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Transmission Electron Microscopy, Carter


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Цена: 9349р.
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Склад Англия: 6 шт.  
При оформлении заказа до: 31 янв 2020
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Автор: Carter
Название:  Transmission Electron Microscopy
Издательство: Springer
Классификация:
Научное оборудование и методы, лабораторное оборудование
Аналитическая химия
Нанотехнология
Материаловедение

ISBN: 3319266497
ISBN-13(EAN): 9783319266497
ISBN: 3-319-26649-7
ISBN-13(EAN): 978-3-319-26649-7
Обложка/Формат: Hardback
Страницы: 518
Вес: 1.634 кг.
Дата издания: 2016
Язык: English
Издание: 2016 ed.
Иллюстрации: 300 black & white illustrations, 34 black & white tables, 254 colour tables, biography
Размер: 29.31 x 21.59 x 3.43 cm
Читательская аудитория: Graduate/advanced undergraduate textbook
Основная тема: Materials Science / Chemistry
Подзаголовок: Diffraction, Imaging, and Spectrometry
Ссылка на Издательство: Link
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Поставляется из: Германии
Описание: This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials ScienceTopics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.
Дополнительное описание: Foreword by Sir John Meurig Thomas.- 1. Electron Sources.- 2. In Situ and Operando.- 3. Electron Diffraction and Phase Identification.- 4. Convergent-Beam Diffraction: Symmetry and Large-Angle Patterns.- 5. Electron crystallography, charge-density mapping




Electron Microscopy of Polymers

Автор: Michler G.H.
Название: Electron Microscopy of Polymers
ISBN: 3540363505 ISBN-13(EAN): 9783540363507
Издательство: Springer
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Цена: 13107 р.
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Описание: There are many books on electron microscopy, however, the study of polymers by EM needs special techniques, precautions and preparation methods, including ultramicrotomy. General characteristics of the different techniques of EM, including scanning force microscopy (AFM), are given. Application of these techniques to study morphology and also properties, particularly micromechanical properties, is described in detail. Examples from all classes of polymers are presented.

Physical Principles of Electron Microscopy

Автор: Egerton
Название: Physical Principles of Electron Microscopy
ISBN: 0387258000 ISBN-13(EAN): 9780387258003
Издательство: Springer
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Цена: 12233 р.
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Описание: Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.

Scanning Electron Microscopy and X-ray Microanalysis

Автор: Goldstein
Название: Scanning Electron Microscopy and X-ray Microanalysis
ISBN: 0306472929 ISBN-13(EAN): 9780306472923
Издательство: Springer
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Цена: 9349 р.
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Описание: Intended for students, as well as practitioners, this text offers an introduction to the field of Scanning Electron Microscopy (SEM) and X-ray microanalysis. It discusses topics such as user-controlled functions of scanning electron microscopes, the characteristics of electron beam, the use of x-rays for qualitative analysis, and more.

Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

Автор: Patrick Echlin
Название: Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
ISBN: 0387857303 ISBN-13(EAN): 9780387857305
Издательство: Springer
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Цена: 9817 р.
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Описание: Specimens range from inorganic, organic, biological, and geological samples to materials such as metals, polymers, and semiconductors which can exist as solids, liquids, and gases. This title describes what is needed up to the point the sample is put into the instrument. It is suitable for those who use these instruments.

Three-dimensional electron microscopy of macromolecular assemblies

Автор: Frank, Joachim
Название: Three-dimensional electron microscopy of macromolecular assemblies
ISBN: 0195182189 ISBN-13(EAN): 9780195182187
Издательство: Oxford Academ
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Цена: 11709 р.
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Описание: In the past ten years there has been a tremendous surge in applications of cryo-electron microscopy in the study of macromolecular assemblies, in especially those in single-particle form. Although the path toward atomic resolution is much more tedious than in electron crystallography of two-dimensional crystals, realization of such resolution for entirely asymmetrical molecules is now in close reach. In Three-Dimensional Electron Microscopy of Macromolecular Assemblies: Visualization of Biological Molecules in Their Native State, Joachim Frank describes the mathematical principles and working methods of single-particle reconstruction--a method designed to retrieve structural information from electron micrographs showing many "copies" of molecules trapped in ice in random orientations. The technique is uniquely suited to obtain three-dimensional images of molecular machines in different functional states, as it does not require crystals. This revised edition includes a basic introduction to transmission electron microscopy and the design of the instruments, and it covers specimen preparation in greater depth. Frank addresses the remarkable convergence of processing methods that has taken place, making it possible to sharpen the focus of some sections. New sections have been added that cover segmentation as well as various techniques of docking and fitting. Finally, appendix material is now included; this tabulates applications and methods of single-particle reconstruction and describes the most important mathematical tools and theorems of Fourier processing.

Aberration-corrected analytical electron microscopy

Автор: Brydson, Rik
Название: Aberration-corrected analytical electron microscopy
ISBN: 0470518510 ISBN-13(EAN): 9780470518519
Издательство: Wiley
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Цена: 5199 р.
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Описание: The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology.

Electron Microscopy & Analysis

Автор: Goodhew
Название: Electron Microscopy & Analysis
ISBN: 0748409688 ISBN-13(EAN): 9780748409686
Издательство: Taylor&Francis
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Цена: 6373 р.
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Описание: A guide to scanning and transmission microscopes and to the analytical techniques based on them. It covers the techniques of electron energy loss spectroscopy and energy dispersive X-ray analysis. It compares electron microscopic techniques to many of the competing physical investigative techniques available.

Progress in Transmission Electron Microscopy 1 / Concepts and Techniques

Автор: Zhang Xiao-Feng, Zhang Ze
Название: Progress in Transmission Electron Microscopy 1 / Concepts and Techniques
ISBN: 3540676805 ISBN-13(EAN): 9783540676805
Издательство: Springer
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Цена: 20477 р.
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Описание: Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.

Transmission Electron Microscopy

Автор: David B. Williams; C. Barry Carter
Название: Transmission Electron Microscopy
ISBN: 038776500X ISBN-13(EAN): 9780387765006
Издательство: Springer
Рейтинг:
Цена: 9345 р.
Наличие на складе: Невозможна поставка.

Описание: Illustrated in color, this work offers the necessary instructions for successful hands-on application of this versatile materials characterization technique. It also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment.

Introduction to Conventional Transmission Electron Microscopy

Автор: De Graef
Название: Introduction to Conventional Transmission Electron Microscopy
ISBN: 0521620066 ISBN-13(EAN): 9780521620062
Издательство: Cambridge Academ
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Цена: 15716 р.
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Описание: Graduate level textbook covering the fundamentals of conventional transmission electron microscopy.

Transmission Electron Microscopy

Автор: Williams
Название: Transmission Electron Microscopy
ISBN: 030645324X ISBN-13(EAN): 9780306453243
Издательство: Springer
Рейтинг:
Цена: 7013 р.
Наличие на складе: Поставка под заказ.

Описание: This groundbreaking text provides the necessary instructions for hands-on application of this versatile materials characterization technique and is supported by over 600 illustrations and diagrams.

Transmission Electron Microscopy and Diffractometry of Materials

Автор: Fultz
Название: Transmission Electron Microscopy and Diffractometry of Materials
ISBN: 3540437649 ISBN-13(EAN): 9783540437642
Издательство: Springer
Цена: 7756 р.
Наличие на складе: Поставка под заказ.

Описание: This textbook develops the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms, wave interference, and the formation and analysis of diffraction patterns. It explains the uniqueness of each technique, especially imaging and spectroscopy in the TEM. Simple citations of rules are avoided as much as possible, and both practical and theoretical issues are explained in detail. The book can be used as both an introductory and advanced-level graduate text since sections/chapters are sorted according to difficulty and grouped for use in quarter and semester courses on TEM and XRD. Numerous problems are provided at the end of each chapter to reinforce key concepts, and solutions are available to instructors. Appendices provide procedures for introductory laboratory exercises, and up-to-date tabulations of physical data useful for TEM and XRD.


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