Автор: Gubicza, J Название: Defect Structure and Properties of Nanomaterials ISBN: 0081019173 ISBN-13(EAN): 9780081019177 Издательство: Elsevier Science Рейтинг: Цена: 28633.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
Defect Structure and Properties of Nanomaterials: Second and Extended Edition covers a wide range of nanomaterials including metals, alloys, ceramics, diamond, carbon nanotubes, and their composites. This new edition is fully revised and updated, covering important advances that have taken place in recent years.
Nanostructured materials exhibit unique mechanical and physical properties compared with their coarse-grained counterparts, therefore these materials are currently a major focus in materials science. The production methods of nanomaterials affect the lattice defect structure (vacancies, dislocations, disclinations, stacking faults, twins, and grain boundaries) that has a major influence on their mechanical and physical properties.
In this book, the production routes of nanomaterials are described in detail, and the relationships between the processing conditions and the resultant defect structure, as well as the defect-related properties (e.g. mechanical behavior, electrical resistance, diffusion, corrosion resistance, thermal stability, hydrogen storage capability, etc.) are reviewed.
In particular, new processing methods of nanomaterials are described in the chapter dealing with the manufacturing procedures of nanostructured materials. New chapters on (i) the experimental methods for the study of lattice defects, (ii) the defect structure in nanodisperse particles, and (iii) the influence of lattice defects on electrical, corrosion, and diffusion properties are included, to further enhance what has become a leading reference for engineering, physics, and materials science audiences.
Автор: Holt Название: Extended Defects in Semiconductors ISBN: 1107424143 ISBN-13(EAN): 9781107424142 Издательство: Cambridge Academ Рейтинг: Цена: 11405.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: A discussion of the basic properties of structurally extended defects, their effect on the electronic properties of semiconductors, their role in semiconductor devices, and techniques for their characterization. This text is suitable for advanced undergraduate and graduate students in materials science and engineering, and for those studying semiconductor physics.
Автор: Dahoo Название: Nanometer-scale Defect Detection Using Polarized Light ISBN: 1848219369 ISBN-13(EAN): 9781848219366 Издательство: Wiley Рейтинг: Цена: 22010.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.
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