Transmission Electron Microscopy Characterization of Nanomaterials, Challa S.S.R. Kumar
Автор: Thomas, Sabu Название: Microscopy Methods in Nanomaterials Characterization ISBN: 0323461417 ISBN-13(EAN): 9780323461412 Издательство: Elsevier Science Рейтинг: Цена: 26949.00 р. Наличие на складе: Поставка под заказ.
Описание:
Microscopy Methods in Nanomaterials Characterization fills an important gap in the literature with a detailed look at microscopic and X-ray based characterization of nanomaterials. These microscopic techniques are used for the determination of surface morphology and the dispersion characteristics of nanomaterials.
This book deals with the detailed discussion of these aspects, and will provide the reader with a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc. In addition, it covers the latest developments and trends morphological characterization using a variety of microscopes.
Materials scientists, materials engineers and scientists in related disciplines, including chemistry and physics, will find this to be a detailed, method-orientated guide to microscopy methods of nanocharacterization.
Описание: This book describes real-time observation and atomic level monitoring and machining using an in situ transmission electron microscopy (TEM) approach to investigate growth of carbon nanotubes and fabrication and properties of CNT-clamped metal atomic chains.
Описание: This book provides tools well suited for thequantitative investigation of semiconductor electron microscopy. The bookfocuses on new methods including strain stateanalysis as well as evaluation of the compositionvia the lattice fringe analysis (CELFA) technique.
Автор: Brent Fultz; James Howe Название: Transmission Electron Microscopy and Diffractometry of Materials ISBN: 3642433154 ISBN-13(EAN): 9783642433153 Издательство: Springer Рейтинг: Цена: 13059.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book explains aspects of transmission electron microscopy and x-ray diffractometry that are important for characterization of materials. The 4th edition adds new techniques such as electron tomography, nanobeam diffraction and geometric phase analysis.
Автор: Jeanne Ayache; Luc Beaunier; Jacqueline Boumendil; Название: Sample Preparation Handbook for Transmission Electron Microscopy ISBN: 1489998853 ISBN-13(EAN): 9781489998859 Издательство: Springer Рейтинг: Цена: 18284.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This is the second in a two-volume handbook on sample preparation for the transmission electron microscope. It describes 14 different preparation techniques, including 22 detailed protocols for preparing thin slices for TEM analysis.
Автор: J?rgen Thomas; Thomas Gemming Название: Analytical Transmission Electron Microscopy ISBN: 9401779880 ISBN-13(EAN): 9789401779883 Издательство: Springer Рейтинг: Цена: 10447.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Based on the authors` years of experience as instructors, this book is an introduction for all persons who want to use a transmission electron microscope. Offers illustrative examples, simple models and practical hints on analytical transmission microscopy.
Описание: This book describes real-time observation and atomic level monitoring and machining using an in situ transmission electron microscopy (TEM) approach to investigate growth of carbon nanotubes and fabrication and properties of CNT-clamped metal atomic chains.
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