Описание: * The first book to cover all engineering aspects of microwave communication path design for the digital age. * Up-to-date, real world applications of the latest research in microwave propagation. * The author, George Kizer, has more than 30 years experience in solving systems level microwave engineering problems.
Автор: Thomas H. Lee Название: Planar Microwave Engineering ISBN: 0521835267 ISBN-13(EAN): 9780521835268 Издательство: Cambridge Academ Рейтинг: Цена: 16474.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This insightful book contains a wealth of circuit layouts, design tips, and practical measurement techniques for building and testing practical RF and microwave systems. The book is packed with indispensable information for students taking courses on RF or microwave circuits and for practising engineers.
Автор: Koechner Walter Название: Solid-State Laser Engineering ISBN: 038729094X ISBN-13(EAN): 9780387290942 Издательство: Springer Рейтинг: Цена: 27950.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Written from an industrial perspective, Solid-State Laser Engineering discusses in detail the characteristics, design, construction, and performance of solid-state lasers. Emphasis is placed on engineering and practical considerations; phenomenological aspects using models are preferred to abstract mathematical derivations. Since its first edition almost 30 years ago this book has become the standard in the field of solid-state lasers for scientists,engineers and graduate students.This new edition has been extensively revised and updated to account for recent developments in the areas of diode-laser pumping, laser materials and nonlinear crystals. Completely new sections have been added dealing with frequency control, the theory of mode-locking, femto second lasers, high efficiency harmonic generation, passive and acousto-optic Q-switching, semiconductor saturable absorber mirrors (SESAM) and peridically poled nonlinear crystals.
Описание: Explains the interactions between the device-under-test (DUT) and the measuring equipment by demonstrating the best practices for ascertaining the true nature of the DUT, and optimizing the time to set up and measure
Описание: This text examines the characteristics and functions of microwave engineering on the nano-scale level. It addresses a variety of topics relating to industrial purposes, including miniaturization, function densification, 1D and 2D nanostructures, and their atomic structures.
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