Bharat Bhushan; Harald Fuchs Applied Scanning Probe Methods VII 9783642072130

Варианты приобретения

Цена: 27950.00р.
Кол-во:
Наличие: Поставка под заказ. Есть в наличии на складе поставщика.
Склад Америка: Есть
При оформлении заказа до: 2025-07-28
Ориентировочная дата поставки: Август-начало Сентября
При условии наличия книги у поставщика.

Добавить в корзину

в Мои желания

Автор: Bharat Bhushan; Harald Fuchs
Название: Applied Scanning Probe Methods VII
ISBN: 9783642072130
Издательство: Springer
Классификация: ISBN-10: 3642072135
Обложка/Формат: Paperback
Страницы: 380
Вес: 0.59 кг.
Дата издания: 23.11.2010
Серия: NanoScience and Technology
Язык: English
Размер: 234 x 156 x 22
Основная тема: Engineering
Подзаголовок: Biomimetics and Industrial Applications
Ссылка на Издательство: Link
Рейтинг:
Поставляется из: Германии
Описание: The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I-IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I-IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series. In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near?eld Raman spectroscopy and imaging.

Applied Scanning Probe Methods VII, Bharat Bhushan; Harald Fuchs