Physical and Technical Problems of SOI Structures and Devices, J.-P. Colinge; Vladimir S. Lysenko; Alexei N. Naza

Автор: Francis Balestra; Alexei N. Nazarov; Vladimir S. L
Название: Progress in SOI Structures and Devices Operating at Extreme Conditions
ISBN: 140200575X ISBN-13(EAN): 9781402005756
Издательство: Springer
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Цена: 30606.00 р.
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Описание: Offers a review of the electrical properties, performance and physical mechanisms of the main silicon-on-insulator (SOI) materials and devices. This book focuses on the reliability of SOI structures operating in harsh conditions. It deals with material technology and describes the SIMOX and ELTRAN technologies.

Автор: Francis Balestra; Alexei N. Nazarov; Vladimir S. L
Название: Progress in SOI Structures and Devices Operating at Extreme Conditions
ISBN: 1402005768 ISBN-13(EAN): 9781402005763
Издательство: Springer
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Цена: 13275.00 р.
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Описание: A review of the electrical properties, performance and physical mechanisms of the main silicon-on-insulator (SOI) materials and devices. This book deals with material technology and describes the SIMOX and ELTRAN technologies, SiCOI structures and MBE growth. It deals with the characterization of advanced SOI materials and devices.

Автор: Andrew Marshall; Sreedhar Natarajan
Название: SOI Design
ISBN: 1475775628 ISBN-13(EAN): 9781475775624
Издательство: Springer
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Цена: 18167.00 р.
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Описание: This title introduces state-of-the-art design principles for SOI circuit design, and is primarily concerned with circuit-related issues. It considers SOI material in terms of implementation that is promising or has been used elsewhere in circuit development, with historical perspective where appropriate.

Автор: Jean Laconte; Denis Flandre; Jean-Pierre Raskin
Название: Micromachined Thin-Film Sensors for SOI-CMOS Co-Integration
ISBN: 1441939571 ISBN-13(EAN): 9781441939579
Издательство: Springer
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Цена: 20896.00 р.
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Описание: Demonstrates the successful co-integration of gas-flow sensors on dielectric membrane, with their associated electronics, in CMOS-SOI technology. This title also focuses on sensors design and characteristics, in which a novel loop-shape polysilicon microheater is designed and built in a CMOS-SOI standard process.

Автор: Hugo Bachmann; Walter J. Ammann; Florian Deischl;
Название: Vibration Problems in Structures
ISBN: 3034899556 ISBN-13(EAN): 9783034899550
Издательство: Springer
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Цена: 8489.00 р.
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Автор: F. Casciati; J.B. Roberts
Название: Reliability Problems: General Principles and Applications in Mechanics of Solids and Structures
ISBN: 3211823190 ISBN-13(EAN): 9783211823194
Издательство: Springer
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Цена: 12157.00 р.
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Описание: The aim of this volume is to present to researchers and engineers working on problems concerned with the mechanics of solids and structures, the current state of the development and application to procedures for assessing the reliability of a system.

Автор: M. Ivanyi; M. Skaloud
Название: Stability Problems of Steel Structures
ISBN: 3211823980 ISBN-13(EAN): 9783211823989
Издательство: Springer
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Цена: 12157.00 р.
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Описание: Strives to give complete information about the main aspect of the stability behaviour of steel structures and their members. The volume presents a complete scientific background and establishes recommendations, procedures and formulae for practical design.

Автор: Denis Flandre; Alexei Nazarov; Peter L.F. Hemment
Название: Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment
ISBN: 1402030126 ISBN-13(EAN): 9781402030123
Издательство: Springer
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Цена: 20263.00 р.
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Описание: Collects the papers presented during NATO Advanced Research Workshop "Science and technology of Semiconductor on Insulator (SOI) structures and devices operating in a harsh environment". Presenting various innovations in SOI materials and devices, the papers focus on the reliability of SOI structures operating under harsh conditions.