Protocol Test Systems, Tadanori Mizuno; Teruo Higashino; Norio Shiratori
Автор: Guzzella Lino Название: Vehicle Propulsion Systems ISBN: 3642359124 ISBN-13(EAN): 9783642359125 Издательство: Springer Рейтинг: Цена: 11101.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This text provides an introduction to the mathematical modeling and subsequent optimization of vehicle propulsion systems and their supervisory control algorithms. It focuses on the minimization of fuel and energy consumption.
Описание: From the reviews: "This book is concerned with the application of methods from dynamical systems and bifurcation theories to the study of nonlinear oscillations. Chapter 1 provides a review of basic results in the theory of dynamical systems, covering both ordinary differential equations and discrete mappings. Chapter 2 presents 4 examples from nonlinear oscillations. Chapter 3 contains a discussion of the methods of local bifurcation theory for flows and maps, including center manifolds and normal forms. Chapter 4 develops analytical methods of averaging and perturbation theory. Close analysis of geometrically defined two-dimensional maps with complicated invariant sets is discussed in chapter 5. Chapter 6 covers global homoclinic and heteroclinic bifurcations. The final chapter shows how the global bifurcations reappear in degenerate local bifurcations and ends with several more models of physical problems which display these behaviors." #Book Review - Engineering Societies Library, New York#1 "An attempt to make research tools concerning `strange attractors' developed in the last 20 years available to applied scientists and to make clear to research mathematicians the needs in applied works. Emphasis on geometric and topological solutions of differential equations. Applications mainly drawn from nonlinear oscillations." #American Mathematical Monthly#2
Автор: Malik, N. H. Название: Electrical insulation in power systems ISBN: 0824701062 ISBN-13(EAN): 9780824701062 Издательство: Taylor&Francis Рейтинг: Цена: 39811.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Covers the design, operations, diagnostics and testing of electrical insulation in high-voltage power networks. The book presents the fundamental properties of dielectrics essential for the optimum design of power systems. It provides a survey of advanced digital and electro-optic techniques used in both the field and research.
Автор: Greenwood, Allan, Название: Electrical transients in power systems ISBN: 0471620580 ISBN-13(EAN): 9780471620587 Издательство: Wiley Рейтинг: Цена: 37216.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The principles of the First Edition--to teach students and engineers the fundamentals of electrical transients and equip them with the skills to recognize and solve transient problems in power networks and components--also guide this Second Edition.
Автор: Muddassar Farooq Название: Bee-Inspired Protocol Engineering ISBN: 3642099467 ISBN-13(EAN): 9783642099465 Издательство: Springer Рейтинг: Цена: 18167.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book introduces a multipath routing algorithm for packet-switched telecommunication networks based on techniques observed in bee colonies. The algorithm, BeeHive, represents an important step towards intelligent networks that optimally manage resources.
Автор: Katalin Tarnay Название: Protocol Specification and Testing ISBN: 1468457802 ISBN-13(EAN): 9781468457803 Издательство: Springer Рейтинг: Цена: 15672.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: It is considered that the readership will primarily consist of protocol developers, protocol users, and all who utilize protocol testers.
Автор: Tadanori Mizuno; Teruo Higashino; Norio Shiratori Название: Protocol Test Systems ISBN: 0412711605 ISBN-13(EAN): 9780412711602 Издательство: Springer Рейтинг: Цена: 27245.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Presents the research results in protocol testing. This book contains the proceedings of the seventh IFIP WG6.1 International Workshop on Protocol Test Systems (IWPTS `94), organized by the International Federation for Information Processing and held in Tokyo, Japan in November 1994.
Автор: Ana Cavalli; Stan Budkowski Название: Protocol Test Systems VIII ISBN: 0412781107 ISBN-13(EAN): 9780412781100 Издательство: Springer Рейтинг: Цена: 35777.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: These papers from the 1995 International Workshop on Protocol Test Systems present research in the area of architecture and protocols for computer networks. Themes covered include testing methods, test environments, test generation, and algorithms and languages.
Автор: Ana Cavalli; Stan Budkowski Название: Protocol Test Systems VIII ISBN: 1475763123 ISBN-13(EAN): 9781475763126 Издательство: Springer Рейтинг: Цена: 27950.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: IWPTS'95 (International Workshop on Protocol Test Systems) is being held this year at NT (Institut National des Telecommunications), Evry, France, from 4 to 6 September, 1995. IWPTS'95 is the eighth of a series of annual meetings sponsored by the IFIP Working Group WG6.1 dedicated to "Architecture and Protocols for Computer Networks". The seven previous workshops were held in Vancouver (Canada, 1988), Berlin (Germany, 1989), Mclean (USA, 1990), Leidschendam (The Netherlands, 1991), Montreal (Canada, 1992), Pau (France, 1993) and Tokyo (Japan, 1994). The workshop is a meeting place where both research and industry, theory and practice come together. By bringing both researchers and practitioners together, IWPTS opens up the communication between these groups. This helps keep the research vital and improves the state of the practitioner's art. Forty-eight papers have been submitted to IWPTS'95 and all of them have been reviewed by the members of the Program Committee and additional reviewers. The completed reviewers list is included in this Proceedings. Based on these reviews, the Program Committee selected 26 for oral presentation and 4 to be presented as posters. Two specially invited papers complete the Workshop Program, which is composed of ten sessions: Testing Methods (Session 1), Test Environments (Session 2), Theoretical Framework (Session 3), Algorithms and Languages (Session 4), Test Generation 1 (Session 5), Testability (Session 6), Test Generation 2 (Session 7), Industrial Applications (Session 8), Distributed Testing and performance (Session 9) and Test Management (Session 10).
Автор: Shoaib Khan Название: Industrial power systems ISBN: 0824724437 ISBN-13(EAN): 9780824724436 Издательство: Taylor&Francis Рейтинг: Цена: 31390.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Based on the author`s forty years of hands-on experience in various industries, this title provides the practicing engineer with practical information, from the planning and design of electrical supply to electrical installations for industrial power systems. It is suitable for those involved in power engineering.
Автор: Paulweber Название: Powertrain Instrumentation and Test Systems ISBN: 3319321331 ISBN-13(EAN): 9783319321332 Издательство: Springer Рейтинг: Цена: 22203.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The bookdeals with the increasingly complex test systems for powertrain components andsystems giving an overview of the diverse types of test beds for allcomponents of an advanced powertrain focusing on specific topics such asinstrumentation, control, simulation, hardware-in-the-loop, automation or testfacility management. This book is intended for powertrain (component)development engineers, test bed planners, test bed operators and beginners.
Автор: Ricardo Reis; Marcelo Soares Lubaszewski; Jochen A Название: Design of Systems on a Chip: Design and Test ISBN: 1441940898 ISBN-13(EAN): 9781441940896 Издательство: Springer Рейтинг: Цена: 19589.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book is the second of two volumes addressing the design challenges associated with new generations of semiconductor technology. Technology, productivity and quality are the main aspects under consideration to establish the major requirements for the design and test of upcoming systems on a chip.
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