X-Ray Scattering from Soft-Matter Thin Films, Metin Tolan
Новое издание
Автор: Metin Tolan Название: X-Ray Scattering from Soft-Matter Thin Films ISBN: 366214218X ISBN-13(EAN): 9783662142189 Издательство: Springer Цена: 13060.00 р. Наличие на складе: Есть у поставщикаПоставка под заказ. Описание: The properties of soft-matter thin films (e.g. liquid films, polymer coatings, Langmuir-Blodgett multilayers) nowadays play an important role in materials science. X-ray scattering under grazing angles is the only tool to investigating these materials on atomic and mesoscopic length scales.
Автор: Metin Tolan Название: X-Ray Scattering from Soft-Matter Thin Films ISBN: 366214218X ISBN-13(EAN): 9783662142189 Издательство: Springer Рейтинг: Цена: 13060.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The properties of soft-matter thin films (e.g. liquid films, polymer coatings, Langmuir-Blodgett multilayers) nowadays play an important role in materials science. X-ray scattering under grazing angles is the only tool to investigating these materials on atomic and mesoscopic length scales.
Автор: de Jeu Wim H. Название: Basic X-Ray Scattering for Soft Matter ISBN: 0198728670 ISBN-13(EAN): 9780198728672 Издательство: Oxford Academ Рейтинг: Цена: 4354.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Students and scientists of soft matter (polymers, liquid crystals, colloids, etc.) with a chemical background need to know the technique of x-ray scattering without becoming an expert. This book explains basic principles and applications of x-ray scattering in a simple way without heavy maths, using practical examples and case studies.
Автор: Norbert Stribeck Название: X-Ray Scattering of Soft Matter ISBN: 3642089259 ISBN-13(EAN): 9783642089251 Издательство: Springer Рейтинг: Цена: 16769.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This manual is a useful ready-reference guide to the analytical power of modern X-ray scattering in the field of soft matter. Data analysis based on clear, unequivocal results is rendered simple and straightforward - with a stress on careful planning of experiments and adequate recording of all required data.
Автор: Youichi Murakami, Sumio Ishihara Название: Resonant X-Ray Scattering in Correlated Systems ISBN: 3662532255 ISBN-13(EAN): 9783662532256 Издательство: Springer Рейтинг: Цена: 18167.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides.
ООО "Логосфера " Тел:+7(495) 980-12-10 www.logobook.ru