Описание: This book presents a framework for the reuse-based design of AMS circuits. The framework is founded on three key elements: (1) a CAD-supported hierarchical design flow; The book features a detailed tutorial and in-depth coverage of all issues and must-have properties of reusable AMS blocks.
Описание: Takes a look at coupling through the common silicon substrate, and noise at the power supply lines. This book explains the elementary knowledge needed to understand these phenomena and presents a review of works and research results. It is suitable as an introductory material to noise-coupling problems in mixed-signal ICs.
Автор: St?phane Donnay; Georges Gielen Название: Substrate Noise Coupling in Mixed-Signal ASICs ISBN: 1441953418 ISBN-13(EAN): 9781441953414 Издательство: Springer Рейтинг: Цена: 26120.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book is the first in a series of three dedicated to advanced topics in Mixed-Signal IC design methodologies.
Автор: Thomas Scaffidi Название: Weak-Coupling Theory of Topological Superconductivity ISBN: 3319628666 ISBN-13(EAN): 9783319628660 Издательство: Springer Рейтинг: Цена: 15372.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Lastly, the thesis makes predictions for the properties of the material under uniaxial strain, which are in good agreement with recent experiments -resolving the mystery of the so-called 3K phase, and suggesting the intriguing possibility that under strain the superconductor may become conventional.
Описание: Offers an introduction to the testing problem and a review of conventional signal generation techniques. This book describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion.
Описание: Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods.
Автор: K. Antreich; R. Bulirsch; A. Gilg; P. Rentrop Название: Modeling, Simulation, and Optimization of Integrated Circuits ISBN: 3034894260 ISBN-13(EAN): 9783034894265 Издательство: Springer Рейтинг: Цена: 13974.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
In November 2001 the Mathematical Research Center at Oberwolfach, Germany, hosted the third Conference on Mathematical Models and Numerical Simulation in Electronic Industry. It brought together researchers in mathematics, electrical engineering and scientists working in industry.
The contributions to this volume try to bridge the gap between basic and applied mathematics, research in electrical engineering and the needs of industry.
Описание: This unique book provides an overview of the current state of the art and very recent research results that have been achieved as part of the Low-Power Initiative of the European Union, in the field of analogue, RF and mixed-signal design methodologies and CAD tools.
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