Описание: The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
The 3rd International Multidisciplinary Microscopy Congress (InterM2015), held from 19 to 23 October 2015, focused on the latest developments concerning applications of microscopy in the biological, physical and chemical sciences at all dimensional scales, advances in instrumentation, techniques in and educational materials on microscopy. These proceedings gather 17 peer-reviewed technical papers submitted by leading academic and research institutions from nine countries and representing some of the most cutting-edge research available.
Автор: Savigny Heather Название: Political Communication ISBN: 1137011378 ISBN-13(EAN): 9781137011374 Издательство: Springer Рейтинг: Цена: 5639.00 р. Наличие на складе: Поставка под заказ.
Описание: This major international text introduces the key themes, issues and theoretical approaches in the field. A central concern is to put the politics back into the study of communication by posing key critical questions about power and ideology: what is being communicated, by whom, how, in whose interests, and with what effects and implications?
Автор: Gastil J Название: Political Communication and Deliberation ISBN: 1412916275 ISBN-13(EAN): 9781412916271 Издательство: Sage Publications Рейтинг: Цена: 21067.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The act of deliberation is the act of reflecting carefully on a matter and weighing the strengths and weaknesses of alternative solutions to a problem. This work takes a unique approach to the field of political communication by viewing key concepts and research through the lens of deliberative democratic theory.
Автор: Joseph Goldstein; Dale Newbury; David Joy; Joseph Название: Scanning Electron Microscopy and X-Ray Microanalysis ISBN: 149396674X ISBN-13(EAN): 9781493966745 Издательство: Springer Рейтинг: Цена: 13974.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practitioners - engineers, technicians, physical and biological scientists, clinicians, and technical managers - will find that every chapter has been overhauled to meet the more practical needs of the technologist and working professional. In a break with the past, this Fourth Edition de-emphasizes the design and physical operating basis of the instrumentation, including the electron sources, lenses, detectors, etc.
In the modern SEM, many of the low level instrument parameters are now controlled and optimized by the microscope's software, and user access is restricted. Although the software control system provides efficient and reproducible microscopy and microanalysis, the user must understand the parameter space wherein choices are made to achieve effective and meaningful microscopy, microanalysis, and micro-crystallography. Therefore, special emphasis is placed on beam energy, beam current, electron detector characteristics and controls, and ancillary techniques such as energy dispersive x-ray spectrometry (EDS) and electron backscatter diffraction (EBSD).
With 13 years between the publication of the third and fourth editions, new coverage reflects the many improvements in the instrument and analysis techniques. The SEM has evolved into a powerful and versatile characterization platform in which morphology, elemental composition, and crystal structure can be evaluated simultaneously. Extension of the SEM into a "dual beam" platform incorporating both electron and ion columns allows precision modification of the specimen by focused ion beam milling.
New coverage in the Fourth Edition includes the increasing use of field emission guns and SEM instruments with high resolution capabilities, variable pressure SEM operation, theory, and measurement of x-rays with high throughput silicon drift detector (SDD-EDS) x-ray spectrometers. In addition to powerful vendor- supplied software to support data collection and processing, the microscopist can access advanced capabilities available in free, open source software platforms, including the National Institutes of Health (NIH) ImageJ-Fiji for image processing and the National Institute of Standards and Technology (NIST) DTSA II for quantitative EDS x-ray microanalysis and spectral simulation, both of which are extensively used in this work. However, the user has a responsibility to bring intellect, curiosity, and a proper skepticism to information on a computer screen and to the entire measurement process.
This book helps you to achieve this goal. Realigns the text with the needs of a diverse audience from researchers and graduate students to SEM operators and technical managersEmphasizes practical, hands-on operation of the microscope, particularly user selection of the critical operating parameters to achieve meaningful resultsProvides step-by-step overviews of SEM, EDS, and EBSD and checklists of critical issues for SEM imaging, EDS x-ray microanalysis, and EBSD crystallographic measurementsMakes extensive use of open source software: NIH ImageJ-FIJI for image processing and NIST DTSA II for quantitative EDS x-ray microanalysis and EDS spectral simulation. Includes case studies to illustrate practical problem solvingCovers Helium ion scanning microscopyOrganized into relatively self-contained modules - no need to "read it all" to understand a topicIncludes an online supplement-an extensive "Database of Electron-Solid Interactions"-which can be accessed on SpringerLink, in Chapter 3
Автор: Maarek Название: Campaign Communication and Political Marketing ISBN: 1444332341 ISBN-13(EAN): 9781444332346 Издательство: Wiley Рейтинг: Цена: 13456.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Campaign Communication and Political Marketing is a comprehensive, internationalist study of the modern political campaign. It indexes and explains their integral components, strategies, and tactics.
Автор: Wring Название: Political Communication in Britain ISBN: 0230301452 ISBN-13(EAN): 9780230301450 Издательство: Springer Рейтинг: Цена: 13974.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The 2010 General Election represented a pathbreaking contest in Political Communication. The TV debates changed forever the feel of the campaign. This book brings together key commentators, analysts and polling experts to present readers with a unique and valuable insight into the development of political communication in British Politics.
Автор: Lilleker Название: Political Communication and Cognition ISBN: 0230363628 ISBN-13(EAN): 9780230363625 Издательство: Springer Рейтинг: Цена: 12577.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Political Communication and Cognition draws on a range of theories from communication psychology to explain how citizens receive communication about politics, how communication might make a citizen think and importantly what stimulates political participation, whether simply paying attention, chatting online or going to vote.
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