Probing the Response of Two-Dimensional Crystals by Optical Spectroscopy, Yilei Li

Автор: Manuel Endres
Название: Probing Correlated Quantum Many-Body Systems at the Single-Particle Level
ISBN: 3319057529 ISBN-13(EAN): 9783319057521
Издательство: Springer
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Описание: Introduction.- Part I Single-Site- and Single-Atom-Resolved Detection of Atomic Limit Mott Insulators.- Superfluid-Mott-Insulator Transition.- Overview of the Experimental Procedure.- Single-Site-Resolved Imaging and Thermometry of Atomic Limit Mott Insulators.- Part II Single-Site- and Single-Atom-Resolved Detection of Correlation Functions.- Detection of Particle-Hole Pairs Using Two-Site Correlation Functions.- Non-Local Correlations in One Dimension.- Non-Local Correlations in Two Dimensions, Duality and Distribution Functions.- Part III 'Higgs' Amplitude Mode.- Introduction to Amplitude and Phase Modes.- Detection of the Higgs Amplitude Mode at the 2d SF-Mott-Insulator Transition.- Outlook.- Part IV Appendix.- Appendix A Experimental Details.- Appendix B Numerical Methods for Correlation Functions.- Appendix C Calculation for Non-Local Correlations in One Dimension.- Appendix D Calculation for Non-Local Correlations in Two Dimensions.

Автор: Seongil Im, Youn-Gyoung Chang, Jae Hoon Kim
Название: Photo-Excited Charge Collection Spectroscopy: Probing the traps in field-effect transistors (SpringerBriefs in Physics)
ISBN: 9400763913 ISBN-13(EAN): 9789400763913
Издательство: Springer
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Описание: Solid state field-effect devices such as organic and inorganic-channel thin-film transistors (TFTs) have been expected to promote advances in display and sensor electronics.

Автор: Robert D. Hunsucker
Название: Radio Techniques for Probing the Terrestrial Ionosphere
ISBN: 364276259X ISBN-13(EAN): 9783642762598
Издательство: Springer
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Описание: The purposes of this book are to exam- ine the basic physical interaction process of radio waves with the ionosphere, scrutinize each of the radio techniques currently in use, and describe the elements of each technique, as well as assess their capabilities and limitations.

Автор: Arief Suriadi Budiman
Название: Probing Crystal Plasticity at the Nanoscales
ISBN: 9812873341 ISBN-13(EAN): 9789812873347
Издательство: Springer
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Описание: Introduction.- Synchrotron White-beam X-ray Microdiffraction at the Advanced Light Source, Berkeley Lab.- Electromigration-induced Plasticity in Cu Interconnects: The Length Scale Dependence.- Electromigration-induced Plasticity in Cu Interconnects: The Texture Dependence.- Industrial Implications of Electromigration-induced Plasticity in Cu Interconnects: Plasticity-amplified Diffusivity.- . Indentation Size Effects in Single Crystal Cu as Revealed by Synchrotron X-ray Microdiffraction.- Smaller is Stronger: Size Effects in Uniaxially Compressed Au Submicron Single Crystal Pillars.- Conclusions and Future Directions.