Digital System Test and Testable Design, Zainalabedin Navabi

Автор: Wayne M. Needham
Название: Designer`s Guide to Testable Asic Devices
ISBN: 0442002211 ISBN-13(EAN): 9780442002213
Издательство: Springer
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Цена: 23757.00 р.
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Описание: While making up a larger percentage of the total number of designs produced each year, ASICs present special problems for system designers in the area of testing because each design is complex and unique. This book shows readers how to apply basic test techniques to ASIC design, details the impact o

Автор: Stephen H. Hall
Название: High-Speed Digital System Design: A Handbook of Interconnect Theory and Design Practices
ISBN: 0471360902 ISBN-13(EAN): 9780471360902
Издательство: Wiley
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Цена: 22010.00 р.
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Описание: An understanding of high speed interconnect phenomena is necessary for modern designs such as routing and layout of computer motherboards. Computers have reached speeds where digital design must provide for these effects. The problem is that most engineers active today have not been trained in this subject.

Автор: Erik Larsson
Название: Introduction to Advanced System-on-Chip Test Design and Optimization
ISBN: 1441952691 ISBN-13(EAN): 9781441952691
Издательство: Springer
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Цена: 26120.00 р.
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Описание: SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling.