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The Border Effect in High-Precision Measurement, Wei Zhou; Zhiqi Li; Lina Bai


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Цена: 19564.00р.
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Автор: Wei Zhou; Zhiqi Li; Lina Bai
Название:  The Border Effect in High-Precision Measurement
ISBN: 9789811035920
Издательство: Springer
Классификация:


ISBN-10: 981103592X
Обложка/Формат: Hardcover
Вес: 0.83 кг.
Дата издания: 28.12.2017
Язык: English
Издание: 1st ed. 2020
Иллюстрации: 150 illustrations, color; approx. 220 p. 150 illus. in color.
Размер: 235 x 155
Читательская аудитория: Tertiary education (us: college)
Основная тема: Engineering
Ссылка на Издательство: Link
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Поставляется из: Германии
Описание: This book introduces various kinds of high-precision measurements, including the measurements of time and space, digital activity, border sensors and other physical quantities. Further, it demonstrates how to eliminate the quantitative errors believed to be the main problem in measurements using the border effect. In metrology technology, detection resolution is crucial to improving measurement precision in devices and instruments, and since the resolution is limited, a fuzzy area is usually found during detection. As such the book presents numerous experimental findings showing that the measurement precision can be improved by two or three orders of magnitude compared to traditional methods by achieving stability of resolution and more accurately detecting the border of the fuzzy area.
Дополнительное описание: Introduction.- Basic knowledge for precision measurement and influence of measurement methods on precision.- Measurement resolution, stability of resolution, border of measuring fuzzy area and border effect.- Conventional phase, frequency measurements and



High Precision Optical Spectroscopy and Quantum State Selected Photodissociation of Ultracold 88Sr2 Molecules in an Optical Lattice

Автор: Mickey Patrick McDonald
Название: High Precision Optical Spectroscopy and Quantum State Selected Photodissociation of Ultracold 88Sr2 Molecules in an Optical Lattice
ISBN: 3319687344 ISBN-13(EAN): 9783319687346
Издательство: Springer
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Цена: 16769.00 р.
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Описание: This thesis unites the fields of optical atomic clocks and ultracold molecular science, laying the foundation for optical molecular measurements of unprecedented precision. The former allows molecular spectroscopy approaching the level of atomic clocks, leading into molecular metrology and tests of fundamental physics.

Precision Landmark Location for Machine Vision and Photogrammetry / Finding and Achieving the Maximum Possible Accuracy

Автор: Gutierrez JosГ© A., Armstrong Brian S.R.
Название: Precision Landmark Location for Machine Vision and Photogrammetry / Finding and Achieving the Maximum Possible Accuracy
ISBN: 1846289122 ISBN-13(EAN): 9781846289125
Издательство: Springer
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Цена: 15372.00 р.
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Описание: The applications of image-based measurement are many and various: image-guided surgery, mobile-robot navigation, component alignment, part inspection and photogrammetry, among others. In all these applications, landmarks are detected and located in images, and measurements made from those locations.Precision Landmark Location for Machine Vision and Photogrammetry addresses the ubiquitous problem of measurement error associated with determining the location of landmarks in images. With a detailed model of the image formation process and landmark location estimation, the CramГ©r–Rao Lower Bound (CRLB) theory of statistics is applied to determine the least possible measurement uncertainty in a given situation.This monograph provides the reader with:• the most complete treatment to date of precision landmark location and the engineering aspects of image capture and processing;• detailed theoretical treatment of the CRLB;• a software tool for analyzing the potential performance-specific camera/lens/algorithm configurations;• two novel algorithms which achieve precision very close to the CRLB;• an experimental method for determining the accuracy of landmark location;• downloadable MATLABВ® package to assist the reader with applying theoretically-derived results to practical engineering configurations.All of this adds up to a treatment that is at once theoretically sound and eminently practical.Precision Landmark Location for Machine Vision and Photogrammetry will be of great interest to computer scientists and engineers working with and/or studying image processing and measurement. It includes cutting-edge theoretical developments and practical tools so it will appeal to research investigators and system designers.

Precision Interferometry in a New Shape

Автор: Paul Fulda
Название: Precision Interferometry in a New Shape
ISBN: 3319013742 ISBN-13(EAN): 9783319013749
Издательство: Springer
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Цена: 18167.00 р.
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Описание: Paul has developed and demonstrated simple and effective methods to create this mode with diffractive optics and successfully demonstrated its compatibility with the essential building blocks of gravitational wave detectors, namely, optical cavities, Michelson interferometers and opto-electronic sensing and control systems.

Precision Interferometry in a New Shape

Автор: Paul Fulda
Название: Precision Interferometry in a New Shape
ISBN: 331934756X ISBN-13(EAN): 9783319347561
Издательство: Springer
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Цена: 13059.00 р.
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Описание: Paul has developed and demonstrated simple and effective methods to create this mode with diffractive optics and successfully demonstrated its compatibility with the essential building blocks of gravitational wave detectors, namely, optical cavities, Michelson interferometers and opto-electronic sensing and control systems.

Precision Nanometrology

Автор: Wei Gao
Название: Precision Nanometrology
ISBN: 1849962537 ISBN-13(EAN): 9781849962537
Издательство: Springer
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Цена: 26122.00 р.
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Описание: This book describes the latest optical sensors used to measure angle and displacement in precision nanometrology, and presents scanning-type measuring systems for use in surface forms and stage motions. Coverage includes algorithms and experimental data.

Precision Nanometrology

Автор: Wei Gao
Название: Precision Nanometrology
ISBN: 1447157435 ISBN-13(EAN): 9781447157434
Издательство: Springer
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Цена: 26120.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: This book describes the latest optical sensors used to measure angle and displacement in precision nanometrology, and presents scanning-type measuring systems for use in surface forms and stage motions. Coverage includes algorithms and experimental data.

Precision Assembly Technologies and Systems

Автор: Svetan Ratchev
Название: Precision Assembly Technologies and Systems
ISBN: 3642115977 ISBN-13(EAN): 9783642115974
Издательство: Springer
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Цена: 17043.00 р.
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Описание: Proceedings of the 5th International Precision Assembly Seminar, IPAS 2010, February 2010. 39 papers are grouped by topic: micro product design; micro-assembly processes; positioning and manipulation for micro-assembly; micro-assembly production development.

Precision Sensors, Actuators and Systems

Автор: H.S. Tzou; Toshio Fukuda
Название: Precision Sensors, Actuators and Systems
ISBN: 0792320158 ISBN-13(EAN): 9780792320159
Издательство: Springer
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Цена: 44722.00 р.
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Описание: Presents an overview of the technologies such as silicon based sensors/actuators and control piezoelectric micro sensors/actuators, micro actuation and control, micro sensor applications in robot control, optical fiber sensors/systems and more.

Precision Motion Control

Автор: Kok Kiong Tan; Tong Heng Lee; Sunan Huang
Название: Precision Motion Control
ISBN: 1849967040 ISBN-13(EAN): 9781849967044
Издательство: Springer
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Цена: 19589.00 р.
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Описание: It has been extensively edited and rewritten throughout with the following particular areas being expanded or added:* piezoelectric actuators* fine movement control* gantry-stage control* interpolation of quadrature encoder signals* geometrical error modeling for single-, dual- and general-XY-axis stages.

Precision in Crop Farming

Автор: Hermann J. Heege
Название: Precision in Crop Farming
ISBN: 9400794452 ISBN-13(EAN): 9789400794450
Издательство: Springer
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Цена: 21661.00 р.
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Описание: High yields and environmental control in crop farming call for precise adaptations to local growing conditions. Treating large fields in a uniform way by high capacity machinery cannot be regarded as a sustainable method for many situations. Because differences existing within single fields must be considered. The transition from former field work carried out manually or by small implements to present-day high-capacity machinery caused that the farmers lost the immediate and close contact with soils and crops. However, modern sensing and controlling technology can make up for this deficit. High tech methods that include proximal sensing and signals from satellites can provide for controls that allow adjusting farming operations to small fractions of one ha and sometimes even down to some m2, hence in a site-specific mode. This applies to operations for soil cultivation, sowing, fertilizing and plant protection. This book deals with site-specific concepts, applications and results.


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