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Simulation of Stochastic Processes with Given Accuracy and Reliab, Kozachenko, Yuriy V.


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Цена: 29139.00р.
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При оформлении заказа до: 2025-07-28
Ориентировочная дата поставки: Август-начало Сентября
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Автор: Kozachenko, Yuriy V.
Название:  Simulation of Stochastic Processes with Given Accuracy and Reliab
ISBN: 9781785482175
Издательство: Elsevier Science
Классификация:

ISBN-10: 1785482173
Обложка/Формат: Hardback
Страницы: 346
Вес: 0.68 кг.
Дата издания: 24.11.2016
Язык: English
Размер: 239 x 159 x 22
Ссылка на Издательство: Link
Рейтинг:
Поставляется из: Европейский союз
Описание:

Simulation has now become an integral part of research and development across many fields of study. Despite the large amounts of literature in the field of simulation and modeling, one recurring problem is the issue of accuracy and confidence level of constructed models. By outlining the new approaches and modern methods of simulation of stochastic processes, this book provides methods and tools in measuring accuracy and reliability in functional spaces. The authors explore analysis of the theory of Sub-Gaussian (including Gaussian one) and Square Gaussian random variables and processes and Cox processes. Methods of simulation of stochastic processes and fields with given accuracy and reliability in some Banach spaces are also considered.

  • Provides an analysis of the theory of Sub-Gaussian (including Gaussian one) and Square Gaussian random variables and processes
  • Contains information on the study of the issue of accuracy and confidence level of constructed models not found in other books on the topic
  • Provides methods and tools in measuring accuracy and reliability in functional spaces



Precision Landmark Location for Machine Vision and Photogrammetry / Finding and Achieving the Maximum Possible Accuracy

Автор: Gutierrez JosГ© A., Armstrong Brian S.R.
Название: Precision Landmark Location for Machine Vision and Photogrammetry / Finding and Achieving the Maximum Possible Accuracy
ISBN: 1846289122 ISBN-13(EAN): 9781846289125
Издательство: Springer
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Цена: 15372.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: The applications of image-based measurement are many and various: image-guided surgery, mobile-robot navigation, component alignment, part inspection and photogrammetry, among others. In all these applications, landmarks are detected and located in images, and measurements made from those locations.Precision Landmark Location for Machine Vision and Photogrammetry addresses the ubiquitous problem of measurement error associated with determining the location of landmarks in images. With a detailed model of the image formation process and landmark location estimation, the CramГ©r–Rao Lower Bound (CRLB) theory of statistics is applied to determine the least possible measurement uncertainty in a given situation.This monograph provides the reader with:• the most complete treatment to date of precision landmark location and the engineering aspects of image capture and processing;• detailed theoretical treatment of the CRLB;• a software tool for analyzing the potential performance-specific camera/lens/algorithm configurations;• two novel algorithms which achieve precision very close to the CRLB;• an experimental method for determining the accuracy of landmark location;• downloadable MATLABВ® package to assist the reader with applying theoretically-derived results to practical engineering configurations.All of this adds up to a treatment that is at once theoretically sound and eminently practical.Precision Landmark Location for Machine Vision and Photogrammetry will be of great interest to computer scientists and engineers working with and/or studying image processing and measurement. It includes cutting-edge theoretical developments and practical tools so it will appeal to research investigators and system designers.


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