Semiconductor Modeling Techniques, Xavier Marie; Naci Balkan

Автор: Wai Kin Chim
Название: Semiconductor Device and Failure Analysis : Using Photon Emission Microscopy
ISBN: 047149240X ISBN-13(EAN): 9780471492405
Издательство: Wiley
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Описание: Fault detection has become increasingly difficult as integrated circuits become more and more complex. Photon Emission Microscopy (PEM) is a physical failure analysis technique which locates and identifies faults in integrated circuits.

Автор: Dunsmore
Название: Handbook of Microwave Component Measurements: with Advanced VNA Techniques
ISBN: 1119979552 ISBN-13(EAN): 9781119979555
Издательство: Wiley
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Цена: 14969.00 р.
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Описание: Explains the interactions between the device-under-test (DUT) and the measuring equipment by demonstrating the best practices for ascertaining the true nature of the DUT, and optimizing the time to set up and measure

Автор: Xia
Название: Semiconductor Spintronics
ISBN: 9814327905 ISBN-13(EAN): 9789814327909
Издательство: World Scientific Publishing
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Описание: Semiconductor Spintronics, as an emerging research discipline and an important advanced field in physics, has developed quickly and obtained fruitful results. This monograph summarizes the physical foundation and the experimental results obtained in this field.

Автор: Richard Haight (Editor), Frances M. Ross (Editor),
Название: Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization V1
ISBN: 9814322814 ISBN-13(EAN): 9789814322812
Издательство: World Scientific Publishing
Цена: 58172.00 р.
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Описание: Nanoscience and nanotechnology is an exciting and vibrant field of research. This handbook is suitable for researchers, engineers and advanced graduate students in various areas of nanoscience. It includes information on important techniques for unlocking the detailed science and properties of nanostructures.