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Aberration-corrected imaging in transmission electron microscopy, Erni, Rolf


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Цена: 9350р.
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Автор: Erni, Rolf
Название:  Aberration-corrected imaging in transmission electron microscopy
Издательство: World Scientific Publishing
Классификация:
Научное оборудование и методы, лабораторное оборудование

ISBN: 1848165366
ISBN-13(EAN): 9781848165366
ISBN: 1-84816-536-6
ISBN-13(EAN): 978-1-84816-536-6
Обложка/Формат: Hardback
Страницы: 320
Вес: 0.768 кг.
Дата издания: 26.10.2010
Язык: ENG
Иллюстрации: Illustrations
Размер: 249 x 168 x 20
Читательская аудитория: Postgraduate, research & scholarly
Подзаголовок: An introduction
Рейтинг:
Поставляется из: Англии
Описание: Presents an introduction to practical aspects of atomic-resolution imaging in aberration-corrected electron microscopy. This book addresses advances in electron optical instrumentation used for ultra-high resolution imaging in materials and nano-science.
Дополнительное описание:




Progress in Transmission Electron Microscopy 1 / Concepts and Techniques

Автор: Zhang Xiao-Feng, Zhang Ze
Название: Progress in Transmission Electron Microscopy 1 / Concepts and Techniques
ISBN: 3540676805 ISBN-13(EAN): 9783540676805
Издательство: Springer
Рейтинг:
Цена: 20477 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.

Transmission Electron Microscopy

Автор: Williams
Название: Transmission Electron Microscopy
ISBN: 030645324X ISBN-13(EAN): 9780306453243
Издательство: Springer
Рейтинг:
Цена: 7013 р.
Наличие на складе: Поставка под заказ.

Описание: This groundbreaking text provides the necessary instructions for hands-on application of this versatile materials characterization technique and is supported by over 600 illustrations and diagrams.

Aberration-Corrected Imaging In Transmission Electron Microscopy: An Introduction (2Nd Edition)

Автор: Erni Rolf
Название: Aberration-Corrected Imaging In Transmission Electron Microscopy: An Introduction (2Nd Edition)
ISBN: 1783265280 ISBN-13(EAN): 9781783265282
Издательство: World Scientific Publishing
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Цена: 11050 р.
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Описание: Aberration-Corrected Imaging In Transmission Electron Microscopy Provides An Introduction To Aberration-Corrected Atomic-Resolution Electron Microscopy Imaging In Materials And Physical Sciences. It Covers Both The Broad Beam Transmission Mode (Tem; Transmission Electron Microscopy) And The Scanning Transmission Mode (Stem; Scanning Transmission Electron Microscopy). The Book Is Structured In Three Parts. The First Part Introduces The Basics Of Conventional Atomic-Resolution Electron Microscopy Imaging In Tem And Stem Modes. This Part Also Describes Limits Of Conventional Electron Microscopes And Possible Artefacts Which Are Caused By The Intrinsic Lens Aberrations That Are Unavoidable In Such Instruments. The Second Part Introduces Fundamental Electron Optical Concepts And Thus Provides A Brief Introduction To Electron Optics. Based On The First And Second Parts Of The Book, The Third Part Focuses On Aberration Correction; It Describes The Various Aberrations In Electron Microscopy And Introduces The Concepts Of Spherical Aberration Correctors And Advanced Aberration Correctors, Including Correctors For Chromatic Aberration. This Part Also Provides Guidelines On How To Optimize The Imaging Conditions For Atomic-Resolution Stem And Tem Imaging.This Second Edition Has Been Completely Revised And Updated In Order To Incorporate The Very Recent Technological And Scientific Achievements That Have Been Realized Since The First Edition Appeared In 2010.

Aberration-corrected analytical electron microscopy

Автор: Brydson, Rik
Название: Aberration-corrected analytical electron microscopy
ISBN: 0470518510 ISBN-13(EAN): 9780470518519
Издательство: Wiley
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Цена: 5199 р.
Наличие на складе: Нет в наличии.

Описание: The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology.

Sample preparation handbook for transmission electron microscopy

Название: Sample preparation handbook for transmission electron microscopy
ISBN: 0387981810 ISBN-13(EAN): 9780387981819
Издательство: Springer
Рейтинг:
Цена: 13107 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: This guide is divided into two sections. The first covers theoretical and practical aspects, including the best preparative technique. The second part offers technical hints, including twenty-two detailed protocols for preparing thin slices for TEM analysis.

Sample preparation handbook for transmission electron microscopy

Название: Sample preparation handbook for transmission electron microscopy
ISBN: 1441959742 ISBN-13(EAN): 9781441959744
Издательство: Springer
Рейтинг:
Цена: 14854 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: This is the second in a two-volume handbook on sample preparation for the transmission electron microscope. It describes 14 different preparation techniques, including 22 detailed protocols for preparing thin slices for TEM analysis.

Scanning Transmission Electron Microscopy

Автор: Pennycook
Название: Scanning Transmission Electron Microscopy
ISBN: 1441971998 ISBN-13(EAN): 9781441971999
Издательство: Springer
Рейтинг:
Цена: 14492 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

Introduction to Conventional Transmission Electron Microscopy

Автор: De Graef
Название: Introduction to Conventional Transmission Electron Microscopy
ISBN: 0521620066 ISBN-13(EAN): 9780521620062
Издательство: Cambridge Academ
Рейтинг:
Цена: 15716 р.
Наличие на складе: Невозможна поставка.

Описание: Graduate level textbook covering the fundamentals of conventional transmission electron microscopy.

Transmission electron microscopy

Автор: Reimer, Ludwig Kohl, Helmut
Название: Transmission electron microscopy
ISBN: 0387400931 ISBN-13(EAN): 9780387400938
Издательство: Springer
Рейтинг:
Цена: 14492 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Features the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. This work describes the principles of particle and wave optics of electrons. It discusses the electron-specimen interactions for evaluating the theory of scattering and phase contrast.

Progress in Transmission Electron Microscopy 2 / Applications in Materials Science

Автор: Zhang Xiao-Feng, Zhang Ze
Название: Progress in Transmission Electron Microscopy 2 / Applications in Materials Science
ISBN: 3540676813 ISBN-13(EAN): 9783540676812
Издательство: Springer
Рейтинг:
Цена: 15427 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.

Sample Preparation Handbook for Transmission Electron Microscopy

Автор: Jeanne Ayache; Luc Beaunier; Jacqueline Boumendil;
Название: Sample Preparation Handbook for Transmission Electron Microscopy
ISBN: 1489998853 ISBN-13(EAN): 9781489998859
Издательство: Springer
Рейтинг:
Цена: 12233 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: This is the second in a two-volume handbook on sample preparation for the transmission electron microscope. It describes 14 different preparation techniques, including 22 detailed protocols for preparing thin slices for TEM analysis.

Handbook of Transmission Electron Microscopy

Автор: Page Lisa
Название: Handbook of Transmission Electron Microscopy
ISBN: 1632382830 ISBN-13(EAN): 9781632382832
Издательство: Неизвестно
Цена: 14100 р.
Наличие на складе: Есть у поставщика Поставка под заказ.


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