Routing Congestion in VLSI Circuits, Prashant Saxena; Rupesh S. Shelar; Sachin Sapatnek

Автор: Carl Sechen
Название: VLSI Placement and Global Routing Using Simulated Annealing
ISBN: 1461289572 ISBN-13(EAN): 9781461289579
Издательство: Springer
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Цена: 19591.00 р.
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Описание: Alberto Sangiovanni-Vincentelli, my UC Berkeley advisor, had been a consultant at IBM, I re- ceived a copy of the original IBM internal report on simulated annealing approximately the day of its release.

Автор: Nacima Labadie, Christian Prins, Caroline Prodhon
Название: Metaheuristics for Vehicle Routing Problems
ISBN: 1848218117 ISBN-13(EAN): 9781848218116
Издательство: Wiley
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Цена: 22010.00 р.
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Описание:

This book is dedicated to metaheuristics as applied to vehicle routing problems. Several implementations are given as illustrative examples, along with applications to several typical vehicle routing problems.

As a first step, a general presentation intends to make the reader more familiar with the related field of logistics and combinatorial optimization. This preamble is completed with a description of significant heuristic methods classically used to provide feasible solutions quickly, and local improvement moves widely used to search for enhanced solutions. The overview of these fundamentals allows appreciating the core of the work devoted to an analysis of metaheuristic methods for vehicle routing problems. Those methods are exposed according to their feature of working either on a sequence of single solutions, or on a set of solutions, or even by hybridizing metaheuristic approaches with others kind of methods.

Автор: Maurizio Palesi; Masoud Daneshtalab
Название: Routing Algorithms in Networks-on-Chip
ISBN: 1461482739 ISBN-13(EAN): 9781461482734
Издательство: Springer
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Цена: 22203.00 р.
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Описание: This book provides a single-source reference to routing algorithms for Networks-on-Chip (NoCs), as well as in-depth discussions of advanced solutions applied to current and next generation, many core NoC-based Systems-on-Chip (SoCs).

Автор: Chatterjee
Название: Routing and Wavelength Assignment for WDM-based Optical Networks
ISBN: 3319462024 ISBN-13(EAN): 9783319462028
Издательство: Springer
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Цена: 18167.00 р.
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Описание: This book presents an in-depth treatment of routing and wavelength assignment for optical networks, and focuses specifically on quality-of-service and fault resiliency issues. It reports on novel approaches for the development of routing and wavelength assignment schemes for fault-resilient optical networks, which improve their performance in terms of signal quality, call blocking, congestion level and reliability, without a substantial increase in network setup cost. The book first presents a solution for reducing the effect of the wavelength continuity constraint during the routing and wavelength assignment phase. Further, it reports on an approach allowing the incorporation of a traffic grooming mechanism with routing and wavelength assignment to enhance the effective channel utilization of a given capacity optical network using fewer electrical-optical-electrical conversions. As a third step, it addresses a quality of service provision scheme for wavelength-division multiplexing (WDM)-based optical networks. Lastly, the book describes the inclusion of a tree-based fault resilience scheme in priority-based dispersion-reduced wavelength assignment schemes for the purpose of improving network reliability, while maintaining a better utilization of network resources. Mainly intended for graduate students and researchers, the book provides them with extensive information on both fundamental and advanced technologies for routing and wavelength assignment in optical networks. The topics covered will also be of interest to network planners and designers.

Автор: Manoj Sachdev; Jose Pineda de Gyvez
Название: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
ISBN: 1441942858 ISBN-13(EAN): 9781441942852
Издательство: Springer
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Цена: 26120.00 р.
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Описание: The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield.