Advanced Mathematical And Computational Tools In Metrology And Testing X, Pavese Franco Et Al

Автор: David S. Simon; Gregg Jaeger; Alexander V. Sergien
Название: Quantum Metrology, Imaging, and Communication
ISBN: 331946549X ISBN-13(EAN): 9783319465494
Издательство: Springer
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Описание: This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.

Автор: Petrie
Название: Inductive Metrology
ISBN: 1108065767 ISBN-13(EAN): 9781108065764
Издательство: Cambridge Academ
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Описание: As a young man, Sir William Matthew Flinders Petrie (1853-1942) published in 1877 this innovative approach to metrology, based on his early surveying experiences. It analyses monuments from a range of civilisations to determine their methods of linear measurement. Notably, Petrie establishes that societies without writing systems could also make accurate measurements.

Автор: Pavese Franco Et Al
Название: Advanced Mathematical And Computational Tools In Metrology And Testing Ix
ISBN: 9814397946 ISBN-13(EAN): 9789814397940
Издательство: World Scientific Publishing
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Описание: This volume contains original, refereed worldwide contributions. They were prompted by presentations made at the ninth AMCTM Conference held in G teborg (Sweden) in June 2011 on the theme of advanced mathematical and computational tools in metrology and also, in the title of this book series, in testing.The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also in keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards.