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Advances in Imaging and Electron Physics,159, Peter W. Hawkes


Варианты приобретения
Цена: 18700р.
Кол-во:
Наличие: Поставка под заказ.  Есть в наличии на складе поставщика.
Склад Англия: 895 шт.  Склад Америка: 123 шт.  
При оформлении заказа до: 7 фев 2020
Ориентировочная дата поставки: середина Марта

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Автор: Peter W. Hawkes
Название:  Advances in Imaging and Electron Physics,159
Издательство: Elsevier Science
Классификация:
Научное оборудование и методы, лабораторное оборудование
Прикладная физика и специальные разделы

ISBN: 0123749867
ISBN-13(EAN): 9780123749864
ISBN: 0-12-374986-7
ISBN-13(EAN): 978-0-12-374986-4
Обложка/Формат: Hardback
Страницы: 320
Вес: 0.8 кг.
Дата издания: 30.11.2009
Серия: Advances in imaging and electron physics
Язык: ENG
Иллюстрации: Illustrations
Размер: 22.86 x 15.75 x 3.30 cm
Читательская аудитория: Postgraduate, research & scholarly
Подзаголовок: The scanning transmission electron microscope
Ссылка на Издательство: Link
Рейтинг:
Поставляется из: Англии
Описание: Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This particular volume presents several timely articles on the scanning transmission electron microscope.
Дополнительное описание:




Advances in Imaging and Electron Physics, Volume 200 1st edition

Автор: Hawkes, Peter W.
Название: Advances in Imaging and Electron Physics, Volume 200 1st edition
ISBN: 0128120908 ISBN-13(EAN): 9780128120903
Издательство: Elsevier Science
Рейтинг:
Цена: 14727 р. 16363.00 -10%
Наличие на складе: Поставка под заказ.

Описание: Advances in Imaging and Electron Physics, Volume 200, the latest release in a series that merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and computing methods. Topics in this latest release include Past and Present Attempts to Attain the Resolution Limit of the Transmission Electron Microscope, Phase Plates for Transmission Electron Microscopy, and X-Ray Lasers in Biology: Structure and Dynamics.

Advances in Chemical Physics, Volume 159

Автор: Paul Brumer
Название: Advances in Chemical Physics, Volume 159
ISBN: 111909626X ISBN-13(EAN): 9781119096269
Издательство: Wiley
Рейтинг:
Цена: 16093 р.
Наличие на складе: Поставка под заказ.

Advances in Imaging and Electron Physics,172

Автор: Ted Cremer
Название: Advances in Imaging and Electron Physics,172
ISBN: 0123944228 ISBN-13(EAN): 9780123944221
Издательство: Elsevier Science
Рейтинг:
Цена: 15568 р. 17298.00 -10%
Наличие на складе: Поставка под заказ.

Описание: This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application.

Advances in Imaging and Electron Physics,189

Автор: Peter W. Hawkes
Название: Advances in Imaging and Electron Physics,189
ISBN: 012802254X ISBN-13(EAN): 9780128022542
Издательство: Elsevier Science
Рейтинг:
Цена: 14727 р. 16363.00 -10%
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Advances in Imaging and Electron Physics,167

Автор: Peter W. Hawkes
Название: Advances in Imaging and Electron Physics,167
ISBN: 0123859859 ISBN-13(EAN): 9780123859853
Издательство: Elsevier Science
Рейтинг:
Цена: 18700 р.
Наличие на складе: Невозможна поставка.

Описание: Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Advances in Imaging and Electron Physics,176

Автор: Peter W. Hawkes
Название: Advances in Imaging and Electron Physics,176
ISBN: 0124081428 ISBN-13(EAN): 9780124081420
Издательство: Elsevier Science
Рейтинг:
Цена: 17298 р.
Наличие на складе: Невозможна поставка.

Описание: Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Advances in Imaging and Electron Physics,181

Автор: Peter W. Hawkes
Название: Advances in Imaging and Electron Physics,181
ISBN: 0128000910 ISBN-13(EAN): 9780128000915
Издательство: Elsevier Science
Рейтинг:
Цена: 17298 р.
Наличие на складе: Невозможна поставка.

Описание: Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Advances in Imaging and Electron Physics,171

Автор: Peter W. Hawkes
Название: Advances in Imaging and Electron Physics,171
ISBN: 0123942977 ISBN-13(EAN): 9780123942975
Издательство: Elsevier Science
Рейтинг:
Цена: 17298 р.
Наличие на складе: Невозможна поставка.

Описание: Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Advances in Imaging and Electron Physics,190

Автор: Peter W. Hawkes
Название: Advances in Imaging and Electron Physics,190
ISBN: 0128023805 ISBN-13(EAN): 9780128023808
Издательство: Elsevier Science
Рейтинг:
Цена: 14727 р. 16363.00 -10%
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Advances in Imaging and Electron Physics,196

Автор: Hawkes, Peter W.
Название: Advances in Imaging and Electron Physics,196
ISBN: 0128048123 ISBN-13(EAN): 9780128048122
Издательство: Elsevier Science
Рейтинг:
Цена: 14727 р. 16363.00 -10%
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Advances in Imaging and Electron Physics,199

Автор: Hawkes, Peter W.
Название: Advances in Imaging and Electron Physics,199
ISBN: 0128120916 ISBN-13(EAN): 9780128120910
Издательство: Elsevier Science
Рейтинг:
Цена: 14727 р. 16363.00 -10%
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Advances in Imaging and Electron Physics, Volume 199, the latest release in a series that merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy features extended articles on the physics of electron devices (especially semiconductor devices). Specific topics include discussions on Micro-XRF in scanning electron microscopes, and an interesting take on the variational approach for simulation of equilibrium ion distributions in ion traps regarding Coulomb interaction, amongst others. Users will find a comprehensive resource on the most important aspects of particle optics at high and low energies, microlithography, image science and digital image processing. In addition, topics of interest, including electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains are presented and discussed.

Advances in Imaging and Electron Physics,173

Автор: Ted Cremer
Название: Advances in Imaging and Electron Physics,173
ISBN: 0123969697 ISBN-13(EAN): 9780123969699
Издательство: Elsevier Science
Рейтинг:
Цена: 15568 р. 17298.00 -10%
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application.


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