Algorithms for VLSI Physical Design Automation, Naveed A. Sherwani
Автор: Naveed A. Sherwani Название: Algorithms for VLSI Physical Design Automation ISBN: 146135997X ISBN-13(EAN): 9781461359975 Издательство: Springer Рейтинг: Цена: 16979.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Algorithms for VLSI Physical Design Automation, Second Edition is a core reference text for graduate students and CAD professionals. Algorithms for VLSI Physical Design Automation covers all aspects of physical design.
Автор: Stephen W. Director; Wojciech Maly; Andrzej J. Str Название: VLSI Design for Manufacturing: Yield Enhancement ISBN: 1461288169 ISBN-13(EAN): 9781461288169 Издательство: Springer Рейтинг: Цена: 11753.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: There are two ways to increase yield: by improving the control of the manufacturing process and by designing the process and the circuits in such a way as to minimize the effect of the inherent variations of the process on performance.
Автор: John P. Uyemura Название: Circuit Design for CMOS VLSI ISBN: 1461366097 ISBN-13(EAN): 9781461366096 Издательство: Springer Рейтинг: Цена: 15672.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Topics in analog circuit design reflect the growing tendency for both analog and digital circuit forms to be combined on the same chip, and a careful treatment of BiCMOS forms introduces the reader to the combination of both FET and bipolar technologies on the same chip to provide improved performance.
Автор: Abdellatif Bellaouar; Mohamed Elmasry Название: Low-Power Digital VLSI Design ISBN: 1461359996 ISBN-13(EAN): 9781461359999 Издательство: Springer Рейтинг: Цена: 23508.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Low-Power Digital VLSI Design: Circuits and Systems addresses both process technologies and device modeling. Power dissipation in CMOS circuits, several practical circuit examples, and low-power techniques are discussed. Low-voltage issues for digital CMOS and BiCMOS circuits are emphasized. The book also provides an extensive study of advanced CMOS subsystem design. A low-power design methodology is presented with various power minimization techniques at the circuit, logic, architecture and algorithm levels. Features:
Switching activity concept, low-power guidelines to engineering practice
Pass-transistor logic families
Power dissipation of I/O circuits
Multi- and low-VTCMOS logic, static power reduction circuit techniques
State of the art design of low-voltage BiCMOS and CMOS circuits
Low-power techniques in CMOS SRAMS and DRAMS
Low-power on-chip voltage down converter design
Numerous advanced CMOS subsystems (e.g. adders, multipliers, data path, memories, regular structures, phase-locked loops) with several design options trading power, delay and area
Low-power design methodology, power estimation techniques
Power reduction techniques at the logic, architecture and algorithm levels
More than 190 circuits explained at the transistor level.
Автор: Emad N. Farag; Mohamed I. Elmasry Название: Mixed Signal VLSI Wireless Design ISBN: 147578287X ISBN-13(EAN): 9781475782875 Издательство: Springer Рейтинг: Цена: 16769.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Today one of the most challenging areas for VLSI designers is VLSI circuit and system design for wireless applications. The challenge is immense and the need for new generation of VLSI designers, who are fluent in wireless communication and are masters of mixed signal design, is great.
Автор: Manoj Sachdev; Jose Pineda de Gyvez Название: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits ISBN: 1441942858 ISBN-13(EAN): 9781441942852 Издательство: Springer Рейтинг: Цена: 26120.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield.
Автор: Carl Sechen Название: VLSI Placement and Global Routing Using Simulated Annealing ISBN: 1461289572 ISBN-13(EAN): 9781461289579 Издательство: Springer Рейтинг: Цена: 19591.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Alberto Sangiovanni-Vincentelli, my UC Berkeley advisor, had been a consultant at IBM, I re- ceived a copy of the original IBM internal report on simulated annealing approximately the day of its release.
Автор: P. Antognetti; D.A. Antoniadis; Robert W. Dutton; Название: Process and Device Simulation for MOS-VLSI Circuits ISBN: 9400968442 ISBN-13(EAN): 9789400968448 Издательство: Springer Рейтинг: Цена: 12157.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Proceedings of the NATO Advanced Study Institute on Process and Device Simulation for MOS-VLSI Circuits, Sogesta, Urbino, Italy, July 12-23, 1982
Автор: Carver Mead; Mohammed Ismail Название: Analog VLSI Implementation of Neural Systems ISBN: 146128905X ISBN-13(EAN): 9781461289050 Издательство: Springer Рейтинг: Цена: 19591.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This volume contains the proceedings of a workshop on Analog Integrated Neural Systems held May 8, 1989, in connection with the International Symposium on Circuits and Systems.
Автор: J. W. Dally Название: A VLSI Architecture for Concurrent Data Structures ISBN: 1461291917 ISBN-13(EAN): 9781461291916 Издательство: Springer Рейтинг: Цена: 15672.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Concurrent data structures simplify the development of concurrent programs by encapsulating commonly used mechanisms for synchronization and commu- nication into data structures.
Автор: Angela Krstic; Kwang-Ting (Tim) Cheng Название: Delay Fault Testing for VLSI Circuits ISBN: 1461375614 ISBN-13(EAN): 9781461375616 Издательство: Springer Рейтинг: Цена: 19591.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: In that sense, this book is the best x DELAY FAULT TESTING FOR VLSI CIRCUITS available guide for an engineer designing or testing VLSI systems. Tech- niques for path delay testing and for use of slower test equipment to test high-speed circuits are of particular interest.
Автор: Sasan Iman; Massoud Pedram Название: Logic Synthesis for Low Power VLSI Designs ISBN: 1461374901 ISBN-13(EAN): 9781461374909 Издательство: Springer Рейтинг: Цена: 19591.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Logic Synthesis for Low Power VLSI Designs presents a systematic and comprehensive treatment of power modeling and optimization at the logic level.
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