includes a basic introduction to transmission electron microscopy and the design of the instruments, and it covers specimen preparation in greater depth. Frank addresses the remarkable convergence of processing methods that has taken place, making it possible to sharpen the focus of some sections. New sections have been added that cover segmentation as well as various techniques of docking and fitting. Finally, appendix material is now included; this tabulates applications and methods of single-particle reconstruction and describes the most important mathematical tools and theorems of Fourier processing.

Cellular Electron Microscopy,79

Автор: J. Richard McIntosh
Название: Cellular Electron Microscopy,79
ISBN: 0123706475 ISBN-13(EAN): 9780123706478
Издательство: Elsevier Science
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Цена: 13371 р.
Наличие на складе: Поставка под заказ.

Описание: Recent advances in the imaging technique electron microscopy (EM) have improved the method, making it more reliable and rewarding, particularly in its description of three-dimensional detail. Cellular Electron Microscopy will help biologists from many disciplines understand modern EM and the value it might bring to their own work. The book’s five sections deal with all major issues in EM of cells: specimen preparation, imaging in 3-D, imaging and understanding frozen-hydrated samples, labeling macromolecules, and analyzing EM data. Each chapter was written by scientists who are among the best in their field, and some chapters provide multiple points of view on the issues they discuss. Each section of the book is preceded by an introduction, which should help newcomers understand the subject. The book shows why many biologists believe that modern EM will forge the link between light microscopy of live cells and atomic resolution studies of isolated macromolecules, helping us toward the goal of an atomic resolution understanding of living systems.

Electron Microprobe Analysis and Scanning Electron Microscopy in Geology

Автор: Reed
Название: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
ISBN: 052114230X ISBN-13(EAN): 9780521142304
Издательство: Cambridge Academ
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Цена: 3642 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

Principles and Practice of Variable Pressure: Environmental Scanning Electron Microscopy (VP-ESEM)

Автор: Stokes
Название: Principles and Practice of Variable Pressure: Environmental Scanning Electron Microscopy (VP-ESEM)
ISBN: 0470065400 ISBN-13(EAN): 9780470065402
Издательство: Wiley
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Цена: 6531 р.
Наличие на складе: Поставка под заказ.

Описание: The book will address various aspects of the topic in six chapters. Chapter 1 will contain background information and a comprehensive list of applications, in order to provide the reader with a rich survey of the available literature for further reading. Chapter 2 will briefly review the basic scientific principles of signal formation and detection in a gaseous environment. However, the aim is to provide a practical overview, rather than detailed discussion, and so the reader will necessarily be referred to appropriate sources in the literature should they wish to gain a deeper understanding of the inherent physics and chemistry. Chapter 3 will cover the principles of specimen stability as a function of water vapour pressure and/or temperature. The topics in Chapters 2 and 3 will set the scene for the main thrust of this volume, which is the application of VPSEM to performing practical work. Chapter 4 caters for those perhaps more interested in physical sciences and advanced materials applications and related industries. Chapter 5 is likely to be more relevant to those in the life sciences and manufacturing industries such as foods and personal care products. Inevitably, there will be an element of inter-disciplinarity in both of these chapters. Chapter 6 concludes the book with a survey ofin situ experiments such as: tensile testing, ice crystallization, freezing of solutions, oxidation and reduction, phase transformations and wetting of surfaces.

Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

Автор: Patrick Echlin
Название: Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
ISBN: 0387857303 ISBN-13(EAN): 9780387857305
Издательство: Springer
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Цена: 9817 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Specimens range from inorganic, organic, biological, and geological samples to materials such as metals, polymers, and semiconductors which can exist as solids, liquids, and gases. This title describes what is needed up to the point the sample is put into the instrument. It is suitable for those who use these instruments.

Transmission Electron Microscopy

Автор: David B. Williams; C. Barry Carter
Название: Transmission Electron Microscopy
ISBN: 0387765026 ISBN-13(EAN): 9780387765020
Издательство: Springer
Рейтинг:
Цена: 6540 р.
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Описание: This groundbreaking text has been established as the market leader throughout the world. Profusely illustrated, "Transmission Electron Microscopy: A Textbook for Materials Science" provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. For this first new edition in 12 years, many sections have been completely rewritten with all others revised and updated.

The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment. Four-color illustrations throughout also enhance the new edition. Praise for the first edition: 'The best textbook for this audience available' - "American Scientist".

'Ideally suited to the needs of a graduate level course. It is hard to imagine this book not fulfilling most of the requirements of a text for such a course' - "Microscope". 'This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student' - "Micron".

'The book answers nearly any question - be it instrumental, practical, or theoretical - either directl or with an appropriate reference...This book provides a basic, clear-cut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project' - "MRS Bulletin, May 1998". 'The only complete text now available which includes all the remarkable advances made in the field of TEM in the past 30-40 years...The authors can be proud of an enormous task, very well done' - from the Foreword by Professor Gareth Thomas, University of California, Berkeley.

Scanning Transmission Electron Microscopy

Автор: Pennycook
Название: Scanning Transmission Electron Microscopy
ISBN: 1441971998 ISBN-13(EAN): 9781441971999
Издательство: Springer
Рейтинг:
Цена: 14492 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

Transmission Electron Microscopy

Автор: David B. Williams; C. Barry Carter
Название: Transmission Electron Microscopy
ISBN: 038776500X ISBN-13(EAN): 9780387765006
Издательство: Springer
Рейтинг:
Цена: 9345 р.
Наличие на складе: Невозможна поставка.

Описание: Illustrated in color, this work offers the necessary instructions for successful hands-on application of this versatile materials characterization technique. It also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment.


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