Metric Driven Design Verification, Hamilton B. Carter; Shankar G. Hemmady
Автор: Evren Samur Название: Performance Metrics for Haptic Interfaces ISBN: 1447158032 ISBN-13(EAN): 9781447158035 Издательство: Springer Рейтинг: Цена: 16769.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book meets the need to understand performance metrics for haptic interfaces and their implications on device design, use and application. The authors propose evaluation practices including a combined physical and psychophysical experimental methodology.
Описание: This text examines several leading-edge design and verification technologies that have been successfully applied to microprocessor systems for high-assurance applications at various levels. It includes many practical case studies.
Автор: Progyna Khondkar Название: Low-Power Design and Power-Aware Verification ISBN: 3319666185 ISBN-13(EAN): 9783319666181 Издательство: Springer Рейтинг: Цена: 18167.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Until now, there has been a lack of a complete knowledge base to fully comprehend Low power (LP) design and power aware (PA) verification techniques and methodologies and deploy them all together in a real design verification and implementation project. This book is a first approach to establishing a comprehensive PA knowledge base.LP design, PA verification, and Unified Power Format (UPF) or IEEE-1801 power format standards are no longer special features. These technologies and methodologies are now part of industry-standard design, verification, and implementation flows (DVIF). Almost every chip design today incorporates some kind of low power technique either through power management on chip, by dividing the design into different voltage areas and controlling the voltages, through PA dynamic and PA static verification, or their combination.The entire LP design and PA verification process involves thousands of techniques, tools, and methodologies, employed from the register transfer level (RTL) of design abstraction down to the synthesis or place-and-route levels of physical design. These techniques, tools, and methodologies are evolving everyday through the progression of design-verification complexity and more intelligent ways of handling that complexity by engineers, researchers, and corporate engineering policy makers.
Автор: Manoj Sachdev; Jose Pineda de Gyvez Название: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits ISBN: 1441942858 ISBN-13(EAN): 9781441942852 Издательство: Springer Рейтинг: Цена: 26120.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield.
Автор: Yossi Rubner; Carlo Tomasi Название: Perceptual Metrics for Image Database Navigation ISBN: 0792372190 ISBN-13(EAN): 9780792372196 Издательство: Springer Рейтинг: Цена: 29209.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Introduces the metric, called the Earth Mover's Distance (EMD), for comparing images in terms of their appearance. This title includes a CD-ROM with full color images and is useful to researchers, industrial professionals, and students in the fields of Computer Vision; Image Processing; Data Mining; and Digital Libraries.
Автор: Yossi Rubner; Carlo Tomasi Название: Perceptual Metrics for Image Database Navigation ISBN: 1441948635 ISBN-13(EAN): 9781441948632 Издательство: Springer Рейтинг: Цена: 29209.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: Masahiro Fujita Название: Verification Techniques for System-Level Design, ISBN: 0123706165 ISBN-13(EAN): 9780123706164 Издательство: Elsevier Science Рейтинг: Цена: 10441.00 р. Наличие на складе: Поставка под заказ.
Описание: Explains how to verify SoC logic designs using `formal` and `semi-formal` verification techniques. This book covers various aspects of high-level formal and semi-formal verification techniques for system level designs.
Описание: This text examines several leading-edge design and verification technologies that have been successfully applied to microprocessor systems for high-assurance applications at various levels. It includes many practical case studies.
Автор: Ashok B. Mehta Название: ASIC/SoC Functional Design Verification ISBN: 3319594176 ISBN-13(EAN): 9783319594170 Издательство: Springer Рейтинг: Цена: 18167.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book describes in detail all required technologies and methodologies needed to create a comprehensive, functional design verification strategy and environment to tackle the toughest job of guaranteeing first-pass working silicon. The author first outlines all of the verification sub-fields at a high level, with just enough depth to allow an engineer to grasp the field before delving into its detail. He then describes in detail industry standard technologies such as UVM (Universal Verification Methodology), SVA (SystemVerilog Assertions), SFC (SystemVerilog Functional Coverage), CDV (Coverage Driven Verification), Low Power Verification (Unified Power Format UPF), AMS (Analog Mixed Signal) verification, Virtual Platform TLM2.0/ESL (Electronic System Level) methodology, Static Formal Verification, Logic Equivalency Check (LEC), Hardware Acceleration, Hardware Emulation, Hardware/Software Co-verification, Power Performance Area (PPA) analysis on a virtual platform, Reuse Methodology from Algorithm/ESL to RTL, and other overall methodologies.
Описание: It was the first of its kind to be run by an automotive major to bring together the leaders in the field of embedded systems development to present state-of-the-art work, and to discuss future strategies for addressing the increasing complexity of embedded control systems.
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