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Nano Devices and Sensors, Juin J. Liou,Shien-Kuei Liaw,Yung-Hui Chung


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Автор: Juin J. Liou,Shien-Kuei Liaw,Yung-Hui Chung
Название:  Nano Devices and Sensors
ISBN: 9781501510502
Издательство: Walter de Gruyter
Классификация:





ISBN-10: 1501510509
Обложка/Формат: Hardback
Страницы: 228
Вес: 0.57 кг.
Дата издания: 25.04.2016
Серия: Physics
Язык: English
Размер: 244 x 170 x 14
Читательская аудитория: Professional and scholarly
Ключевые слова: Engineering: general,Nanotechnology,Materials science,Electronics & communications engineering,Electronic devices & materials, SCIENCE / Nanoscience,TECHNOLOGY & ENGINEERING / Electrical,TECHNOLOGY & ENGINEERING / Electronics / General,TECHNOLOGY & ENGINE
Поставляется из: Германии
Описание: The chapters in this edited book are written by some authors who have presented very high quality papers at the 2015 International Symposium of Next-Generation Electronics (ISNE 2015) held in Taipei, Taiwan. The ISNE 2015 was intended to provide a common forum for researchers, scientists, engineers, and practitioners throughout the world to present their latest research findings, ideas, developments, and applications in the general areas of electron devices, integrated circuits, and microelectronic systems and technologies. The scope of the conference includes the following topics: A. Green ElectronicsB. Microelectronic Circuits and SystemsC. Integrated Circuits and Packaging TechnologiesD. Computer and Communication Engineering E. Electron Devices F. Optoelectronic and Semiconductor Technologies The technical program consisted of 4 plenary talks, 23 invited talks, and more than 250 contributed oral and poster presentations. Plenary speakers were recognized experts in their fields, and their talks focused on leading-edge technologies including: The Future Lithographic Technology for Semiconductor Fabrication by Dr. Alek C. Chen, Asia ASML, Taiwan. Detection of Single Traps and Characterization of Individual Traps: Beginning of Atomistic Reliability Physics by Prof. Toshiaki Tsuchiya, Shimane University, Japan. The Art and Science of Packaging High-Coupling Photonics Devices and Modules, by Prof. Wood-Hi Cheng, National Chung-Hsing University, Taiwan. Prospect and Outlook of Electrostatic Discharge (ESD) Protection in Emerging Technologies, by Prof. Juin J. Liou, University of Central Florida, USA. After a rigorous review process, the ISNE 2015 technical program committee has selected 10 outstanding presentations and invited the authors to prepare extended chapters for inclusion in this edited book. Of the 10 chapters, five are focused on the subject of electronic devices, and the other covers the circuit designs for various applications. The authors are working at the academia in Austria, United States, Korea, and Taiwan. The guest editors would like to take this opportunity to express our sincere gratitude to all the members of the ISNE 2015 technical program committees for reviewing the papers and selecting the manuscripts for the edited book. We also thank all the authors for their valuable and excellent contributions to the book.


Philosophical Devices

Автор: Papineau David
Название: Philosophical Devices
ISBN: 0199651736 ISBN-13(EAN): 9780199651733
Издательство: Oxford Academ
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Описание: Philosophical Devices introduces the technical ideas that are taken for granted in contemporary philosophical writing. It offers simple explanations and covers a wealth of material that is normally available only to specialists. This original, distinctive book will appeal to anyone who is curious about the technical infrastructure of philosophy.

Nano Optoelectronic Sensors and Devices

Автор: Xi, Ning
Название: Nano Optoelectronic Sensors and Devices
ISBN: 0128103493 ISBN-13(EAN): 9780128103494
Издательство: Elsevier Science
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Цена: 21054.00 р.
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Описание: Nanophotonics has emerged as a major technology and applications domain, exploiting the interaction of light-emitting and light-sensing nanostructured materials. These devices are lightweight, highly efficient, low on power consumption, and are cost effective to produce. The authors of this book have been involved in pioneering work in manufacturing photonic devices from carbon nanotube (CNT) nanowires and provide a series of practical guidelines for their design and manufacture, using processes such as nano-robotic manipulation and assembly methods. They also introduce the design and operational principles of opto-electrical sensing devices at the nano scale. Thermal annealing and packaging processes are also covered, as key elements in a scalable manufacturing process. Examples of applications of different nanowire based photonic devices are presented. These include applications in the fields of electronics (e.g. FET, CNT Schotty diode) and solar energy.

Robust Computing with Nano-scale Devices

Автор: Chao Huang
Название: Robust Computing with Nano-scale Devices
ISBN: 9400731833 ISBN-13(EAN): 9789400731837
Издательство: Springer
Цена: 15672.00 р.
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Описание: Chapter 1: Introduction. Chapter 2: Fault Tolerant Nano-Computing; Bharat Joshi, Dhiraj K. Pradhan, and Saraju P. Mohanty. 2.1 Introduction. 2.2 Principles of Fault Tolerant Nano-Computer Systems. 2.3 Process Variations in Nano-scale Circuits. 2.4 Fault Tolerant Nano-Computer Applications. 2.5 Trends and Future. Chapter 3: Transistor-Level Based Defect-Tolerance for Reliable Nano-Electronics; Aiman H. El-Maleh, Bashir M. Al-Hashimi, Aissa Melouki, and Ahmad Al-Yamani. 3.1 Introduction. 3.2 Previous Approaches. 3.3 Proposed Defect Tolerance Technique. 3.4 Experimental Results. 3.5 Conclusion. Chapter 4: Fault-Tolerant Design for Nanowire-Based Programmable Logic Arrays; Yexin Zheng and Chao Huang. 4.1 Introduction. 4.2 Background. 4.3 Redundancy-Based Defect-Tolerant Techniques. 4.4 Defect-Aware Logic Mapping for Nanowire-Based PLA. 4.5 Experimental Results. 4.6 Conclusions and Perspectives. Chapter 5: Built-In Self-Test and Defect Tolerance for Molecular Electronics-Based NanoFabrics; Mohammad Tehranipoor. 5.1 Introduction. 5.2 Related Prior Work. 5.3 BIST Procedure. 5.4 Test Configurations. 5.5 Recovery Analysis. 5.6 Simulation and Results. 5.7 Discussion. 5.8 Conclusion. Chapter 6: The Prospect and Challenges of CNFET-Based Circuits - A Physical Insight; Bipul C. Paul; 6.1 Introduction. 6.2 Fundamentals of CNFET. 6.3 Compact Model of CNFET. 6.4 Impact of Parasitics on Circuit Performance. 6.5 Impact of Process Variation. 6.6 Summary. 6.7 Appendix. Chapter 7: Computing with Nanowires - A Self Assembled Neuromorphic Architecture; S. Bandyopadhyay, K. Karahaliloglu, and S. Patibandla. 7.1 Introduction. 7.2 Self Assembly of Neuromorphic Networks. 7.3 Electrical Characterization of the Nanowires. 7.4 Simulation Results. 7.5 Conclusion. Chapter 8: Computational Opportunities and CADfor Nanotechnologies; M. Nicolaidis and E. Kolonis. 8.1 Introduction. 8.2 A Holistic CAD Platform for Nanotechnologies. 8.3 High-Level Modeling and Simulation Tool. 8.4 Artificial Ecosystems. 8.5 Systems of Particles and Emergence of Relativistic Space-Time. 8.6 Nano-Network Architecture Fit Tool. 8.7 Circuit Synthesis Tool. 8.8 Architectures for Complex Systems Implementation. 8.9 Non-Conventional Architectures. 8.10 Conclusions. Index.

Robust Computing with Nano-scale Devices

Автор: Chao Huang
Название: Robust Computing with Nano-scale Devices
ISBN: 9048185394 ISBN-13(EAN): 9789048185399
Издательство: Springer
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Описание: Progresses and Challenges. .


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