Описание: Advances in synthesis and characterization of dielectric, piezoelectric and ferroelectric thin films are included in this volume. Dielectric, piezoelectric and ferroelectric thin films have a tremendous impact on a variety of commercial and military systems including tunable microwave devices, memories, MEMS devices, actuators and sensors.
Автор: Barbara Kirchner Название: Ionic Liquids ISBN: 3642017797 ISBN-13(EAN): 9783642017797 Издательство: Springer Рейтинг: Цена: 49631.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: "Ionic liquids will never find application in industry", "I don`t understand this fad for ionic liquids" and "there is no widespread interest in these systems" are just three of quotes from the reports of referees for research proposals that I have received over the years.
Автор: Borja Название: Dielectric Breakdown in Gigascale Electronics ISBN: 3319432184 ISBN-13(EAN): 9783319432182 Издательство: Springer Рейтинг: Цена: 7836.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book focuses on the experimental and theoretical aspects of the time-dependent breakdown of advanced dielectric films used in gigascale electronics. Coverage includes the most important failure mechanisms for thin low-k films, new and established experimental techniques, recent advances in the area of dielectric failure, and advanced simulations/models to resolve and predict dielectric breakdown, all of which are of considerable importance for engineers and scientists working on developing and integrating present and future chip architectures. The book is specifically designed to aid scientists in assessing the reliability and robustness of electronic systems employing low-k dielectric materials such as nano-porous films. Similarly, the models presented here will help to improve current methodologies for estimating the failure of gigascale electronics at device operating conditions from accelerated lab test conditions. Numerous graphs, tables, and illustrations are included to facilitate understanding of the topics. Readers will be able to understand dielectric breakdown in thin films along with the main failure modes and characterization techniques. In addition, they will gain expertise on conventional as well as new field acceleration test models for predicting long term dielectric degradation.
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