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High-resolution Electron Microscopy, Spence John C H


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Автор: Spence John C H
Название:  High-resolution Electron Microscopy
Издательство: Oxford Academ
Классификация:
Научное оборудование и методы, лабораторное оборудование
Физика конденсированного состояния (жидкости и тв.тела)
Кристаллография
Инструменты и приборное оборудование
Материаловедение

ISBN: 0199668639
ISBN-13(EAN): 9780199668632
ISBN: 0-19-966863-9
ISBN-13(EAN): 978-0-19-966863-2
Обложка/Формат: Hardback
Страницы: 440
Вес: 1.028 кг.
Дата издания: 12.09.2013
Язык: ENG
Издание: 4 rev ed
Иллюстрации: 163 b/w illustrations, 4 colour plates
Размер: 223 X 144 X 24
Читательская аудитория: Professional & vocational
Ссылка на Издательство: Link
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Поставляется из: Англии
Описание: This book gives the basic theoretical background needed to understand how electron microscopes allow us to see atoms, together with highly practical advice for electron microscope operators. It covers the usefulness of seeing atoms in the semiconductor industry, in materials science, in condensed matter physics, and in biology.



Electron Microscopy of Polymers

Автор: Michler G.H.
Название: Electron Microscopy of Polymers
ISBN: 3540363505 ISBN-13(EAN): 9783540363507
Издательство: Springer
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Цена: 13107 р.
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Описание: There are many books on electron microscopy, however, the study of polymers by EM needs special techniques, precautions and preparation methods, including ultramicrotomy. General characteristics of the different techniques of EM, including scanning force microscopy (AFM), are given. Application of these techniques to study morphology and also properties, particularly micromechanical properties, is described in detail. Examples from all classes of polymers are presented.

Physical Principles of Electron Microscopy

Автор: Egerton
Название: Physical Principles of Electron Microscopy
ISBN: 0387258000 ISBN-13(EAN): 9780387258003
Издательство: Springer
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Цена: 12233 р.
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Описание: Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.

Transmission Electron Microscopy

Автор: David B. Williams; C. Barry Carter
Название: Transmission Electron Microscopy
ISBN: 038776500X ISBN-13(EAN): 9780387765006
Издательство: Springer
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Цена: 9345 р.
Наличие на складе: Невозможна поставка.

Описание: Illustrated in color, this work offers the necessary instructions for successful hands-on application of this versatile materials characterization technique. It also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment.

Introduction to Conventional Transmission Electron Microscopy

Автор: De Graef
Название: Introduction to Conventional Transmission Electron Microscopy
ISBN: 0521620066 ISBN-13(EAN): 9780521620062
Издательство: Cambridge Academ
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Цена: 15716 р.
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Описание: Graduate level textbook covering the fundamentals of conventional transmission electron microscopy.

Advanced Computing in Electron Microscopy

Автор: Kirkland
Название: Advanced Computing in Electron Microscopy
ISBN: 1441965327 ISBN-13(EAN): 9781441965325
Издательство: Springer
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Цена: 12233 р.
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Описание: This review of numerical computation methods in high resolution conventional and scanning transmission electron microscope images shows how image calculations help separate information from artifact. Updated with instrumental developments and new references.

Sample Preparation Handbook for Transmission Electron Microscopy

Автор: Ayache
Название: Sample Preparation Handbook for Transmission Electron Microscopy
ISBN: 1441960872 ISBN-13(EAN): 9781441960870
Издательство: Springer
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Цена: 14854 р.
Наличие на складе: Поставка под заказ.

Описание: This handbook is divided into two sections. The first covers theoretical and practical aspects, including the best preparative technique. The second part offers technical hints, including twenty-two detailed protocols for preparing thin slices for TEM analysis.

Sample preparation handbook for transmission electron microscopy

Название: Sample preparation handbook for transmission electron microscopy
ISBN: 0387981810 ISBN-13(EAN): 9780387981819
Издательство: Springer
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Цена: 13107 р.
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Описание: This guide is divided into two sections. The first covers theoretical and practical aspects, including the best preparative technique. The second part offers technical hints, including twenty-two detailed protocols for preparing thin slices for TEM analysis.

Characterization of High Tc Materials and Devices by Electron Microscopy

Автор: Browning
Название: Characterization of High Tc Materials and Devices by Electron Microscopy
ISBN: 052155490X ISBN-13(EAN): 9780521554909
Издательство: Cambridge Academ
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Цена: 10720 р.
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Описание: A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors.

In-situ electron microscopy at high resolution

Название: In-situ electron microscopy at high resolution
ISBN: 9812797335 ISBN-13(EAN): 9789812797339
Издательство: World Scientific Publishing
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Цена: 14936 р.
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Описание: Reviews various techniques and achievements of in-situ high-resolution electron microscopy. This book also demonstrates the applications in several fields of materials science.

Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

Автор: Patrick Echlin
Название: Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
ISBN: 0387857303 ISBN-13(EAN): 9780387857305
Издательство: Springer
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Цена: 9817 р.
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Описание: Specimens range from inorganic, organic, biological, and geological samples to materials such as metals, polymers, and semiconductors which can exist as solids, liquids, and gases. This title describes what is needed up to the point the sample is put into the instrument. It is suitable for those who use these instruments.

Progress in Transmission Electron Microscopy 1 / Concepts and Techniques

Автор: Zhang Xiao-Feng, Zhang Ze
Название: Progress in Transmission Electron Microscopy 1 / Concepts and Techniques
ISBN: 3540676805 ISBN-13(EAN): 9783540676805
Издательство: Springer
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Цена: 20477 р.
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Описание: Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.

Scanning Electron Microscopy and X-ray Microanalysis

Автор: Goldstein
Название: Scanning Electron Microscopy and X-ray Microanalysis
ISBN: 0306472929 ISBN-13(EAN): 9780306472923
Издательство: Springer
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Цена: 9349 р.
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Описание: Intended for students, as well as practitioners, this text offers an introduction to the field of Scanning Electron Microscopy (SEM) and X-ray microanalysis. It discusses topics such as user-controlled functions of scanning electron microscopes, the characteristics of electron beam, the use of x-rays for qualitative analysis, and more.


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