Encyclopedia of Scanning Electron Microscopy, 

Автор: Ul-hamid, Anwar
Название: Beginners` guide to scanning electron microscopy
ISBN: 3319984810 ISBN-13(EAN): 9783319984810
Издательство: Неизвестно
Рейтинг:
Цена: 35173.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: This book was developed with the goal of providing an easily understood text for those users of the scanning electron microscope (SEM) who have little or no background in the area.

Автор: Page Lisa
Название: Scanning Electron Microscopy
ISBN: 163238406X ISBN-13(EAN): 9781632384065
Издательство: Неизвестно
Цена: 22990.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various science fields. SEMs are well instrumented and supplemented with advanced techniques and methods and thereby present endless possibilities in the areas of quantitative measurement of object topologies, surface imaging, performing elemental analysis and local electrophysical characteristics of semiconductor structures. Creation of micro and nanostructures involves extensive use of fine focused e-beam. This book focuses on various issues concerned with scanning electron microscopy, covering both theoretical and practical aspects. Numerous topics are organized under two sections, "Material Science" and "Nanostructured Materials for Electronic Industry". This book includes contributions by renowned researchers and experts in this field.