Spectroscopic instrumentation, Eversberg, Thomas Vollmann, Klaus
Автор: Thomas Eversberg; Klaus Vollmann Название: Spectroscopic Instrumentation ISBN: 3662511525 ISBN-13(EAN): 9783662511527 Издательство: Springer Рейтинг: Цена: 14365.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Today they can be done using self-designed spectrographs and highly efficient CCD cameras, without the need for large financial investments.This book explains the basic principles of spectroscopy, including the fundamental optical constraints and all mathematical aspects needed to understand the working principles in detail.
Описание: In this book, the author conducts extensive spectroscopy experiments beyond the bounds of each transition element to clarify origins of characteristic spectral features and charge dynamics in charge-spin-orbital coupled phenomena in Mott-transition oxides.
Описание: In this book, the author conducts extensive spectroscopy experiments beyond the bounds of each transition element to clarify origins of characteristic spectral features and charge dynamics in charge-spin-orbital coupled phenomena in Mott-transition oxides.
Описание: Proceedings of a NATO ASI held in Erice, Italy, June 15-30, 1997
Автор: Jimenez Название: Spectroscopic Analysis of Optoelectronic Semiconductors ISBN: 3319423479 ISBN-13(EAN): 9783319423470 Издательство: Springer Рейтинг: Цена: 16979.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book deals with standard spectroscopic techniques which can be used to analyze semiconductor samples or devices, in both, bulk, micrometer and submicrometer scale. The book aims helping experimental physicists and engineers to choose the right analytical spectroscopic technique in order to get specific information about their specific demands. For this purpose, the techniques including technical details such as apparatus and probed sample region are described. More important, also the expected outcome from experiments is provided. This involves also the link to theory, that is not subject of this book, and the link to current experimental results in the literature which are presented in a review-like style. Many special spectroscopic techniques are introduced and their relationship to the standard techniques is revealed. Thus the book works also as a type of guide or reference book for people researching in optical spectroscopy of semiconductors.
Автор: Fujiwara Название: Spectroscopic Ellipsometry for Photovoltaics ISBN: 3319951378 ISBN-13(EAN): 9783319951379 Издательство: Springer Рейтинг: Цена: 30745.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Spectroscopic ellipsometry has been applied to a wide variety of material and device characterizations in solar cell research fields. In particular, device performance analyses using exact optical constants of component layers and direct analyses of complex solar cell structures are unique features of advanced ellipsometry methods. This second volume of Spectroscopic Ellipsometry for Photovoltaics presents various applications of the ellipsometry technique for device analyses, including optical/recombination loss analyses, real-time control and on-line monitoring of solar cell structures, and large-area structural mapping. Furthermore, this book describes the optical constants of 148 solar cell component layers, covering a broad range of materials from semiconductor light absorbers (inorganic, organic and hybrid perovskite semiconductors) to transparent conductive oxides and metals. The tabulated and completely parameterized optical constants described in this book are the most current resource that is vital for device simulations and solar cell structural analyses.
Автор: Fujiwara Название: Spectroscopic Ellipsometry for Photovoltaics ISBN: 3319753754 ISBN-13(EAN): 9783319753751 Издательство: Springer Рейтинг: Цена: 46118.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community.The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.
Описание: This book explores a link between the industrial process represented by the distributed generation and the analog/digital paraphernalia used in modern power systems. The electronic instrumentation is related to solving problems in the electrical engineering of small power generation plants, smart grids, energy processing, and electronic drivers.
Автор: Doebelin Название: Instrumentation Design Studies ISBN: 1138114197 ISBN-13(EAN): 9781138114197 Издательство: Taylor&Francis Рейтинг: Цена: 11789.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
Integrating physical modeling, mathematical analysis, and computer simulation, Instrumentation Design Studies explores a wide variety of specific and practical instrumentation design situations. The author uses MATLAB(R) and SIMULINK(R) for dynamic system simulation, Minitab(R) for statistical applications, and Mathcad for general engineering computations. Rather than consult the extensive manuals of these software packages, readers can access handy, sharply focused material in the appendices to assist in comprehension.
After introducing the techniques behind the design of experiments (DOE), the book discusses several technologies for implementing vibration isolation, the design of a high-accuracy pressure transducer, and the use of cold-wire thermometers for measuring rapidly fluctuating fluid temperatures. It then focuses on a basic piezoelectric actuator that provides translational motions up to about 1mm full scale with nanometer resolution, before covering instruments used to measure the viscosity of liquids as well as two special classes of microphones (infrasonic and ultrasonic) and their important specialized applications. The book also presents statistical tools, such as hypothesis testing and confidence intervals, for experiments; the design and applications of thrust stands for measuring vector forces and torques; and the analysis and simulation of a shock calibrator. It concludes with a discussion of how shock testing machines can help reduce or prevent mechanical failures.
Spanning system dynamics, measurement, and control, this book addresses the needs of practicing engineers working in instrumentation fields. It focuses on instruments for various applications, from geophysics to mechanical and aerospace engineering.
Описание: This book introduces a family of new methods for accurate and robust spectral testing and fills an information gap, as the requirements in standard test have grown increasingly challenging in recent high precision testing, especially as the device performance has continued to improve.
Автор: Dunn, William C. Название: Introduction to instrumentation, sensors, and process control ISBN: 1580530117 ISBN-13(EAN): 9781580530118 Издательство: Artech House Рейтинг: Цена: 23470.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Covers a range of technologies and techniques used in process control, explaining related terminology. This wok enables professionals to learn how to use microprocessors for both analog and digital process control, as well as signal conditioning. It presents examples using both English and SI (international system) units.
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