Applications of Synchrotron Light to Scattering and Diffraction in Materials and Life Sciences, T.A. Ezquerra; Mari Cruz Garcia-Gutierrez; Aurora

Автор: Will Georg
Название: Powder Diffraction / The Rietveld Method and the Two Stage Method to Determine and Refine Crystal Structures from Powder Diffraction Data
ISBN: 3540279857 ISBN-13(EAN): 9783540279853
Издательство: Springer
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Описание: Crystal structure analysis from powder diffraction data has attracted considerable and ever growing interest in the last decades. X-ray powder diffraction is best known for phase analysis (Hanawalt files) dating back to the 30s. In the late 60s the inherent potential of powder diffraction for crystallographic problems was realized and scientists developed methods for using powder diffraction data at first only for the refinement of crystal structures. With the development of ever growing computer power profile fitting and pattern decomposition allowed to extract individual intensities from overlapping diffraction peaks opening the way to many other applications, especially to ab initio structure determination. Powder diffraction today is used in X-ray and neutron diffraction, where it is a powerful method in neutron diffraction for the determination of magnetic structures. In the last decade the interest has dramatically improved. There is hardly any field of crystallography where the Rietveld, or full pattern method has not been tried with quantitative phase analysis the most important recent application.

Автор: Wolfgang Eberhardt; A.M. Bradshaw; Wolfgang Eberha
Название: Applications of Synchrotron Radiation
ISBN: 3642790267 ISBN-13(EAN): 9783642790263
Издательство: Springer
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Описание: This field has now matured from being an exotic experimental field into a well-established area of science. The spectroscopy of molecules and molecular adsorbates on surfaces is one area of science where synchrotron-radiation-related studies had made an impact on understanding the ground-state properties as well as the dynamics.

Автор: Zhong-lin Wang
Название: Elastic and Inelastic Scattering in Electron Diffraction and Imaging
ISBN: 1489915818 ISBN-13(EAN): 9781489915818
Издательство: Springer
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Описание: For a long time, I have wished to systematically summarize various dynamic theories associated with quantitative electron micros- copy and their applications in simulations of electron diffraction patterns and images. This book assumes that readers have some preknowledge of electron microscopy, electron diffraction, and quantum mechanics.