Описание: Fault detection has become increasingly difficult as integrated circuits become more and more complex. Photon Emission Microscopy (PEM) is a physical failure analysis technique which locates and identifies faults in integrated circuits.
Автор: May Название: Fundamentals of Semiconductor Fabrication ISBN: 0471232793 ISBN-13(EAN): 9780471232797 Издательство: Wiley Рейтинг: Цена: 24861.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: From crystal growth to integrated devices and circuits, this new book offers a basic, up-to-date introduction to semiconductor fabrication technology, including both the theoretical and practical aspects of all major steps in the fabrication sequence.
Автор: James J Coleman Название: Advances in Semiconductor Lasers,86 ISBN: 0123910668 ISBN-13(EAN): 9780123910660 Издательство: Elsevier Science Рейтинг: Цена: 28633.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Reflecting the truly interdisciplinary nature of the field, this title is part of the Semiconductors and Semimetals series. It is of interest to physicists, chemists, materials scientists, and device engineers in modern industry.
Автор: Xia Название: Semiconductor Spintronics ISBN: 9814327905 ISBN-13(EAN): 9789814327909 Издательство: World Scientific Publishing Рейтинг: Цена: 27720.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Semiconductor Spintronics, as an emerging research discipline and an important advanced field in physics, has developed quickly and obtained fruitful results. This monograph summarizes the physical foundation and the experimental results obtained in this field.
Описание: Nanoscience and nanotechnology is an exciting and vibrant field of research. This handbook is suitable for researchers, engineers and advanced graduate students in various areas of nanoscience. It includes information on important techniques for unlocking the detailed science and properties of nanostructures.
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