Автор: Gourab Sen Gupta; Yueh-Min Ray Huang Название: Recent Advances in Sensing Technology ISBN: 3642005772 ISBN-13(EAN): 9783642005770 Издательство: Springer Рейтинг: Цена: 26122.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This volume offers the extended version of nineteen papers selected from the 131 presented at the 3rd International Conference on Sensing Technology. It covers advances on various aspects of the subject such as adaptability, validation, data fusion and more.
Автор: Koen H. A. Janssens Название: Microscopic X-Ray Fluorescence Analysis ISBN: 0471974269 ISBN-13(EAN): 9780471974260 Издательство: Wiley Рейтинг: Цена: 57808.00 р. Наличие на складе: Поставка под заказ.
Описание: -XRF analysis is a recently developed, highly sensitive analytical technique. This topical publication provides a detailed overview of the applications of -XRF in industrial and academic circles.
Автор: Harris Daniel C Название: Solution Manual for Quantitative Chemical Analysis ISBN: 1429231238 ISBN-13(EAN): 9781429231237 Издательство: Palgrave Рейтинг: Цена: 4266.00 р. Наличие на складе: Нет в наличии.
Описание: This is a helpful accompaniment for students using the main Quantitative Chemical Analysis, eighth edition, by Daniel C. Harris. The manual provides complete, step-by-step, worked-out solutions for all problems and exercises in the main text, allowing students to review and further develop their approach to them.
Описание: This book represents a conscious effort on the part of the author to detail the "life" of a crack, from its inception, through its growth, to its culmination. Fractures are discussed theoretically and practically.
Описание: Modulated crystals have been intensively investigated over the past several years and it is now evident that an understanding of their crystallography and microstructure is fundamental to the elucidation of the physical properties and phase transitions in these materials.
Автор: Gubicza Название: X-Ray Line Profile Analysis In Materials Science ISBN: 1466658525 ISBN-13(EAN): 9781466658523 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 31324.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: X-ray line profile analysis is an effective and non-destructive method for the characterisation of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field.X-Ray Line Profile Analysis in Materials Science aims to synthesise the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.
Автор: E.P. Bertin Название: Principles and Practice of X-Ray Spectrometric Analysis ISBN: 1461344182 ISBN-13(EAN): 9781461344186 Издательство: Springer Рейтинг: Цена: 16979.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Second, energy-dispersive spectrometry, in 1970 only beginning to assume its place among instrumental analytical methods, has undergone phenomenal development and application and, some believe, may supplant wavelength spectrometry for most applications in the foreseeable future.
Автор: Andrey V. Davydov Название: Advances in Gamma Ray Resonant Scattering and Absorption ISBN: 331910523X ISBN-13(EAN): 9783319105239 Издательство: Springer Рейтинг: Цена: 19564.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book presents the basics and advanced topics of research of gamma ray physics. It describes measuring of Fermi surfaces with gamma resonance spectroscopy and the theory of angular distributions of resonantly scattered gamma rays.
Designing structures using composite materials poses unique challenges, especially due to the need for concurrent design of both material and structure. Students are faced with two options: textbooks that teach the theory of advanced mechanics of composites, but lack computational examples of advanced analysis, and books on finite element analysis that may or may not demonstrate very limited applications to composites. But there is a third option that makes the other two obsolete: Ever J. Barbero's Finite Element Analysis of Composite Materials Using ANSYS(r), Second Edition. "The Only Finite Element Analysis Book on the Market Using ANSYS to Analyze Composite Materials."
By layering detailed theoretical and conceptual discussions with fully developed examples, this text supplies the missing link between theory and implementation. In-depth discussions cover all of the major aspects of advanced analysis, including three-dimensional effects, viscoelasticity, edge effects, elastic instability, damage, and delamination. This second edition of the bestseller has been completely revised to incorporate advances in the state of the art in such areas as modeling of damage in composites. In addition, all 50+ worked examples have been updated to reflect the newest version of ANSYS. Including some use of MATLAB(r), these examples demonstrate how to use the concepts to formulate and execute finite element analyses and how to interpret the results in engineering terms. Additionally, the source code for each example is available to students for download online via a companion website featuring a special area reserved for instructors. Plus a solutions manual is available for qualifying course adoptions. Cementing applied computational and analytical experience to a firm foundation of basic concepts and theory, Finite Element Analysis of Composite Materials Using ANSYS, Second Edition offers a modern, practical, and versatile classroom tool for today's engineering classroom.
Описание: This book provides an in-depth and self-contained treatment of the latest advances achieved in quantitative spectroscopic analyses of the observable outer layers of stars and similar objects. Written by two leading researchers in the field, it presents a comprehensive account of both the physical foundations and numerical methods of such analyses.
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