Автор: Sascha Sadewasser; Thilo Glatzel Название: Kelvin Probe Force Microscopy ISBN: 3642271138 ISBN-13(EAN): 9783642271137 Издательство: Springer Рейтинг: Цена: 16977.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This volume presents a concise introduction to Kelvin probe force microscopy. The text discusses potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials.
Автор: Baptiste Gault; Michael P. Moody; Julie M. Cairney Название: Atom Probe Microscopy ISBN: 1489989390 ISBN-13(EAN): 9781489989390 Издательство: Springer Рейтинг: Цена: 20962.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book covers all facets of atom probe microscopy-including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography. Atom Probe Microscopy is aimed at researchers of all experience levels.
Автор: Williams Lefebvre Название: Atom Probe Tomography ISBN: 0128046473 ISBN-13(EAN): 9780128046470 Издательство: Elsevier Science Рейтинг: Цена: 22401.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining algorithms.
For those more experienced in the technique, this book will serve as a single comprehensive source of indispensable reference information, tables, and techniques. Both beginner and expert will value the way the book is set out in the context of materials science and engineering. In addition, its references to key research outcomes based upon the training program held at the University of Rouen-one of the leading scientific research centers exploring the various aspects of the instrument-will further enhance understanding and the learning process.
Provides an introduction to the capabilities and limitations of atom probe tomography when analyzing materials
Written for both experienced researchers and new users
Includes exercises, along with corrections, for users to practice the techniques discussed
Contains coverage of more advanced and less widespread techniques, such as correlative APT and STEM microscopy
Описание: Contains the proceedings of the third Atomic Force Microscopy/Scanning Tunneling Microscopy symposium, which was held to provide an interface between scientists, engineers, representatives of industry, government, and academia, all of whom have a common interest in probe microscopies.
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