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Theoretical Concepts of X-Ray Nanoscale Analysis, Andrei Benediktovich; Ilya Feranchuk; Alexander Ul


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Автор: Andrei Benediktovich; Ilya Feranchuk; Alexander Ul
Название:  Theoretical Concepts of X-Ray Nanoscale Analysis
ISBN: 9783642381768
Издательство: Springer
Классификация:

ISBN-10: 3642381766
Обложка/Формат: Hardcover
Страницы: 318
Вес: 0.66 кг.
Дата издания: 18.09.2013
Серия: Springer Series in Materials Science
Язык: English
Издание: 2014 ed.
Иллюстрации: 37 illustrations, color; 71 illustrations, black and white; xiii, 318 p. 108 illus., 37 illus. in color.
Размер: 234 x 160 x 23
Читательская аудитория: Professional & vocational
Основная тема: Measurement Science and Instrumentation
Подзаголовок: Theory and Applications
Ссылка на Издательство: Link
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Поставляется из: Германии
Описание: This book surveys concepts of X-ray materials analysis, including X-ray scattering and interaction between X-rays and matter, plus techniques including high-resolution X-ray diffraction, reflectivity, grazing-incidence small-angle X-ray scattering and more.


Theory of Quantum Transport at Nanoscale

Автор: Dmitry Ryndyk
Название: Theory of Quantum Transport at Nanoscale
ISBN: 3319240862 ISBN-13(EAN): 9783319240862
Издательство: Springer
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Цена: 16769.00 р.
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Описание:

This book is an introduction to a rapidly developing field of modern theoretical physics - the theory of quantum transport at nanoscale. The theoretical methods considered in the book are in the basis of our understanding of charge, spin and heat transport in nanostructures and nanostructured materials and are widely used in nanoelectronics, molecular electronics, spin-dependent electronics (spintronics) and bio-electronics. The book is based on lectures for graduate and post-graduate students at the University of Regensburg and the Technische Universitat Dresden (TU Dresden).

The first part is devoted to the basic concepts of quantum transport: Landauer-Buttiker method and matrix Green function formalism for coherent transport, Tunneling (Transfer) Hamiltonian and master equation methods for tunneling, Coulomb blockade, vibrons and polarons.

The results in this part are obtained as possible without sophisticated techniques, such as nonequilibrium Green functions, which are considered in detail in the second part.

A general introduction into the nonequilibrium Green function theory is given.

The approach based on the equation-of-motion technique, as well as more sophisticated one based on the Dyson-Keldysh diagrammatic technique are presented. The main attention is paid to the theoretical methods able to describe the nonequilibrium (at finite voltage) electron transport through interacting nanosystems, specifically the correlation effects due to electron-electron and electron-vibron interactions.
Nanoscale AFM and TEM Observations of Elementary Dislocation Mechanisms

Автор: Jozef Vesel?
Название: Nanoscale AFM and TEM Observations of Elementary Dislocation Mechanisms
ISBN: 3319483013 ISBN-13(EAN): 9783319483016
Издательство: Springer
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Цена: 15372.00 р.
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Описание: This thesis addresses elementary dislocation processes occurring in single-crystalline alloys based on Fe-Al, and investigates correspondences between dislocation distribution inside crystals characterized by transmission electron microscopy (TEM) and surface patterns observed using atomic force microscopy (AFM). Fe-Al alloys with different degrees of ordering were prepared and deformed in compression at ambient temperature in-situ inside the AFM device. The evolution of slip line structures was captured in the sequences of AFM images and wavy slip bands, while cross slip at the tip of the slip band and homogeneous fine slip lines were also identified. Further, the thesis develops a technique for constructing 3D representations of dislocations observed by TEM without the prohibitive difficulties of tomography, and creates 3D models of dislocation structures. Generally speaking, the thesis finds good agreement between AFM and TEM observations, confirming the value of AFM as a relevant tool for studying dislocations.

Nanoscale Imaging and Characterisation of Amyloid-?

Автор: Tinker-Mill
Название: Nanoscale Imaging and Characterisation of Amyloid-?
ISBN: 3319395335 ISBN-13(EAN): 9783319395333
Издательство: Springer
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Цена: 15372.00 р.
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Описание:

This thesis presents a method for reliably and robustly producing samples of amyloid-? (A?) by capturing them at various stages of aggregation, as well as the results of subsequent imaging with various atomic force microscopy (AFM) methods, all of which add value to the data gathered by collecting information on the peptide’s nanomechanical, elastic, thermal or spectroscopical properties.
Amyloid-? (A?) undergoes a hierarchy of aggregation following a structural transition, making it an ideal subject of study using scanning probe microscopy (SPM), dynamic light scattering (DLS) and other physical techniques. By imaging samples of A? with Ultrasonic Force Microscopy, a detailed substructure to the morphology is revealed, which correlates well with the most advanced cryo-EM work. Early stage work in the area of thermal and spectroscopical AFM is also presented, and indicates the promise these techniques may hold for imaging sensitive and complex biological materials. This thesis demonstrates that physical techniques can be highly complementary when studying the aggregation of amyloid peptides, and allow the detection of subtle differences in their aggregation processes.
Cellular Nanoscale Sensory Wave Computing

Автор: Chagaan Baatar; Wolfgang Porod; Tamas Roska
Название: Cellular Nanoscale Sensory Wave Computing
ISBN: 1441910107 ISBN-13(EAN): 9781441910103
Издательство: Springer
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Цена: 22203.00 р.
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Описание: This fresh perspective of sensory computing successfully bridges the gap between nanoscale devices and CMOS integrated circuits. Practical and complex algorithms are also discussed, in addition to new developments like the nanoscale antenna.

Probing Crystal Plasticity at the Nanoscales

Автор: Arief Suriadi Budiman
Название: Probing Crystal Plasticity at the Nanoscales
ISBN: 9812873341 ISBN-13(EAN): 9789812873347
Издательство: Springer
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Цена: 7836.00 р.
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Описание: Introduction.- Synchrotron White-beam X-ray Microdiffraction at the Advanced Light Source, Berkeley Lab.- Electromigration-induced Plasticity in Cu Interconnects: The Length Scale Dependence.- Electromigration-induced Plasticity in Cu Interconnects: The Texture Dependence.- Industrial Implications of Electromigration-induced Plasticity in Cu Interconnects: Plasticity-amplified Diffusivity.- . Indentation Size Effects in Single Crystal Cu as Revealed by Synchrotron X-ray Microdiffraction.- Smaller is Stronger: Size Effects in Uniaxially Compressed Au Submicron Single Crystal Pillars.- Conclusions and Future Directions.


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