Fringe Pattern Analysis for Optical Metrology - Theory, Algorithms, and Applications, Servin

Автор: David S. Simon; Gregg Jaeger; Alexander V. Sergien
Название: Quantum Metrology, Imaging, and Communication
ISBN: 331946549X ISBN-13(EAN): 9783319465494
Издательство: Springer
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Цена: 16769.00 р.
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Описание: This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.