Crisis Communications, Fearn-Banks Kathleen

Автор: Fearn-banks, Kathleen
Название: Student workbook to accompany crisis communications
ISBN: 1138688975 ISBN-13(EAN): 9781138688971
Издательство: Taylor&Francis
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Цена: 6583.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: No company, organization, or individual whose livelihood depends on public reaction can afford to function without a crisis communications plan. This student workbook reviews the critical terminologies, processes, and skills needed for understanding and responding to crises. It prepares individuals for responding to crises in a variety of contexts, and reinforces strategies and tactics to be used during a crisis. Chapters include instructive case studies of public relations professionals in crises: what they did, what they wished they had done, and what hampered their progress. The exercises provide students with the opportunity to respond to real-world crises, sharpening their own skills and practicing response behaviors. This workbook will serve as a useful tool for all future practitioners.

Автор: Fearn, Sarah
Название: Introduction to time-of-flight secondary ion mass spectrometry
ISBN: 1681740249 ISBN-13(EAN): 9781681740249
Издательство: Mare Nostrum (Eurospan)
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Цена: 5405.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties.Over the years, SIMS instrumentation has dramatically changed since the earliest secondary ion mass spectrometers were first developed. Instruments were once dedicated to either the depth profiling of materials using high-ion-beam currents to analyse near surface to bulk regions of materials (dynamic SIMS), or time-of-flight instruments that produced complex mass spectra of the very outer-most surface of samples, using very low-beam currents (static SIMS). Now, with the development of dual-beam instruments these two very distinct fields now overlap.