Описание: This book describes the basic principles that relate to field and current inhomogeneities in semiconductors and their kinetics that occur in the regime of negative differential conductances of semiconductors.
Автор: Roman Louban Название: Image Processing of Edge and Surface Defects ISBN: 3642260357 ISBN-13(EAN): 9783642260353 Издательство: Springer Рейтинг: Цена: 15672.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The edge and surface inspection is one of the most important and most challenging tasks in quality assessment in industrial production. Providing a valuable reference, this book offers a detailed description of optical methods for defect recognition.
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