Interferometry in Radioastronomy and Radar Techniques, R. Wohlleben; H. Mattes; Th. Krichbaum
Автор: Kampes Bert M. Название: Radar Interferometry / Persistent Scatterer Technique ISBN: 140204576X ISBN-13(EAN): 9781402045769 Издательство: Springer Рейтинг: Цена: 20896.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This volume is devoted to the Persistent Scatterer Technique, the latest development in radar interferometric data processing. Using this technique, millimetric displacements can be observed at hundreds of thousands of targets that are affected only slightly from temporal and geometric decorrelation, such as the walls and the roofs of houses, lamp posts, grates, window ledges, etc. All acquired data can be used by this technique, which enables the analysis of displacements since 1992 in any area world-wide, using the archived historical data of the ERS-1 and ERS-2 satellites. Data of other current and future sensors can also be processed using this technique. The original PS algorithm is revisited based on the main literature, and possible weak points are identified. The STUN (spatio-temporal unwrapping network) algorithm, developed to cope with these issues in a robust way, is presented and applied to two test sites. For the Berlin area, two data stacks of adjacent tracks are analyzed to assess the quality description provided by the STUN algorithm. For the Las Vegas test site, a combination of ERS and ENVISAT data is performed to estimate significant linear and seasonal displacements.
Автор: Paul Fulda Название: Precision Interferometry in a New Shape ISBN: 3319013742 ISBN-13(EAN): 9783319013749 Издательство: Springer Рейтинг: Цена: 18167.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Paul has developed and demonstrated simple and effective methods to create this mode with diffractive optics and successfully demonstrated its compatibility with the essential building blocks of gravitational wave detectors, namely, optical cavities, Michelson interferometers and opto-electronic sensing and control systems.
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